Hiroshi Kakibayashi

Person

Nagareyama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Micro-spectroscopic measuring device and micro-chemical system
- Patent number 7,145,146
- Issue date Dec 5, 2006
- Hitachi, Ltd.
- Taro Ogawa
- G01 - MEASURING TESTING
Information Patent Grant
Transmission electron microscope system and method of inspecting a...
- Patent number 7,034,299
- Issue date Apr 25, 2006
- Hitachi High-Technologies Corporation
- Ryo Nakagaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Bio electron microscope and observation method of specimen
- Patent number 6,875,984
- Issue date Apr 5, 2005
- Hitachi, Ltd.
- Hiroshi Kakibayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for scanning transmission electron microscopy
- Patent number 6,822,233
- Issue date Nov 23, 2004
- Hitachi, Ltd.
- Kuniyasu Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope apparatus with equipment for inspe...
- Patent number 6,548,811
- Issue date Apr 15, 2003
- Hitachi, Ltd.
- Kuniyasu Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for scanning transmission electron microscopy
- Patent number 6,531,697
- Issue date Mar 11, 2003
- Hitachi, Ltd.
- Kuniyasu Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 6,051,834
- Issue date Apr 18, 2000
- Hitachi, Ltd.
- Hiroshi Kakibayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scintillator device and image pickup apparatus using the same
- Patent number 5,932,880
- Issue date Aug 3, 1999
- Hitachi, Ltd.
- Masanari Koguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 5,866,905
- Issue date Feb 2, 1999
- Hitachi, Ltd.
- Hiroshi Kakibayashi
- G01 - MEASURING TESTING
Information Patent Grant
Defect observing electron microscope
- Patent number 5,744,800
- Issue date Apr 28, 1998
- Hitachi, Ltd.
- Hiroshi Kakibayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope with camera system
- Patent number 5,717,207
- Issue date Feb 10, 1998
- Hitachi, Ltd.
- Masanari Koguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 5,650,621
- Issue date Jul 22, 1997
- Hitachi, Ltd.
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 5,552,602
- Issue date Sep 3, 1996
- Hitachi, Ltd.
- Hiroshi Kakibayashi
- G01 - MEASURING TESTING
Information Patent Grant
Instrument and method for 3-dimensional atomic arrangement observation
- Patent number 5,475,218
- Issue date Dec 12, 1995
- Hitachi, Ltd.
- Hiroshi Kakibayashi
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope for specimen composition and strain analysis an...
- Patent number 5,453,617
- Issue date Sep 26, 1995
- Hitachi, Ltd.
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device using whiskers
- Patent number 5,362,972
- Issue date Nov 8, 1994
- Hitachi, Ltd.
- Masamitsu Yazawa
- C30 - CRYSTAL GROWTH
Information Patent Grant
Semiconductor optical device with nanowhiskers
- Patent number 5,332,910
- Issue date Jul 26, 1994
- Hitachi, Ltd.
- Keiichi Haraguchi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Instrument and method for 3-dimensional atomic arrangement observation
- Patent number 5,278,408
- Issue date Jan 11, 1994
- Hitachi, Ltd.
- Hiroshi Kakibayashi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Transmission electron microscope system and method of inspecting a...
- Publication number 20050051725
- Publication date Mar 10, 2005
- Ryo Nakagaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Micro-spectroscopic measuring device and micro-chemical system
- Publication number 20050017178
- Publication date Jan 27, 2005
- Taro Ogawa
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Microreactor, its production method, and sample screening device
- Publication number 20040228774
- Publication date Nov 18, 2004
- Hitachi, Ltd.
- Taro Ogawa
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Bio electron microscope and observation method of specimen
- Publication number 20040135083
- Publication date Jul 15, 2004
- Hiroshi Kakibayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for scanning transmission electron microscopy
- Publication number 20030127595
- Publication date Jul 10, 2003
- Hitachi, Ltd.
- Kuniyasu Nakamura
- H01 - BASIC ELECTRIC ELEMENTS

Hiroshi Kakibayashi

Person

Patents Grantslast 30 patents

Micro-spectroscopic measuring device and micro-chemical system

Transmission electron microscope system and method of inspecting a...

Bio electron microscope and observation method of specimen

Method and apparatus for scanning transmission electron microscopy

Transmission electron microscope apparatus with equipment for inspe...

Method and apparatus for scanning transmission electron microscopy

Electron microscope

Scintillator device and image pickup apparatus using the same

Electron microscope

Defect observing electron microscope

Transmission electron microscope with camera system

Electron microscope

Electron microscope

Instrument and method for 3-dimensional atomic arrangement observation

Electron microscope for specimen composition and strain analysis an...

Semiconductor device using whiskers

Semiconductor optical device with nanowhiskers

Instrument and method for 3-dimensional atomic arrangement observation

Patents Applicationslast 30 patents

Transmission electron microscope system and method of inspecting a...

Micro-spectroscopic measuring device and micro-chemical system

Microreactor, its production method, and sample screening device

Bio electron microscope and observation method of specimen

Method and apparatus for scanning transmission electron microscopy