Hiroshi Kawamoto

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Saitama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus detecting an IC defect by comparing electron emissions fr...
- Patent number 5,821,761
- Issue date Oct 13, 1998
- Advantest Corporation
- Soichi Shida
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting an IC defect using charged parti...
- Patent number 5,757,198
- Issue date May 26, 1998
- Advantest Corporation
- Soichi Shida
- G01 - MEASURING TESTING
Information Patent Grant
IC fault analysis system having charged particle beam tester
- Patent number 5,640,098
- Issue date Jun 17, 1997
- Advantest Corporation
- Hironobu Niijima
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting an IC defect using charged particle beam
- Patent number 5,592,100
- Issue date Jan 7, 1997
- Advantest Corporation
- Soichi Shida
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting an IC defect using a charged par...
- Patent number 5,521,517
- Issue date May 28, 1996
- Advantest Corporation
- Soichi Shida
- G01 - MEASURING TESTING