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Hiroshi KURODA

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  • Kanagawa, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    HOST VEHICLE BLIND SPOT MONITORING SYSTEM AND HOST VEHICLE BLIND SP...
    • Publication number 20240404410
    • Publication date Dec 5, 2024
    • Hitachi Astemo, Ltd.
    • Daisuke HIROSE
    • G08 - SIGNALLING
  • Information Patent Application

    RADAR DEVICE
    • Publication number 20240255612
    • Publication date Aug 1, 2024
    • Hitachi Astemo, Ltd.
    • Yukinori AKAMINE
    • G01 - MEASURING TESTING
  • Information Patent Application

    Antenna, Array Antenna, Radar Apparatus, and In-Vehicle System
    • Publication number 20210143533
    • Publication date May 13, 2021
    • Hideyuki NAGAISHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Radar Sensor
    • Publication number 20200358178
    • Publication date Nov 12, 2020
    • Hitachi Automotive Systems, Ltd.
    • Hideyuki NAGAISHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ANTENNA, SENSOR, AND IN-VEHICLE SYSTEM
    • Publication number 20200319293
    • Publication date Oct 8, 2020
    • Hitachi Automotive Systems, Ltd.
    • Akira KURIYAMA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Radar Device and Antenna Device
    • Publication number 20200200888
    • Publication date Jun 25, 2020
    • Hitachi Automotive Systems, Ltd.
    • Katsumi OUCHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    RADAR DEVICE
    • Publication number 20200057135
    • Publication date Feb 20, 2020
    • Hitachi Automotive Systems, Ltd.
    • Satoshi SASAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    RADAR DEVICE
    • Publication number 20190377077
    • Publication date Dec 12, 2019
    • Hitachi Automotive Systems, Ltd.
    • Akira KITAYAMA
    • G08 - SIGNALLING
  • Information Patent Application

    RADAR DEVICE
    • Publication number 20190369221
    • Publication date Dec 5, 2019
    • Hitachi Automotive Systems, Ltd.
    • Masahiro UMEHIRA
    • G01 - MEASURING TESTING
  • Information Patent Application

    ANTENNA, SENSOR, AND VEHICLE MOUNTED SYSTEM
    • Publication number 20190310345
    • Publication date Oct 10, 2019
    • Hitachi Automotive Systems, Ltd.
    • Hideyuki NAGAISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR WITH FLAT-BEAM GENERATION ANTENNA
    • Publication number 20180164430
    • Publication date Jun 14, 2018
    • Hitachi Automotive Systems, Ltd.
    • Akira KURIYAMA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
    • Publication number 20170330864
    • Publication date Nov 16, 2017
    • Renesas Electronics Corporation
    • Hiroshi KURODA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    IMAGING DEVICE
    • Publication number 20170221188
    • Publication date Aug 3, 2017
    • Hitachi Automotive Systems, Ltd.
    • Toshiyuki AOKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Object Recognition Apparatus and Vehicle Travel Controller Using Same
    • Publication number 20170053533
    • Publication date Feb 23, 2017
    • Hitachi Automotive Systems, Ltd.
    • Hiroshi KURODA
    • B62 - LAND VEHICLES FOR TRAVELLING OTHERWISE THAN ON RAILS
  • Information Patent Application

    VEHICLE POSITION ESTIMATION SYSTEM, DEVICE, METHOD, AND CAMERA DEVICE
    • Publication number 20160305794
    • Publication date Oct 20, 2016
    • Hitachi Automotive Systems, Ltd.
    • Yuki HORITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
    • Publication number 20140011453
    • Publication date Jan 9, 2014
    • Hiroshi Kuroda
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20120273970
    • Publication date Nov 1, 2012
    • RENESAS ELECTRONICS CORPORATION
    • Hiroshi KURODA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
    • Publication number 20120052628
    • Publication date Mar 1, 2012
    • RENESAS ELECTRONICS CORPORATION
    • Hiroshi KURODA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20100219537
    • Publication date Sep 2, 2010
    • Renesas Technology Corp.
    • Hiroshi Kuroda
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Radar Apparatus
    • Publication number 20090085796
    • Publication date Apr 2, 2009
    • Hitachi, Ltd
    • Hiroshi Kuroda
    • G01 - MEASURING TESTING
  • Information Patent Application

    MULTI-CHIP SEMICONDUCTOR DEVICE
    • Publication number 20090065929
    • Publication date Mar 12, 2009
    • Kazuhiko Hiranuma
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20080251936
    • Publication date Oct 16, 2008
    • Hiroshi KURODA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SCANNING PROBE MICROSCOPE AND MEASUREMENT METHOD OF SAME
    • Publication number 20080245139
    • Publication date Oct 9, 2008
    • Takafumi Morimoto
    • G01 - MEASURING TESTING
  • Information Patent Application

    Method of Control of Probe Scan and Apparatus for Controlling Probe...
    • Publication number 20080236259
    • Publication date Oct 2, 2008
    • Tooru Kurenuma
    • G01 - MEASURING TESTING
  • Information Patent Application

    SCANNING PROBE MICROSCOPE
    • Publication number 20080223122
    • Publication date Sep 18, 2008
    • Masahiro Watanabe
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20070278697
    • Publication date Dec 6, 2007
    • Hiroshi KURODA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Scanning Probe Microscope
    • Publication number 20070266780
    • Publication date Nov 22, 2007
    • SHUICHI BABA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20070262431
    • Publication date Nov 15, 2007
    • Hiroshi Kuroda
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Radar apparatus and radar system for a vehicle
    • Publication number 20070200747
    • Publication date Aug 30, 2007
    • HITACHI, LTD.
    • Fumihiko Okai
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe replacement method for scanning probe microscope
    • Publication number 20070180889
    • Publication date Aug 9, 2007
    • Ken Murayama
    • G01 - MEASURING TESTING