Hiroshi Muramatsu

Person

Chiba-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Piezoelectric unit, piezoelectric device, piezoelectric determinati...
- Patent number 9,645,117
- Issue date May 9, 2017
- Seiko Instruments Inc.
- Sachiko Tanabe
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
QCM sensor
- Patent number 9,645,115
- Issue date May 9, 2017
- Seiko Instruments Inc.
- Sachiko Tanabe
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever and cantilever manufacturing method
- Patent number 7,823,470
- Issue date Nov 2, 2010
- Seiko Instruments Inc.
- Masatsugu Shigeno
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of manufacturing light-propagating probe for near-field micr...
- Patent number 7,282,157
- Issue date Oct 16, 2007
- SII NanoTechnology Inc.
- Norio Chiba
- G01 - MEASURING TESTING
Information Patent Grant
Light probe microscope including picture signal processing means
- Patent number 6,867,407
- Issue date Mar 15, 2005
- SII NanoTechnology Inc.
- Hiroshi Muramatsu
- G01 - MEASURING TESTING
Information Patent Grant
Sample observation plate and observation apparatus
- Patent number 6,645,434
- Issue date Nov 11, 2003
- Seiko Instruments Inc.
- Hiroshi Muramatsu
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Optical probe and method for manufacturing same and scanning proxim...
- Patent number 6,430,324
- Issue date Aug 6, 2002
- Seiko Instruments Inc.
- Hiroshi Muramatsu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Self-emitting optical probe, method for producing the same, and sca...
- Patent number 6,396,050
- Issue date May 28, 2002
- Seiko Instruments Inc.
- Noritaka Yamamoto
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe for near-field optical microscope, method for manufacturing t...
- Patent number 6,388,239
- Issue date May 14, 2002
- Seiko Instruments Inc.
- Hiroshi Muramatsu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of fabricating probe force atomic force microscope
- Patent number 6,358,426
- Issue date Mar 19, 2002
- Seiko Instruments Inc.
- Hiroshi Muramatsu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for sharpening a probe
- Patent number 6,280,647
- Issue date Aug 28, 2001
- Seiko Instruments Inc.
- Hiroshi Muramatsu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope
- Patent number 6,249,000
- Issue date Jun 19, 2001
- Seiko Instruments Inc.
- Hiroshi Muramatsu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe and scanning probe microscope
- Patent number 6,239,426
- Issue date May 29, 2001
- Seiko Instruments Inc.
- Hiroshi Muramatsu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning near-field optic/atomic force microscope
- Patent number 6,229,609
- Issue date May 8, 2001
- Seiko Instruments Inc.
- Hiroshi Muramatsu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Optical probe, method of manufacturing an optical probe, and scanni...
- Patent number 6,121,604
- Issue date Sep 19, 2000
- The Head of Agency of Industrial Science and Technology
- Takashi Hiraga
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Instrument for chemical measurement
- Patent number 6,111,342
- Issue date Aug 29, 2000
- Seiko Instruments Inc.
- Hiroshi Muramatsu
- G01 - MEASURING TESTING
Information Patent Grant
Optical probe having tapered wave guide and scanning near-field opt...
- Patent number 6,104,030
- Issue date Aug 15, 2000
- Seiko Instruments Inc.
- Norio Chiba
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Microscopic area scanning apparatus
- Patent number 6,100,534
- Issue date Aug 8, 2000
- Seiko Instruments Inc.
- Katsunori Honma
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Micromachining method and micromachined structure
- Patent number 5,976,390
- Issue date Nov 2, 1999
- Seiko Instruments Inc.
- Hiroshi Muramatsu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Optical waveguide probe and optical system and atomic force microsc...
- Patent number 5,969,821
- Issue date Oct 19, 1999
- Seiko Instruments Inc.
- Hiroshi Muramatsu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe, manufacturing method therefor and scanning probe microscope
- Patent number 5,960,147
- Issue date Sep 28, 1999
- Seiko Instruments Inc.
- Hiroshi Muramatsu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning type near field interatomic force microscope
- Patent number 5,939,623
- Issue date Aug 17, 1999
- Seiko Instruments Inc.
- Hiroshi Muramatsu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe for atomic force microscope and atomic force microscope
- Patent number 5,877,412
- Issue date Mar 2, 1999
- Seiko Instruments Inc.
- Hiroshi Muramatsu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning near-field optic/atomic-force microscope with observing fu...
- Patent number 5,821,409
- Issue date Oct 13, 1998
- Seiko Instruments Inc.
- Katsunori Honma
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Optical memory medium
- Patent number 5,654,131
- Issue date Aug 5, 1997
- Seiko Instruments Inc.
- Masamichi Fujihira
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning near-field optic/atomic force microscope in which imaging...
- Patent number 5,627,365
- Issue date May 6, 1997
- Seiko Instruments Inc.
- Norio Chiba
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Optical information read/write apparatus
- Patent number 5,513,168
- Issue date Apr 30, 1996
- Seiko Instruments Inc.
- Masamichi Fujihira
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Fine surface observing apparatus
- Patent number 5,449,901
- Issue date Sep 12, 1995
- Seiko Instruments Inc.
- Masamichi Fujihira
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Electrochemical measurement system
- Patent number 5,334,303
- Issue date Aug 2, 1994
- Seiko Instruments Inc.
- Hiroshi Muramatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for analyzing a gelation reaction by utilizing a...
- Patent number 5,211,054
- Issue date May 18, 1993
- Seiko Instruments Inc.
- Hiroshi Muramatsu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PIEZOELECTRIC UNIT, PIEZOELECTRIC DEVICE, PIEZOELECTRIC DETERMINATI...
- Publication number 20150198562
- Publication date Jul 16, 2015
- SEIKO INSTRUMENTS INC.
- Sachiko Tanabe
- G01 - MEASURING TESTING
Information Patent Application
QCM SENSOR
- Publication number 20140165702
- Publication date Jun 19, 2014
- Seiko Instruments Inc.
- Sachiko TANABE
- G01 - MEASURING TESTING
Information Patent Application
Cantilever and cantilever manufacturing method
- Publication number 20070214875
- Publication date Sep 20, 2007
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Application
Method of manufacturing light-propagating probe for near-field micr...
- Publication number 20040126073
- Publication date Jul 1, 2004
- Norio Chiba
- G02 - OPTICS
Information Patent Application
Interindividual settlement support method
- Publication number 20030200110
- Publication date Oct 23, 2003
- NIFTY CORPORATION
- Naohiro Munechika
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Interindividual settlement support method
- Publication number 20030182205
- Publication date Sep 25, 2003
- NIFTY CORPORATION
- Yuki Watabe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Light probe microscope
- Publication number 20020088919
- Publication date Jul 11, 2002
- Hiroshi Muramatsu
- B82 - NANO-TECHNOLOGY

Hiroshi Muramatsu

Person

Patents Grantslast 30 patents

Piezoelectric unit, piezoelectric device, piezoelectric determinati...

QCM sensor

Cantilever and cantilever manufacturing method

Method of manufacturing light-propagating probe for near-field micr...

Light probe microscope including picture signal processing means

Sample observation plate and observation apparatus

Optical probe and method for manufacturing same and scanning proxim...

Self-emitting optical probe, method for producing the same, and sca...

Probe for near-field optical microscope, method for manufacturing t...

Method of fabricating probe force atomic force microscope

Method for sharpening a probe

Scanning probe microscope

Scanning probe and scanning probe microscope

Scanning near-field optic/atomic force microscope

Optical probe, method of manufacturing an optical probe, and scanni...

Instrument for chemical measurement

Optical probe having tapered wave guide and scanning near-field opt...

Microscopic area scanning apparatus

Micromachining method and micromachined structure

Optical waveguide probe and optical system and atomic force microsc...

Probe, manufacturing method therefor and scanning probe microscope

Scanning type near field interatomic force microscope

Probe for atomic force microscope and atomic force microscope

Scanning near-field optic/atomic-force microscope with observing fu...

Optical memory medium

Scanning near-field optic/atomic force microscope in which imaging...

Optical information read/write apparatus

Fine surface observing apparatus

Electrochemical measurement system

Method and system for analyzing a gelation reaction by utilizing a...

Patents Applicationslast 30 patents

PIEZOELECTRIC UNIT, PIEZOELECTRIC DEVICE, PIEZOELECTRIC DETERMINATI...

QCM SENSOR

Cantilever and cantilever manufacturing method

Method of manufacturing light-propagating probe for near-field micr...

Interindividual settlement support method

Interindividual settlement support method

Light probe microscope