BRIEF DESCRIPTION OF THE DRAWINGS
In the accompanying drawings:
FIG. 1 is a perspective view of a cantilever according to a first embodiment of the present invention;
FIG. 2 is a top view of the cantilever shown in FIG. 1;
FIG. 3 is a side view of the cantilever shown in FIG. 1;
FIG. 4 is a sectional view of the cantilever shown in FIG. 1;
FIGS. 5A to 5C are diagrams illustrating a process of manufacturing the cantilever shown in FIG. 1, of which FIG. 5A is a diagram showing how SPM observation is conducted while performing scanning with a lever portion on a substrate on which a probe portion is placed, FIG. 5B is a diagram showing how, after the SPM observation of FIG. 5A, the lever portion is moved to a position over the probe portion whose position has been located through the SPM observation, FIG. 5C is a diagram showing how the probe portion is forced into a retaining portion to be retained therein;
FIG. 6 is a sectional view of the probe portion forced into the retaining portion;
FIG. 7 is a side view of a modification of the first embodiment of the present invention, showing a cantilever having a probe portion of an elliptical sectional configuration;
FIG. 8 is a sectional view of the cantilever shown in FIG. 7;
FIG. 9 is a top view of a cantilever according to a second embodiment of the present invention;
FIG. 10 is a side view of the cantilever shown in FIG. 9;
FIG. 11 is a sectional view of the cantilever shown in FIG. 9;
FIG. 12 is a sectional view of a modification of the second embodiment of the present invention, showing a cantilever with a communication hole formed so as to be situated on a surface of a lever portion;
FIG. 13 is a side view of the cantilever shown in FIG. 12;
FIG. 14 is a top view of a cantilever according to a third embodiment of the present invention;
FIG. 15 is a side view of the cantilever shown in FIG. 12;
FIG. 16 is a top view of a cantilever according to a fourth embodiment of the present invention;
FIG. 17 is a side view of the cantilever shown in FIG. 16;
FIG. 18 is a sectional view of the cantilever shown in FIG. 16;
FIG. 19 is a side view of a modification of a fourth embodiment of the present invention, showing a cantilever with a probe portion of an elliptical sectional configuration;
FIG. 20 is a sectional view of the cantilever shown in FIG. 19;
FIG. 21 is a sectional view of a cantilever according to a fifth embodiment of the present invention;
FIG. 22 is a side view showing how ambient temperature is raised to expand a variable portion, making an opening size at the other end larger than a diameter of the probe portion;
FIG. 23 is a top view of a cantilever according to a sixth embodiment of the present invention;
FIG. 24 is a side view of the cantilever shown in FIG. 23;
FIG. 25 is a top view of a modification of the sixth embodiment of the present invention, showing a cantilever equipped with a plurality of straight claw portions with turn-up portions at the other ends;
FIG. 26 is a side view of the cantilever shown in FIG. 25;
FIG. 27 is a top view of a cantilever according to a seventh embodiment of the present invention;
FIG. 28 is a side view of the cantilever shown in FIG. 27;
FIG. 29 is a diagram illustrating a process of manufacturing the cantilever shown in FIG. 27, showing how the lever portion is moved to a position over the probe portion whose position has been located through SPM observation;
FIG. 30 is a side view of a modification of the seventh embodiment of the present invention, showing a cantilever having a magnet mounted to a back surface of the lever portion thereof;
FIG. 31 is a top view of the cantilever shown in FIG. 30;
FIG. 32 is a side view of a modification of the seventh embodiment of the present invention, showing a cantilever having an electromagnet mounted to a back surface of the lever portion thereof; and
FIG. 33 is a top view of the cantilever shown in FIG. 32.