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Hiroshi Okabe
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Kyoto, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Optical device having polarizer and non-active retarders for spectr...
Patent number
9,645,011
Issue date
May 9, 2017
Omron Corporation
Hiroshi Okabe
G01 - MEASURING TESTING
Information
Patent Grant
Immunoassay of cofilin 1 protein
Patent number
9,127,054
Issue date
Sep 8, 2015
Toray Industries, Inc.
Michimoto Kobayashi
C07 - ORGANIC CHEMISTRY
Information
Patent Grant
Marker for detecting gastric cancer and method for detecting gastri...
Patent number
9,081,013
Issue date
Jul 14, 2015
Toray Industries, Inc.
Yoshinori Tanaka
G01 - MEASURING TESTING
Information
Patent Grant
Device for and method of inspecting surface condition having differ...
Patent number
7,782,451
Issue date
Aug 24, 2010
Omron Corporation
Toshihiko Matsumoto
G01 - MEASURING TESTING
Information
Patent Grant
Spectroscopic polarimetry
Patent number
7,623,236
Issue date
Nov 24, 2009
National University Corporation Hokkaido University
Kazuhiko Oka
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection method and defect inspection system using the method
Patent number
7,446,864
Issue date
Nov 4, 2008
Omron Corporation
Hiroshi Okabe
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Imaging polarimetry
Patent number
7,336,360
Issue date
Feb 26, 2008
National University Corporation Hokkaido University
Kazuhiko Oka
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MARKER FOR DETECTING COLORECTAL CANCER OR ESOPHAGEAL CANCER AND MET...
Publication number
20140363825
Publication date
Dec 11, 2014
KYOTO UNIVERSITY
Michimoto Kobayashi
G01 - MEASURING TESTING
Information
Patent Application
IMMUNOASSAY OF COFILIN 1 PROTEIN
Publication number
20130288277
Publication date
Oct 31, 2013
KYOTO UNIVERSITY
Michimoto Kobayashi
G01 - MEASURING TESTING
Information
Patent Application
MARKER FOR DETECTING GASTRIC CANCER AND METHOD FOR DETECTING GASTRI...
Publication number
20130011865
Publication date
Jan 10, 2013
Michimoto Kobayashi
G01 - MEASURING TESTING
Information
Patent Application
MARKER FOR DETECTING GASTRIC CANCER AND METHOD FOR DETECTING GASTRI...
Publication number
20120329074
Publication date
Dec 27, 2012
Yoshinori Tanaka
G01 - MEASURING TESTING
Information
Patent Application
Defect inspection apparatus and defect inspection method
Publication number
20070211242
Publication date
Sep 13, 2007
OMRON CORPORATION
Hiroshi Okabe
G01 - MEASURING TESTING
Information
Patent Application
Device for and method of inspecting surface condition
Publication number
20070211240
Publication date
Sep 13, 2007
OMRON CORPORATION
Toshihiko Matsumoto
G01 - MEASURING TESTING
Information
Patent Application
Imaging polarimetry
Publication number
20070030551
Publication date
Feb 8, 2007
National University Corporation Hokkaido University
Kazuhiko Oka
G02 - OPTICS
Information
Patent Application
Defect inspection method and defect inspection system using the method
Publication number
20060251315
Publication date
Nov 9, 2006
OMRON CORPORATION
Hiroshi Okabe
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Spectroscopic polarimetry
Publication number
20060238759
Publication date
Oct 26, 2006
OMRON CORPORATION
Hiroshi Okabe
G01 - MEASURING TESTING
Information
Patent Application
Spectroscopic polarimetry
Publication number
20060170921
Publication date
Aug 3, 2006
Hokkaido Technology Licensing Office Co. Ltd.
Kazuhiko Oka
G01 - MEASURING TESTING