Hiroto Nagatomo

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Inspection data analyzing system
- Patent number 6,628,817
- Issue date Sep 30, 2003
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection data analyzing system
- Patent number 6,529,619
- Issue date Mar 4, 2003
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection data analyzing system
- Patent number 6,339,653
- Issue date Jan 15, 2002
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection data analyzing system
- Patent number 6,330,352
- Issue date Dec 11, 2001
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and method using separate processors for processi...
- Patent number 6,185,322
- Issue date Feb 6, 2001
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection data analyzing system
- Patent number 5,841,893
- Issue date Nov 24, 1998
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for carrying a variety of products
- Patent number 5,536,128
- Issue date Jul 16, 1996
- Hitachi, Ltd.
- Sadao Shimoyashiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern defect inspection apparatus
- Patent number 4,731,855
- Issue date Mar 15, 1988
- Hitachi, Ltd.
- Kyo Suda
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing system
- Patent number 4,544,318
- Issue date Oct 1, 1985
- Hitachi, Ltd.
- Hiroto Nagatomo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of inspecting the surface of an object and apparatus therefor
- Patent number 4,342,515
- Issue date Aug 3, 1982
- Hitachi, Ltd.
- Masakuni Akiba
- G01 - MEASURING TESTING
Information Patent Grant
Surface treatment device
- Patent number 4,282,825
- Issue date Aug 11, 1981
- Hitachi, Ltd.
- Hiroto Nagatomo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Production line constructing system
- Publication number 20020064440
- Publication date May 30, 2002
- Minoru Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inspection data analyzing system
- Publication number 20020034326
- Publication date Mar 21, 2002
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Application
Inspection data analyzing system
- Publication number 20010038708
- Publication date Nov 8, 2001
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Application
Inspection data analyzing system
- Publication number 20010001015
- Publication date May 10, 2001
- Seiji Ishikawa
- G01 - MEASURING TESTING

Hiroto Nagatomo

Person

Patents Grantslast 30 patents

Inspection data analyzing system

Inspection data analyzing system

Inspection data analyzing system

Inspection data analyzing system

Inspection system and method using separate processors for processi...

Inspection data analyzing system

Method and apparatus for carrying a variety of products

Pattern defect inspection apparatus

Manufacturing system

Method of inspecting the surface of an object and apparatus therefor

Surface treatment device

Patents Applicationslast 30 patents

Production line constructing system

Inspection data analyzing system

Inspection data analyzing system

Inspection data analyzing system