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Hiroya Koshishiba
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Yokohama, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Apparatus and method for detecting threats
Patent number
7,260,173
Issue date
Aug 21, 2007
Hitachi, Ltd.
Kyoichiro Wakayama
G01 - MEASURING TESTING
Information
Patent Grant
Inspection system for circuit patterns and a method thereof
Patent number
6,831,998
Issue date
Dec 14, 2004
Hitachi, Ltd.
Hiroya Koshishiba
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Sample processing apparatus and method for removing charge on sampl...
Patent number
6,507,029
Issue date
Jan 14, 2003
Hitachi, Ltd.
Norimasa Nishimura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and device of inspecting three-dimensional shape defect
Patent number
6,072,899
Issue date
Jun 6, 2000
Hitachi, Ltd.
Yoko Irie
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
X-ray imaging system
Patent number
5,629,969
Issue date
May 13, 1997
Hitachi, Ltd.
Hiroya Koshishiba
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
X-ray tomography method and apparatus thereof
Patent number
5,351,278
Issue date
Sep 27, 1994
Hitachi, Ltd.
Hiroya Koshishiba
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method of pattern detection based on a scanning trans...
Patent number
5,051,585
Issue date
Sep 24, 1991
Hitachi, Ltd.
Hiroya Koshishiba
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method for inspecting filled state of via-holes filled with fillers...
Patent number
5,015,097
Issue date
May 14, 1991
Hitachi, Ltd.
Mineo Nomoto
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Electron microscope
Patent number
4,990,776
Issue date
Feb 5, 1991
Hitachi, Ltd.
Satoru Fushimi
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for detecting defect in circuit pattern of a m...
Patent number
4,814,615
Issue date
Mar 21, 1989
Hitachi, Ltd.
Satoru Fushimi
B82 - NANO-TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
Apparatus and method for detecting threats
Publication number
20040101097
Publication date
May 27, 2004
Kyoichiro Wakayama
G01 - MEASURING TESTING