Hiroyuki Mineo

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electronic component testing apparatus, sockets, and replacement pa...
- Patent number 12,025,654
- Issue date Jul 2, 2024
- Advantest Corporation
- Natsuki Shiota
- G01 - MEASURING TESTING
Information Patent Grant
Electronic component testing apparatus, sockets, and replacement pa...
- Patent number 11,802,904
- Issue date Oct 31, 2023
- Advantest Corporation
- Natsuki Shiota
- G01 - MEASURING TESTING
Information Patent Grant
Test section unit, test head and electronic device testing apparatus
- Patent number 8,314,630
- Issue date Nov 20, 2012
- Advantest Corporation
- Toru Murakami
- G01 - MEASURING TESTING
Information Patent Grant
Measuring board for electronic device test apparatus
- Patent number 7,688,092
- Issue date Mar 30, 2010
- Advantest Corporation
- Hiroyuki Mineo
- G01 - MEASURING TESTING
Information Patent Grant
Connector housing block, interface member and electronic device tes...
- Patent number 7,458,837
- Issue date Dec 2, 2008
- Advantest Corporation
- Hiroyuki Mineo
- G01 - MEASURING TESTING
Information Patent Grant
Measurement board for electronic device test apparatus
- Patent number 7,405,582
- Issue date Jul 29, 2008
- Advantest Corporation
- Hiroyuki Mineo
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test apparatus and interface plate
- Patent number 7,339,385
- Issue date Mar 4, 2008
- Advantest Corporation
- Hiromitsu Takasu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRONIC COMPONENT TESTING APPARATUS, SOCKETS, AND REPLACEMENT PA...
- Publication number 20240027519
- Publication date Jan 25, 2024
- Advantest Corporation
- Natsuki Shiota
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC COMPONENT TESTING APPARATUS, SOCKETS, AND REPLACEMENT PA...
- Publication number 20210190855
- Publication date Jun 24, 2021
- Advantest Corporation
- Natsuki Shiota
- G01 - MEASURING TESTING
Information Patent Application
Test section unit, test head and electronic device testing apparatus
- Publication number 20100213959
- Publication date Aug 26, 2010
- Advantest Corporation
- Toru Murakami
- G01 - MEASURING TESTING
Information Patent Application
Measuring board for electronic device test apparatus
- Publication number 20090033347
- Publication date Feb 5, 2009
- Hiroyuki Mineo
- G01 - MEASURING TESTING
Information Patent Application
Measurement board for electronic device test apparatus
- Publication number 20070296432
- Publication date Dec 27, 2007
- Advantest Corporation
- Hiroyuki Mineo
- G01 - MEASURING TESTING
Information Patent Application
Connector housing block, interface member and electronic device tes...
- Publication number 20070167083
- Publication date Jul 19, 2007
- Advantest Corporation
- Hiroyuki Mineo
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor test apparatus and interface plate
- Publication number 20070001702
- Publication date Jan 4, 2007
- Advantest Corporation
- Hiromitsu Takasu
- G01 - MEASURING TESTING

Hiroyuki Mineo

Person

Patents Grantslast 30 patents

Electronic component testing apparatus, sockets, and replacement pa...

Electronic component testing apparatus, sockets, and replacement pa...

Test section unit, test head and electronic device testing apparatus

Measuring board for electronic device test apparatus

Connector housing block, interface member and electronic device tes...

Measurement board for electronic device test apparatus

Semiconductor test apparatus and interface plate

Patents Applicationslast 30 patents

ELECTRONIC COMPONENT TESTING APPARATUS, SOCKETS, AND REPLACEMENT PA...

ELECTRONIC COMPONENT TESTING APPARATUS, SOCKETS, AND REPLACEMENT PA...

Test section unit, test head and electronic device testing apparatus

Measuring board for electronic device test apparatus

Measurement board for electronic device test apparatus

Connector housing block, interface member and electronic device tes...

Semiconductor test apparatus and interface plate