Hiroyuki Takamatsu

Person

Hyogo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Oxide film thickness measurement device and method
- Patent number 11,852,458
- Issue date Dec 26, 2023
- Kobe Steel, Ltd.
- Masahiro Inui
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Device and method for measuring oxide film thickness
- Patent number 11,761,752
- Issue date Sep 19, 2023
- Kobe Steel, Ltd.
- Masahiro Inui
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for measuring stress
- Patent number 11,221,304
- Issue date Jan 11, 2022
- Kobe Steel, Ltd.
- Hiroyuki Takamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring stress
- Patent number 10,914,692
- Issue date Feb 9, 2021
- Kobe Steel, Ltd.
- Hiroyuki Takamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring semiconductor carrier lifetime
- Patent number 9,279,762
- Issue date Mar 8, 2016
- Kobe Steel, Ltd.
- Kazushi Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Axial gap type brushless motor
- Patent number 9,160,219
- Issue date Oct 13, 2015
- Kobe Steel, Ltd.
- Hiroyuki Takamatsu
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Crystalline quality evaluation apparatus for thin-film semiconducto...
- Patent number 8,952,338
- Issue date Feb 10, 2015
- Kobe Steel, Ltd.
- Naokazu Sakoda
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting interaction between nucleic acid and protein, a...
- Patent number 8,367,329
- Issue date Feb 5, 2013
- National University Corporation Tokyo University of Agriculture and Technology
- Kazunori Ikebukuro
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Analyzer for absorption spectrometry of impurity concentration cont...
- Patent number 8,023,118
- Issue date Sep 20, 2011
- Kobe Steel, Ltd.
- Eiji Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for forming thin film
- Patent number 7,897,025
- Issue date Mar 1, 2011
- Kabushiki Kaisha Kobe Seiko Sho.
- Kenichi Inoue
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Photothermal conversion measurement apparatus, photothermal convers...
- Patent number 7,522,287
- Issue date Apr 21, 2009
- Kobe Steel, Ltd.
- Eiji Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Method of and apparatus for measuring lifetime of carriers in semic...
- Patent number 5,760,597
- Issue date Jun 2, 1998
- Kabushiki Kaisha Kobe Seiko Sho
- Naoyuki Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Method of sample valuation based on the measurement of photothermal...
- Patent number 5,619,326
- Issue date Apr 8, 1997
- Kabushiki Kaisha Kobe Seiko Sho
- Hiroyuki Takamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Sample evaluating method by using thermal expansion displacement
- Patent number 5,298,970
- Issue date Mar 29, 1994
- Kabushiki Kaisha Kobe Seiko Sho
- Hiroyuki Takamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting position/variance of input light...
- Patent number 4,874,939
- Issue date Oct 17, 1989
- Kabushiki Kaisha Kobe Seiko Sho
- Yoshiro Nishimoto
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR MEASURING RESIDUAL STRESS
- Publication number 20230304876
- Publication date Sep 28, 2023
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Mariko MATSUDA
- G01 - MEASURING TESTING
Information Patent Application
OXIDE FILM THICKNESS MEASUREMENT DEVICE AND METHOD
- Publication number 20210356253
- Publication date Nov 18, 2021
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Masahiro INUI
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING OXIDE FILM THICKNESS
- Publication number 20210356254
- Publication date Nov 18, 2021
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Masahiro INUI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING RESIDUAL STRESS
- Publication number 20210055173
- Publication date Feb 25, 2021
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Mariko MATSUDA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING RESIDUAL STRESS
- Publication number 20200340933
- Publication date Oct 29, 2020
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Mariko MATSUDA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING STRESS
- Publication number 20200141885
- Publication date May 7, 2020
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Hiroyuki TAKAMATSU
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING STRESS
- Publication number 20200072769
- Publication date Mar 5, 2020
- KABUSHIKI KAISHA KOBE SEIKO SHO (KOBE STEEL, LTD)
- Hiroyuki TAKAMATSU
- G01 - MEASURING TESTING
Information Patent Application
CRYSTALLINE QUALITY EVALUATION APPARATUS FOR THIN-FILM SEMICONDUCTO...
- Publication number 20130153778
- Publication date Jun 20, 2013
- KOBELCO RESEARCH INSTITUTE, INC.
- Naokazu Sakoda
- G01 - MEASURING TESTING
Information Patent Application
AXIAL GAP TYPE BRUSHLESS MOTOR
- Publication number 20130009508
- Publication date Jan 10, 2013
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Hiroyuki Takamatsu
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
APPARATUS AND METHOD FOR MEASURING SEMICONDUCTOR CARRIER LIFETIME
- Publication number 20120203473
- Publication date Aug 9, 2012
- KOBELCO RESEARCH INSTITUTE, INC.
- Kazushi Hayashi
- G01 - MEASURING TESTING
Information Patent Application
Method of detecting interaction between nucleic acid and protein, a...
- Publication number 20100159451
- Publication date Jun 24, 2010
- Kazunori Ikebukuro
- G01 - MEASURING TESTING
Information Patent Application
Analyzer
- Publication number 20090027654
- Publication date Jan 29, 2009
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Eiji Takahashi
- G01 - MEASURING TESTING
Information Patent Application
Photothermal conversion measuring instrument
- Publication number 20080123099
- Publication date May 29, 2008
- Kabushiki Kaisha Kobe Seiko Sho.
- Eiji Takahashi
- G01 - MEASURING TESTING
Information Patent Application
Photothermal conversion measurement apparatus, photothermal convers...
- Publication number 20060181708
- Publication date Aug 17, 2006
- Kabushiki Kaisha Kobe Seiko Sho.
- Eiji Takahashi
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for forming thin film
- Publication number 20050136694
- Publication date Jun 23, 2005
- Kabushiki Kaisha Kobe Seiko Sho.
- Kenichi Inoue
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Hiroyuki Takamatsu

Person

Patents Grantslast 30 patents

Oxide film thickness measurement device and method

Device and method for measuring oxide film thickness

Method for measuring stress

Method for measuring stress

Apparatus and method for measuring semiconductor carrier lifetime

Axial gap type brushless motor

Crystalline quality evaluation apparatus for thin-film semiconducto...

Method of detecting interaction between nucleic acid and protein, a...

Analyzer for absorption spectrometry of impurity concentration cont...

Method and apparatus for forming thin film

Photothermal conversion measurement apparatus, photothermal convers...

Method of and apparatus for measuring lifetime of carriers in semic...

Method of sample valuation based on the measurement of photothermal...

Sample evaluating method by using thermal expansion displacement

Method and apparatus for detecting position/variance of input light...

Patents Applicationslast 30 patents

METHOD FOR MEASURING RESIDUAL STRESS

OXIDE FILM THICKNESS MEASUREMENT DEVICE AND METHOD

DEVICE AND METHOD FOR MEASURING OXIDE FILM THICKNESS

METHOD FOR MEASURING RESIDUAL STRESS

METHOD FOR MEASURING RESIDUAL STRESS

METHOD FOR MEASURING STRESS

METHOD FOR MEASURING STRESS

CRYSTALLINE QUALITY EVALUATION APPARATUS FOR THIN-FILM SEMICONDUCTO...

AXIAL GAP TYPE BRUSHLESS MOTOR

APPARATUS AND METHOD FOR MEASURING SEMICONDUCTOR CARRIER LIFETIME

Method of detecting interaction between nucleic acid and protein, a...

Analyzer

Photothermal conversion measuring instrument

Photothermal conversion measurement apparatus, photothermal convers...

Method and apparatus for forming thin film