The present invention relates to a method for measuring a residual stress.
Recently, a technique for measuring a residual stress using X-rays has been widely applied. In this technique, a lattice distortion occurring inside a specimen having a crystalline structure is measured using X-rays, and the measurement result is converted into a residual stress.
As a method for measuring a residual stress using X-rays, a cos α method is known. In the cos α method, a specimen is irradiated with X-rays at a specific angle of incidence, intensities of diffracted X-rays generated by reflection of the X-rays by the specimen are two-dimensionally detected, and a residual stress is measured based on a diffraction ring formed by an intensity distribution of the diffracted X-rays which have been detected (see Japanese Unexamined Patent Application, Publication No. H5-72061).
In a case in which the angle of incidence of the X-rays is denoted by Ψ [°], measurement accuracy of the cos α method is generally proportional to sin 2Ψ. Therefore, in the cos α method, the measurement accuracy decreases as the angle of incidence Ψ of the X-rays on the specimen becomes further from 45°. For example, when the angle of incidence Ψ of the X-rays is less than 15°, the measurement accuracy rapidly deteriorates. Furthermore, with an increase in the angle of incidence Ψ of the X-rays, an influence of surface roughness of the specimen thereon is more likely to increase. Therefore, in the cos α method, the angle of incidence Ψ of the X-rays on the specimen is set to typically greater than or equal to 15° and less than or equal to 65°, and preferably 35°.
However, with regard to a structure including: an axis portion having a cylindrical shape; and a flange portion (plate-shaped portion) protruding radially from the axis portion, wherein a fillet portion for alleviating stress concentration is provided in a connection portion between the axis portion and the flange portion, when a residual stress of the fillet portion is to be measured, it may be difficult to set the angle of incidence Ψ to a desired value. That is to say, when the angle of incidence Ψ of the X-rays is to be set to greater than or equal to 15° and less than or equal to 65°, a measuring apparatus may interfere with the specimen. In this case, conventionally, the residual stress has been measured in such a manner that the angle of incidence Ψ of the X-rays is set to an appropriate angle falling outside the desired range. However, it is difficult to accurately measure the residual stress of the specimen by the conventional method.
The present invention was made in view of the foregoing circumstances, and an object of the present invention is to provide a method for measuring a residual stress, the method enabling measuring a residual stress of a fillet portion with high accuracy.
One aspect of the present invention made to solve the foregoing problems is a method for measuring a residual stress of a fillet portion of a metallic structure, the metallic structure including: an axis portion; and a flange portion protruding radially from the axis portion, wherein the metallic structure includes the fillet portion in a connection portion between the axis portion and the flange portion, the method including: a calculating step of calculating the residual stress by a cos α method, by using an X-ray stress measuring apparatus including: an irradiation portion which delivers X-rays; a two-dimensional detector which detects a diffraction ring generated by Bragg diffraction of the X-rays delivered from the irradiation portion to the fillet portion; and a housing in which the irradiation portion and the two-dimensional detector are mounted, wherein in a case in which an angle of incidence of the X-rays is denoted by Ψ [°], a fillet radius of the fillet portion is denoted by R [mm], a fillet angle of the fillet portion is denoted by θ [°], a vertical width of the housing is denoted by W [mm], a width of a detection region of the two-dimensional detector is denoted by D [mm], a complementary angle of a Bragg angle is denoted by η [°], and an interval between the flange portion and an imaginary straight line which passes through a fillet center and is parallel to the flange portion is denoted by a [mm], the following formula 1 is satisfied:
D≤W 1
According to the method for measuring a residual stress, in the case of measuring the residual stress of the fillet portion formed in the connection portion between the axis portion and the flange portion, the angle of incidence Ψ of the X-rays can be brought close to a desired angle. Thus, according to the method for measuring a residual stress, the residual stress of the fillet portion can be measured with high accuracy.
In a case in which the fillet portion includes a plurality of regions having different diameters, a center of curvature and a radius of curvature of, among the plurality of regions, a region having a largest diameter are preferably defined as the fillet center and the fillet radius of the fillet portion. In the case in which the fillet portion includes the plurality of regions having different diameters, by thus defining the center of curvature and the radius of curvature of, among the plurality of regions, the region having the largest diameter as the fillet center and the fillet radius of the fillet portion, the residual stress of the fillet portion can be easily measured with high accuracy.
In the case in which the fillet portion includes a plurality of regions having different diameters, a center of curvature and a radius of curvature of, among the plurality of regions, a region having a longest arc are preferably defined as the fillet center and the fillet radius of the fillet portion. In the case in which the fillet portion includes the plurality of regions having different diameters, by thus defining the center of curvature and the radius of curvature of, among the plurality of regions, the region having the longest arc as the fillet center and the fillet radius of the fillet portion, the residual stress of the fillet portion can be easily measured with high accuracy.
The calculating step preferably includes: a step of disposing the X-ray stress measuring apparatus with respect to the fillet portion, by adjusting the irradiation distance L such that the angle of incidence Ψ approaches a set value within a range that satisfies the above formulae 1 to 3. The method for measuring a residual stress enables disposing the X-ray stress measuring apparatus at a desired position based on the above formulae 1 to 3, whereby the residual stress of the fillet portion can be easily measured with high accuracy.
The set value is preferably 35° or −35°. When the set value is the aforementioned value, the residual stress of the fillet portion can be easily measured with high accuracy.
It is to be noted that in the present invention, the “fillet center” as referred to herein means a center of curvature of the fillet portion. The “fillet radius of the fillet portion” as referred to herein means a radius of curvature of the fillet portion. The “fillet angle of the fillet portion” as referred to herein means an angle in a side view, formed between an imaginary straight line (see an imaginary straight line V in
As described above, the method for measuring a residual stress according to the one aspect of the present invention enables measuring the residual stress of the fillet portion with high accuracy.
Hereinafter, embodiments of the present invention are described in detail with reference to the drawings.
Method for Measuring Residual Stress
As illustrated in
The X-ray stress measuring apparatus 10 is configured to enable detecting the diffraction ring by irradiating the metallic structure M with the X-rays. The housing 3 has, for example, a generally rectangular parallelepiped shape. The housing 3 has: the lower surface 3a adjacent to the axis portion 11; and the upper surface 3b facing the lower surface 3a and being adjacent to the flange portion 12. In the housing 3, the lower surface 3a approaches the axis portion 11 when the angle of incidence Ψ shifts to a positive side, and the upper surface 3b approaches the flange portion 12 when the angle of incidence Ψ shifts to a negative side. The two-dimensional detector 2 is provided at an end on an X-ray emission surface side of the housing 3. That is to say, the two-dimensional detector 2 is provided at an end on a side facing a measurement site S. A calculator (not illustrated) capable of using the diffraction ring to calculate the residual stress by the cos α method is connected to the housing 3. The two-dimensional detector 2 is exemplified by an imaging plate.
In the method for measuring a residual stress, in a case in which the angle of incidence of the X-rays is denoted by Ψ [°], a fillet radius of the fillet portion 13 is denoted by R [mm], a fillet angle of the fillet portion 13 is denoted by θ [°], a vertical width of the housing 3 is denoted by W [mm], a width of a detection region of the two-dimensional detector 2 is denoted by D [mm], a complementary angle of a Bragg angle is denoted by η [°], and an interval between the flange portion 12 and the imaginary straight line V which passes through a fillet center P and is parallel to the flange portion 12 is denoted by a [mm], the following formula 1 is satisfied.
D≤W 1
In the method for measuring a residual stress, the residual stress of the fillet portion 13 is measured by capturing an image of an entirety or a part of the diffraction ring on the two-dimensional detector 2. Therefore, as shown in the above formula 1, the width D of the detection region of the two-dimensional detector 2 needs to be less than or equal to the vertical width W of the housing 3. It is to be noted that the “width of the detection region of the two-dimensional detector” as referred to herein more specifically means the width of the detection region of the two-dimensional detector in a vertical direction of the housing (i.e., a vertical width of the detection region of the two-dimensional detector).
Furthermore, in the method for measuring a residual stress, in a case in which Ψ≥0, an irradiation distance L [mm] of the X-rays, the irradiation distance L being based on the two-dimensional detector 2 in the calculating step, satisfies the following formula 2.
Moreover, in the method for measuring a residual stress, in a case in which Ψ<0, the irradiation distance L [mm] of the X-rays, the irradiation distance L being based on the two-dimensional detector 2 in the calculating step, satisfies the following formula 3.
It is to be noted that the angle of incidence Ψ of the X-rays refers to an angle formed between the X-rays and the imaginary straight line N which passes through the measurement site S and the fillet center P. Furthermore, with respect to the imaginary straight line N which passes through the measurement site S and the fillet center P, the angle of incidence Ψ is positive in a case of tilting toward the axis portion 11, and is negative in a case of tilting toward the flange portion 12.
In the method for measuring a residual stress, when the irradiation distance L of the X-rays is excessively small, in a case in which the housing 3 is tilted such that the angle of incidence Ψ of the X-rays has a desired value, the housing 3 may interfere with the axis portion 11 or the flange portion 12. On the other hand, in the method for measuring a residual stress, by increasing the irradiation distance L of the X-rays, the angle of incidence Ψ of the X-rays can be set to fall within a relatively large range. However, in this case, when the irradiation distance L of the X-rays is excessively increased, the two-dimensional detector 2 cannot detect peaks of X-rays diffracted at a diffraction angle η.
In light of this, in the case of tilting the housing 3 toward the axis portion 11 with respect to the imaginary straight line N which passes through the measurement site S and the fillet center P (i.e., in the case in which the angle of incidence Ψ of the X-rays is positive), the lower limit value of the irradiation distance L of the X-rays is represented by the following formula 4 according to the condition that the housing 3 is not in contact with the axis portion 11, and the upper limit value of the irradiation distance L of the X-rays is represented by the following formula 5 according to the condition that the peaks of the diffraction ring are detectable with the two-dimensional detector 2.
On the other hand, in the case of tilting the housing 3 toward the flange portion 12 with respect to the imaginary straight line N which passes through the measurement site S and the fillet center P (i.e., in the case in which the angle of incidence Ψ of the X-rays is negative), the lower limit value of the irradiation distance L of the X-rays is represented by the following formula 6 according to the condition that the housing 3 is not in contact with the flange portion 12, and the upper limit value of the irradiation distance L of the X-rays is represented by the following formula 7 according to the condition that the peaks of the diffraction ring are detectable with the two-dimensional detector 2.
Measurement Conditions
Measurement conditions in the method for measuring a residual stress are described with reference to
Irradiation Distance
Firstly, a possible range of the irradiation distance L of the X-rays in the method for measuring a residual stress is described with reference to
In
In
Vertical Width of Housing
A possible range of the vertical width W of the housing 3 in the method for measuring a residual stress is described with reference to
In
In
Settings of Fillet Center and Fillet Radius
As illustrated in
A fillet portion 13a in
A fillet portion 13b in
Measurement of Residual Stress
The calculating step preferably includes a step (disposing step) of disposing the X-ray stress measuring apparatus 10 with respect to the fillet portion 13, 13a, or 13b by adjusting the irradiation distance L of the X-rays such that the angle of incidence Ψ of the X-rays approaches a set value within a range that satisfies the above formulae 1 to 3. That is to say, the calculating step preferably includes: a step (deriving step) of deriving, by using the above formulae 1 to 3, conditions for disposing the X-ray stress measuring apparatus 10; a step (disposing step) of disposing the X-ray stress measuring apparatus 10 with respect to the fillet portion 13, 13a, or 13b based on the conditions derived in the deriving step; and a step (residual stress-calculating step) of calculating the residual stress of the fillet portion 13, 13a, or 13b in the disposition in the disposing step, wherein in the disposing step, the X-ray stress measuring apparatus 10 is disposed with respect to the fillet portion 13, 13a, or 13b by adjusting the irradiation distance L of the X-rays such that the angle of incidence Ψ of the X-rays approaches the set value within the range that satisfies the above formulae 1 to 3. In the disposing step, for example, a tilt direction of the housing 3 and the irradiation distance L of the X-rays are adjusted such that the angle of incidence Ψ of the X-rays approaches the set value. When the calculating step includes the above-described disposing step, the method for measuring a residual stress enables easily measuring, with high accuracy, the residual stress of the fillet portion 13, 13a, or 13b.
The set value in the disposing step is preferably 35° or −35°. According to this configuration, the residual stress of the fillet portion 13, 13a, or 13b can be measured with higher accuracy.
In the deriving step, conditions that satisfy the set value are preferably derived as the conditions for disposing the X-ray stress measuring apparatus 10. However, a case in which the conditions that satisfy the set value cannot be derived in the deriving step depending on a shape of the fillet portion 13, 13a, or 13b may be conceivable. In such a case in which the conditions that satisfy the set value cannot be derived in the deriving step, the method for measuring a residual stress has remarkable superiority to a conventional measurement method in which the disposition of the X-ray stress measuring apparatus 10 has been decided by feeling. In the method for measuring a residual stress, for example, the angle of incidence Ψ of the X-rays derived in the deriving step may fall within ±30° (i.e., greater than or equal to −30° and less than or equal to 30°), and may fall within ±15° (i.e., greater than or equal to −15° and less than or equal to 15°). Even in such a case, the method for measuring a residual stress enables easily measuring, with high accuracy, the residual stress of the fillet portion 13, 13a, or 13b as compared with the conventional measurement method.
Advantages
According to the method for measuring a residual stress, in the case of measuring the residual stress of the fillet portion 13, 13a, or 13b formed in the connection portion between the axis portion 11 and the flange portion 12, the angle of incidence Ψ of the X-rays can be brought close to a desired angle. Thus, according to the method for measuring a residual stress, the residual stress of the fillet portion 13, 13a, or 13b can be measured with high accuracy.
The above-described embodiments do not limit the configuration of the present invention. Therefore, in the above-described embodiments, the components of each part of the above-described embodiments can be omitted, replaced, or added based on the description in the present specification and general technical knowledge, and such omission, replacement, or addition should be construed as falling within the scope of the present invention.
In the method for measuring a residual stress, in the case in which the fillet portion includes the plurality of regions having different diameters, for example, the fillet center and the fillet radius may be determined for each measurement site.
Hereinafter, the present invention is described in detail by way of Examples; the present invention should not be construed as being limited to description in the Examples.
By using an X-ray stress measuring apparatus in which the width D of a detection region of a two-dimensional detector is 70 mm and the vertical width of a housing is 102 mm, the residual stress of a fillet portion of a metallic structure including an axis portion and a flange portion protruding radially from the axis portion was measured by the cos α method. The fillet radius R of the fillet portion was 29 mm, the complementary angle η of the Bragg angle was 23.6°, and the interval a between the flange portion and the imaginary straight line which passes through the fillet center and is parallel to the flange portion was 8 mm.
While visually confirming that the housing did not come in contact with the axis portion or the flange portion, the X-ray stress measuring apparatus was disposed such that the angle of incidence Ψ of the X-rays was as large as possible. In the Comparative Examples, the residual stress of the fillet portion was measured by, in each of cases of the fillet angle θ of the fillet portion being 45°, 50°, and 55°, changing the disposition of the X-ray stress measuring apparatus 6 times.
For each of the cases of the fillet angle θ being 45°, 50°, and 55°, the disposition of the X-ray stress measuring apparatus was decided using the above formulae 1 to 3. In the Examples, by using the above formulae 1 to 3, the disposition of the X-ray stress measuring apparatus was decided such that the angle of incidence Ψ of the X-rays approached ±35°. In the Examples, in each of the cases of the fillet angle θ being 45°, 50°, and 55°, the housing was tilted toward the axis portion with respect to the imaginary straight line which passes through the measurement site and the fillet center.
As illustrated in
As described above, the method for measuring a residual stress according to the one aspect of the present invention is suitable for measuring the residual stress of the fillet portion.
Number | Date | Country | Kind |
---|---|---|---|
2020-096360 | Jun 2020 | JP | national |
Filing Document | Filing Date | Country | Kind |
---|---|---|---|
PCT/JP2021/016328 | 4/22/2021 | WO |
Publishing Document | Publishing Date | Country | Kind |
---|---|---|---|
WO2021/246080 | 12/9/2021 | WO | A |
Number | Name | Date | Kind |
---|---|---|---|
20190094160 | Sunder | Mar 2019 | A1 |
20200072769 | Takamatsu | Mar 2020 | A1 |
Number | Date | Country |
---|---|---|
3 070 447 | Sep 2016 | EP |
3 786 600 | Mar 2021 | EP |
4 202 389 | Jun 2023 | EP |
5-72061 | Mar 1993 | JP |
WO 2006056647 | Jun 2006 | WO |
WO-2019208061 | Oct 2019 | WO |
Entry |
---|
Extended European Search Report issued on Sep. 29, 2023 in European Patent Application No. 21818782.1, 9 pages. |
Number | Date | Country | |
---|---|---|---|
20230304876 A1 | Sep 2023 | US |