Hisao Asakura

Person

Ohme, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method for test conditions
- Patent number 6,895,346
- Issue date May 17, 2005
- Hitachi, Ltd.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Grant
Photomask for test wafers
- Patent number 6,841,405
- Issue date Jan 11, 2005
- Hitachi, Ltd.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 6,812,540
- Issue date Nov 2, 2004
- Hitachi, Ltd.
- Norikatsu Takaura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for testing electronic devices
- Patent number 6,780,660
- Issue date Aug 24, 2004
- Hitachi, Ltd.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing electronic devices indicating short-circuit
- Patent number 6,771,077
- Issue date Aug 3, 2004
- Hitachi, Ltd.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing electronic devices
- Patent number 6,770,496
- Issue date Aug 3, 2004
- Hitachi, Ltd.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit
- Patent number 6,566,719
- Issue date May 20, 2003
- Hitachi, Ltd.
- Hisao Asakura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process of manufacturing semiconductor integrated circuit device ha...
- Patent number 6,399,453
- Issue date Jun 4, 2002
- Hitachi, Ltd.
- Ryo Nagai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating semiconductor device
- Patent number 6,287,912
- Issue date Sep 11, 2001
- Hitachi, Ltd.
- Hisao Asakura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit devices and a method of manufactur...
- Patent number 6,265,254
- Issue date Jul 24, 2001
- Hitachi, Ltd.
- Hisao Asakura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a semiconductor device, and semiconductor d...
- Patent number 6,198,128
- Issue date Mar 6, 2001
- Hitachi, Ltd.
- Hisao Asakura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor device
- Patent number 6,077,735
- Issue date Jun 20, 2000
- Texas Instruments Incorporated
- Yuji Ezaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
CMOS device structure with reduced short channel effect and memory...
- Patent number 6,020,228
- Issue date Feb 1, 2000
- Hitachi, Ltd.
- Hisao Asakura
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor integrated circuit device
- Publication number 20050035428
- Publication date Feb 17, 2005
- Hitachi, Ltd.
- Norikatsu Takaura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of testing electronic devices
- Publication number 20030197523
- Publication date Oct 23, 2003
- HITACHI, LTD.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Application
Method for test conditions
- Publication number 20030199110
- Publication date Oct 23, 2003
- HITACHI, LTD.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Application
Method of manufacturing electronic devices
- Publication number 20030199107
- Publication date Oct 23, 2003
- Hitachi, Ltd
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Application
System for testing electronic devices
- Publication number 20030199111
- Publication date Oct 23, 2003
- HITACHI, LTD.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Application
Photomask for test wafers
- Publication number 20030197522
- Publication date Oct 23, 2003
- HITACHI, LTD.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor integrated circuit device
- Publication number 20030111707
- Publication date Jun 19, 2003
- Hitachi, Ltd.
- Norikatsu Takaura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor integrated circuit device and the process of manufact...
- Publication number 20010054725
- Publication date Dec 27, 2001
- Ryo Nagai
- H01 - BASIC ELECTRIC ELEMENTS

Hisao Asakura

Person

Patents Grantslast 30 patents

Method for test conditions

Photomask for test wafers

Semiconductor integrated circuit device

System for testing electronic devices

Method of testing electronic devices indicating short-circuit

Method of testing electronic devices

Semiconductor integrated circuit

Process of manufacturing semiconductor integrated circuit device ha...

Method of fabricating semiconductor device

Semiconductor integrated circuit devices and a method of manufactur...

Method of manufacturing a semiconductor device, and semiconductor d...

Method of manufacturing semiconductor device

CMOS device structure with reduced short channel effect and memory...

Patents Applicationslast 30 patents

Semiconductor integrated circuit device

Method of testing electronic devices

Method for test conditions

Method of manufacturing electronic devices

System for testing electronic devices

Photomask for test wafers

Semiconductor integrated circuit device

Semiconductor integrated circuit device and the process of manufact...