Hisashi NAGANO

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Adhering substance collecting device and inspection system
- Patent number 11,371,915
- Issue date Jun 28, 2022
- Hitachi, Ltd.
- Shun Kumano
- G01 - MEASURING TESTING
Information Patent Grant
Method for preparing standard sample for gas flow type analysis system
- Patent number 10,989,632
- Issue date Apr 27, 2021
- Hitachi, Ltd.
- Yasuaki Takada
- G01 - MEASURING TESTING
Information Patent Grant
Chemical for test used in hazardous substance sensing device, hazar...
- Patent number 10,955,401
- Issue date Mar 23, 2021
- Hitachi, Ltd.
- Hiroki Mizuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substance-testing apparatus, substance-testing system, and substanc...
- Patent number 10,048,172
- Issue date Aug 14, 2018
- Hitachi, Ltd.
- Masakazu Sugaya
- G01 - MEASURING TESTING
Information Patent Grant
Microparticle detection device and security gate
- Patent number 9,850,696
- Issue date Dec 26, 2017
- Hitachi, Ltd.
- Masakazu Sugaya
- E05 - LOCKS KEYS WINDOW OR DOOR FITTINGS SAFES
Information Patent Grant
Attached matter testing device and testing method
- Patent number 9,696,288
- Issue date Jul 4, 2017
- Hitachi, Ltd.
- Hideo Kashima
- G01 - MEASURING TESTING
Information Patent Grant
Particle analyzing device
- Patent number 9,423,388
- Issue date Aug 23, 2016
- Hitachi, Ltd.
- Koichi Terada
- G01 - MEASURING TESTING
Information Patent Grant
Analyzer for substance
- Patent number 9,417,163
- Issue date Aug 16, 2016
- Hitachi, Ltd.
- Hisashi Nagano
- G01 - MEASURING TESTING
Information Patent Grant
Attached matter inspection device
- Patent number 9,261,437
- Issue date Feb 16, 2016
- Hitachi, Ltd.
- Hideo Kashima
- G01 - MEASURING TESTING
Information Patent Grant
Analysis device and analysis method
- Patent number 9,214,324
- Issue date Dec 15, 2015
- Hitachi, Ltd.
- Hisashi Nagano
- G01 - MEASURING TESTING
Information Patent Grant
Analysis device and analysis method
- Patent number 9,040,905
- Issue date May 26, 2015
- Hitachi, Ltd.
- Hisashi Nagano
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometer and mass spectrometry method
- Patent number 8,835,834
- Issue date Sep 16, 2014
- Hitachi High-Technologies Corporation
- Masuyuki Sugiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dangerous substance detection system
- Patent number 8,560,249
- Issue date Oct 15, 2013
- Hitachi, Ltd.
- Hisashi Nagano
- G01 - MEASURING TESTING
Information Patent Grant
Security system, security center apparatus, and security management...
- Patent number 8,284,051
- Issue date Oct 9, 2012
- Hitachi, Ltd.
- Yasuaki Takada
- G08 - SIGNALLING
Information Patent Grant
Ion trap, mass spectrometer, and ion mobility analyzer
- Patent number 7,875,848
- Issue date Jan 25, 2011
- Hitachi, Ltd.
- Hisashi Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas monitoring apparatus
- Patent number 7,829,848
- Issue date Nov 9, 2010
- Hitachi, Ltd.
- Yasuaki Takada
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Apparatus for detecting chemical substances and method therefor
- Patent number 7,820,965
- Issue date Oct 26, 2010
- Hitachi, Ltd.
- Hisashi Nagano
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Gas monitoring apparatus and gas monitoring method
- Patent number 7,663,098
- Issue date Feb 16, 2010
- Hitachi, Ltd.
- Yasuo Seto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas monitoring apparatus
- Patent number 7,449,685
- Issue date Nov 11, 2008
- Hitachi, Ltd.
- Yasuaki Takada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for detecting chemical substances and method therefor
- Patent number 7,408,153
- Issue date Aug 5, 2008
- Hitachi, Ltd.
- Hisashi Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometric apparatus and ion source
- Patent number 7,164,124
- Issue date Jan 16, 2007
- Hitachi, Ltd.
- Yasuaki Takada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 7,078,685
- Issue date Jul 18, 2006
- Hitachi, Ltd.
- Yasuaki Takada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for detecting chemical agents
- Patent number 7,041,971
- Issue date May 9, 2006
- Hitachi, Ltd.
- Masumi Fukano
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for detecting chemical substances and method therefor
- Patent number 7,015,464
- Issue date Mar 21, 2006
- Hitachi, Ltd.
- Hisashi Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection method and detection device of special drugs
- Patent number 7,002,145
- Issue date Feb 21, 2006
- Hitachi, Ltd.
- Masaki Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Chemical agent detection apparatus and method
- Patent number 6,943,343
- Issue date Sep 13, 2005
- Hitachi, Ltd.
- Shigeru Honjo
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting dangerous substances and substan...
- Patent number 6,884,997
- Issue date Apr 26, 2005
- Hitachi, Ltd.
- Hideo Kashima
- G01 - MEASURING TESTING
Information Patent Grant
Explosive detection system
- Patent number 6,844,546
- Issue date Jan 18, 2005
- Hitachi, Ltd.
- Hisashi Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for analyzing vapors generated from explosives
- Patent number 6,770,877
- Issue date Aug 3, 2004
- Hitachi, Ltd.
- Toshihiko Ohta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical interferometer and signal synthesizer using the interferometer
- Patent number 6,587,278
- Issue date Jul 1, 2003
- Hitachi, Ltd.
- Susumu Ogawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
Adhering Substance Collecting Device and Inspection System
- Publication number 20200319061
- Publication date Oct 8, 2020
- Hitachi, Ltd
- Shun KUMANO
- G01 - MEASURING TESTING
Information Patent Application
Chemical for Test Used in Hazardous Substance Sensing Device, Hazar...
- Publication number 20190178865
- Publication date Jun 13, 2019
- Hitachi, Ltd
- Hiroki MIZUNO
- G01 - MEASURING TESTING
Information Patent Application
Method for Preparing Standard Sample for Gas Flow Type Analysis System
- Publication number 20180149563
- Publication date May 31, 2018
- Hitachi, Ltd
- Yasuaki TAKADA
- G01 - MEASURING TESTING
Information Patent Application
Substance-Testing Apparatus, Substance-Testing System, and Substanc...
- Publication number 20170102296
- Publication date Apr 13, 2017
- Hitachi, Ltd
- Masakazu SUGAYA
- G01 - MEASURING TESTING
Information Patent Application
Particle Analyzing Device
- Publication number 20150377851
- Publication date Dec 31, 2015
- Hitachi, Ltd
- Koichi TERADA
- G01 - MEASURING TESTING
Information Patent Application
ATTACHED MATTER INSPECTION DEVICE
- Publication number 20150233796
- Publication date Aug 20, 2015
- Hitachi, Ltd
- Hideo KASHIMA
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS DEVICE AND ANALYSIS METHOD
- Publication number 20150235831
- Publication date Aug 20, 2015
- Hitachi, Ltd
- Hisashi Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Microparticle Detection Device and Security Gate
- Publication number 20150136975
- Publication date May 21, 2015
- Hitachi, Ltd
- Masakazu Sugaya
- E05 - LOCKS KEYS WINDOW OR DOOR FITTINGS SAFES
Information Patent Application
ANALYZER FOR SUBSTANCE
- Publication number 20140260542
- Publication date Sep 18, 2014
- Hitachi, Ltd
- Hisashi NAGANO
- G01 - MEASURING TESTING
Information Patent Application
ATTACHED MATTER TESTING DEVICE AND TESTING METHOD
- Publication number 20140238106
- Publication date Aug 28, 2014
- Hideo Kashima
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS DEVICE AND ANALYSIS METHOD
- Publication number 20140151543
- Publication date Jun 5, 2014
- Hitachi, Ltd
- Hisashi Nagano
- G01 - MEASURING TESTING
Information Patent Application
DETECTOR AND ENTRY CONTROL SYSTEM
- Publication number 20120139736
- Publication date Jun 7, 2012
- Yasutaka Suzuki
- G01 - MEASURING TESTING
Information Patent Application
MASS SPECTROMETER AND MASS SPECTROMETRY METHOD
- Publication number 20120112059
- Publication date May 10, 2012
- Hitachi High-Technologies Corporation
- Masuyuki Sugiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DANGEROUS SUBSTANCE DETECTION SYSTEM
- Publication number 20110093214
- Publication date Apr 21, 2011
- Hitachi, Ltd.
- Hisashi NAGANO
- G01 - MEASURING TESTING
Information Patent Application
ION TRAP, MASS SPECTROMETER, AND ION MOBILITY ANALYZER
- Publication number 20090256070
- Publication date Oct 15, 2009
- Hitachi, Ltd.
- Hisashi NAGANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Security System, Security Center Apparatus, and Security Management...
- Publication number 20090184820
- Publication date Jul 23, 2009
- Hitachi, Ltd.
- Yasuaki TAKADA
- G08 - SIGNALLING
Information Patent Application
Apparatus for detecting chemical substances and method therefor
- Publication number 20090084950
- Publication date Apr 2, 2009
- Hitachi, Ltd.
- Hisashi Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Gas monitoring apparatus
- Publication number 20090039253
- Publication date Feb 12, 2009
- Hitachi, Ltd.
- Yasuaki Takada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion trap, mass spectrometer and ion mobility analyzer using the ion...
- Publication number 20090001265
- Publication date Jan 1, 2009
- Hitachi, Ltd.
- Takashi Baba
- G01 - MEASURING TESTING
Information Patent Application
Gas monitoring apparatus and gas monitoring method
- Publication number 20080054172
- Publication date Mar 6, 2008
- Yasuo Seto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Gas monitoring apparatus
- Publication number 20060289742
- Publication date Dec 28, 2006
- Yasuaki Takada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Detection method and detection device of special drugs
- Publication number 20060226358
- Publication date Oct 12, 2006
- Hitachi, Ltd.
- Masaki Ishikawa
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for detecting chemical substances and method therefor
- Publication number 20060108522
- Publication date May 25, 2006
- Hitachi, Ltd.
- Hisashi Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometric apparatus and ion source
- Publication number 20050199799
- Publication date Sep 15, 2005
- Hitachi, Ltd.
- Yasuaki Takada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR DETECTING CHEMICAL AGENTS
- Publication number 20050092915
- Publication date May 5, 2005
- Masumi Fukano
- G01 - MEASURING TESTING
Information Patent Application
Mass spectrometer
- Publication number 20050067565
- Publication date Mar 31, 2005
- Hitachi., Ltd.
- Yasuaki Takada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus for detecting chemical substances and method therefor
- Publication number 20050061964
- Publication date Mar 24, 2005
- Hitachi., Ltd.
- Hisashi Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Detection method and detection device of special drugs
- Publication number 20040195499
- Publication date Oct 7, 2004
- Masaki Ishikawa
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for detecting dangerous substance
- Publication number 20040124352
- Publication date Jul 1, 2004
- Hideo Kashima
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR ANALYZING VAPORS GENERATED FROM EXPLOSIVES
- Publication number 20040113067
- Publication date Jun 17, 2004
- Toshihiko Ohta
- H01 - BASIC ELECTRIC ELEMENTS

Hisashi NAGANO

Person

Patents Grantslast 30 patents

Adhering substance collecting device and inspection system

Method for preparing standard sample for gas flow type analysis system

Chemical for test used in hazardous substance sensing device, hazar...

Substance-testing apparatus, substance-testing system, and substanc...

Microparticle detection device and security gate

Attached matter testing device and testing method

Particle analyzing device

Analyzer for substance

Attached matter inspection device

Analysis device and analysis method

Analysis device and analysis method

Mass spectrometer and mass spectrometry method

Dangerous substance detection system

Security system, security center apparatus, and security management...

Ion trap, mass spectrometer, and ion mobility analyzer

Gas monitoring apparatus

Apparatus for detecting chemical substances and method therefor

Gas monitoring apparatus and gas monitoring method

Gas monitoring apparatus

Apparatus for detecting chemical substances and method therefor

Mass spectrometric apparatus and ion source

Mass spectrometer

Apparatus and method for detecting chemical agents

Apparatus for detecting chemical substances and method therefor

Detection method and detection device of special drugs

Chemical agent detection apparatus and method

Method and apparatus for detecting dangerous substances and substan...

Explosive detection system

Method and apparatus for analyzing vapors generated from explosives

Optical interferometer and signal synthesizer using the interferometer

Patents Applicationslast 30 patents

Adhering Substance Collecting Device and Inspection System

Chemical for Test Used in Hazardous Substance Sensing Device, Hazar...

Method for Preparing Standard Sample for Gas Flow Type Analysis System

Substance-Testing Apparatus, Substance-Testing System, and Substanc...

Particle Analyzing Device

ATTACHED MATTER INSPECTION DEVICE

ANALYSIS DEVICE AND ANALYSIS METHOD

Microparticle Detection Device and Security Gate

ANALYZER FOR SUBSTANCE

ATTACHED MATTER TESTING DEVICE AND TESTING METHOD

ANALYSIS DEVICE AND ANALYSIS METHOD

DETECTOR AND ENTRY CONTROL SYSTEM

MASS SPECTROMETER AND MASS SPECTROMETRY METHOD

DANGEROUS SUBSTANCE DETECTION SYSTEM

ION TRAP, MASS SPECTROMETER, AND ION MOBILITY ANALYZER

Security System, Security Center Apparatus, and Security Management...

Apparatus for detecting chemical substances and method therefor

Gas monitoring apparatus

Ion trap, mass spectrometer and ion mobility analyzer using the ion...

Gas monitoring apparatus and gas monitoring method

Gas monitoring apparatus

Detection method and detection device of special drugs

Apparatus for detecting chemical substances and method therefor

Mass spectrometric apparatus and ion source

APPARATUS AND METHOD FOR DETECTING CHEMICAL AGENTS

Mass spectrometer

Apparatus for detecting chemical substances and method therefor

Detection method and detection device of special drugs

Method and apparatus for detecting dangerous substance

METHOD AND APPARATUS FOR ANALYZING VAPORS GENERATED FROM EXPLOSIVES