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Hitoshi Chiyoma
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Otawara-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Apparatus and method of manufacturing radiation detection panel
Patent number
10,007,004
Issue date
Jun 26, 2018
Toshiba Electron Tubes & Devices Co., Ltd.
Hitoshi Chiyoma
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Apparatus and method of manufacturing radiation detection panel
Patent number
9,964,652
Issue date
May 8, 2018
TOSHIBA ELECTRONIC TUBES & DEVICES CO., LTD.
Hitoshi Chiyoma
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Apparatus and method of manufacturing radiation detection panel
Patent number
9,880,292
Issue date
Jan 30, 2018
Toshiba Electron Tubes & Devices Co., Ltd.
Hitoshi Chiyoma
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Radiation detector
Patent number
9,006,669
Issue date
Apr 14, 2015
Kabushiki Kaisha Toshiba
Hitoshi Chiyoma
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Radiation detector and method for producing the same
Patent number
7,982,190
Issue date
Jul 19, 2011
Toshiba Electron Tubes & Devices Co., Ltd.
Katsuhisa Homma
G01 - MEASURING TESTING
Information
Patent Grant
Radiation detector
Patent number
7,772,562
Issue date
Aug 10, 2010
Kabushiki Kaisha Toshiba
Shirofumi Yamagishi
G01 - MEASURING TESTING
Information
Patent Grant
Radiation detection apparatus
Patent number
7,755,053
Issue date
Jul 13, 2010
Kabushiki Kaisha Toshiba
Hitoshi Chiyoma
G01 - MEASURING TESTING
Information
Patent Grant
Electronic component and method of production thereof
Patent number
6,754,950
Issue date
Jun 29, 2004
Kabushiki Kaisha Toshiba
Osamu Furukawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electronic component and method of production thereof
Patent number
6,628,043
Issue date
Sep 30, 2003
Kabushiki Kaisha Toshiba
Osamu Furukawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Surface acoustic wave device with a layered conductive film and met...
Patent number
6,377,138
Issue date
Apr 23, 2002
Kabushiki Kaisha Toshiba
Toshiyuki Takagi
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Electronic component and method of production thereof
Patent number
6,262,513
Issue date
Jul 17, 2001
Kabushiki Kaisha Toshiba
Osamu Furukawa
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Image sensor with means to adjust capacitance of signal leads
Patent number
4,679,088
Issue date
Jul 7, 1987
Kabushiki Kaisha Toshiba
Hitoshi Chiyoma
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
APPARATUS AND METHOD OF MANUFACTURING RADIATION DETECTION PANEL
Publication number
20170363752
Publication date
Dec 21, 2017
KABUSHIKI KAISHA TOSHIBA
Hitoshi CHIYOMA
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
APPARATUS AND METHOD OF MANUFACTURING RADIATION DETECTION PANEL
Publication number
20170363751
Publication date
Dec 21, 2017
KABUSHIKI KAISHA TOSHIBA
Hitoshi CHIYOMA
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
APPARATUS AND METHOD OF MANUFACTURING RADIATION DETECTION PANEL
Publication number
20140295062
Publication date
Oct 2, 2014
KABUSHIKI KAISHA TOSHIBA
Hitoshi CHIYOMA
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
RADIATION DETECTOR AND METHOD FOR PRODUCING THE SAME
Publication number
20100224784
Publication date
Sep 9, 2010
TOSHIBA ELECTRON TUBES & DEVICES CO., LTD.
Katsuhisa Homma
G01 - MEASURING TESTING
Information
Patent Application
RADIATION DETECTOR
Publication number
20100224785
Publication date
Sep 9, 2010
Kabushiki Kaisha Toshiba
Hitoshi Chiyoma
G01 - MEASURING TESTING
Information
Patent Application
RADIATION DETECTOR
Publication number
20100019162
Publication date
Jan 28, 2010
Kabushiki Kaisha Toshiba
Shirofumi Yamagishi
G01 - MEASURING TESTING
Information
Patent Application
RADIATION DETECTION APPARATUS
Publication number
20090127466
Publication date
May 21, 2009
Kabushiki Kaisha Toshiba
Hitoshi Chiyoma
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR PHOTODIODE AND METHOD FOR MANUFACTURING SAME, RADIATI...
Publication number
20080237474
Publication date
Oct 2, 2008
Kabushiki Kaisha Toshiba
Junichi TONOTANI
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Electronic component and method of production thereof
Publication number
20020149298
Publication date
Oct 17, 2002
KABUSHIKI KAISHA TOSHIBA
Osamu Furukawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electronic component and method of production thereof
Publication number
20010009342
Publication date
Jul 26, 2001
KABUSHIKI KAISHA TOSHIBA
Osamu Furukawa
H01 - BASIC ELECTRIC ELEMENTS