Hitoshi Komuro

Person

Hitachinaka-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method for measuring sample and measurement device
- Patent number 8,581,187
- Issue date Nov 12, 2013
- Hitachi High-Technologies Corporation
- Mihoko Kijima
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Pattern measuring method and pattern measuring device
- Patent number 8,507,856
- Issue date Aug 13, 2013
- Hitachi High-Technologies Corporation
- Takumichi Sutani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern matching method and computer program for executing pattern...
- Patent number 8,244,042
- Issue date Aug 14, 2012
- Hitachi High-Technologies Corporation
- Akiyuki Sugiyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Recipe generation system and method
- Patent number 8,189,040
- Issue date May 29, 2012
- Hitachi High-Technologies Corporation
- Hiromi Fujita
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method, device and computer program of length measurement
- Patent number 8,019,161
- Issue date Sep 13, 2011
- Hitachi High-Technologies Corporation
- Hidetoshi Morokuma
- G01 - MEASURING TESTING
Information Patent Grant
Pattern matching method and computer program for executing pattern...
- Patent number 7,925,095
- Issue date Apr 12, 2011
- Hitachi High-Technologies Corporation
- Akiyuki Sugiyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern matching method and pattern matching program
- Patent number 7,889,909
- Issue date Feb 15, 2011
- Hitachi High-Technologies Corporation
- Hiroyuki Shindo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern measuring method and pattern measuring device
- Patent number 7,518,110
- Issue date Apr 14, 2009
- Hitachi High-Technologies Corporation
- Takumichi Sutani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Review work supporting system
- Patent number 6,978,041
- Issue date Dec 20, 2005
- Hitachi, Ltd.
- Seiji Isogai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Investigation device and investigation method
- Patent number 6,968,079
- Issue date Nov 22, 2005
- Hitachi, Ltd.
- Akira Yoshikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection method and apparatus for silicon wafer
- Patent number 6,683,683
- Issue date Jan 27, 2004
- Hitachi, Ltd.
- Koji Tomita
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method and apparatus for silicon wafer
- Patent number 6,384,909
- Issue date May 7, 2002
- Hitachi, Ltd.
- Koji Tomita
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus for silicon wafer
- Patent number 6,256,092
- Issue date Jul 3, 2001
- Hitachi, Ltd.
- Koji Tomita
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus for silicon wafer
- Patent number 6,157,444
- Issue date Dec 5, 2000
- Hitachi, Ltd.
- Koji Tomita
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PATTERN MEASURING METHOD AND PATTERN MEASURING DEVICE
- Publication number 20120211653
- Publication date Aug 23, 2012
- Takumichi Sutani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN MATCHING METHOD AND COMPUTER PROGRAM FOR EXECUTING PATTERN...
- Publication number 20110150345
- Publication date Jun 23, 2011
- Hitachi High-Technologies Corporation
- Akiyuki SUGIYAMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR MEASURING SAMPLE AND MEASUREMENT DEVICE
- Publication number 20110139982
- Publication date Jun 16, 2011
- Hitachi High-Technologies Corporation
- Mihoko Kijima
- G01 - MEASURING TESTING
Information Patent Application
PATTERN MEASURING METHOD AND PATTERN MEASURING DEVICE
- Publication number 20090200465
- Publication date Aug 13, 2009
- Takumichi Sutani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Recipe Generation System and Method
- Publication number 20090062934
- Publication date Mar 5, 2009
- Hitachi High-Technologies Corporation
- Hiromi FUJITA
- G05 - CONTROLLING REGULATING
Information Patent Application
Pattern matching method and computer program for executing pattern...
- Publication number 20080037830
- Publication date Feb 14, 2008
- Akiyuki Sugiyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Workpiece size measurement method and apparatus
- Publication number 20070221842
- Publication date Sep 27, 2007
- Hidetoshi Morokuma
- G01 - MEASURING TESTING
Information Patent Application
Pattern matching method and pattern matching program
- Publication number 20070223803
- Publication date Sep 27, 2007
- Hitachi High-Technologies Corporation
- Hiroyuki Shindo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern measuring method and pattern measuring device
- Publication number 20060193508
- Publication date Aug 31, 2006
- Takumichi Sutani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Review work supporting system
- Publication number 20020196968
- Publication date Dec 26, 2002
- Seiji Isogai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect inspection method and apparatus for silicon wafer
- Publication number 20020080344
- Publication date Jun 27, 2002
- Koji Tomita
- G01 - MEASURING TESTING
Information Patent Application
Investigation device and investigation method
- Publication number 20020001404
- Publication date Jan 3, 2002
- Akira Yoshikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect inspection method and apparatus for silicon wafer
- Publication number 20010015802
- Publication date Aug 23, 2001
- Koji Tomita
- G01 - MEASURING TESTING

Hitoshi Komuro

Person

Patents Grantslast 30 patents

Method for measuring sample and measurement device

Pattern measuring method and pattern measuring device

Pattern matching method and computer program for executing pattern...

Recipe generation system and method

Method, device and computer program of length measurement

Pattern matching method and computer program for executing pattern...

Pattern matching method and pattern matching program

Pattern measuring method and pattern measuring device

Review work supporting system

Investigation device and investigation method

Defect inspection method and apparatus for silicon wafer

Defect inspection method and apparatus for silicon wafer

Defect inspection apparatus for silicon wafer

Defect inspection apparatus for silicon wafer

Patents Applicationslast 30 patents

PATTERN MEASURING METHOD AND PATTERN MEASURING DEVICE

PATTERN MATCHING METHOD AND COMPUTER PROGRAM FOR EXECUTING PATTERN...

METHOD FOR MEASURING SAMPLE AND MEASUREMENT DEVICE

PATTERN MEASURING METHOD AND PATTERN MEASURING DEVICE

Recipe Generation System and Method

Pattern matching method and computer program for executing pattern...

Workpiece size measurement method and apparatus

Pattern matching method and pattern matching program

Pattern measuring method and pattern measuring device

Review work supporting system

Defect inspection method and apparatus for silicon wafer

Investigation device and investigation method

Defect inspection method and apparatus for silicon wafer