BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a drawing for explaining an outline of a scanning electron microscope.
FIG. 2 is a flowchart for explaining a pattern matching processing between a design data utilizing depression/protrusion information of a pattern, and an image obtained by imaging using a scanning electron microscope, according to one embodiment of the invention.
FIGS. 3A, 3B, 3C, 3D and 3E are drawings for explaining a method for adding depression/protrusion information to a pattern, according to one embodiment of the invention.
FIGS. 4A and 4B are drawings for explaining a technique for center point matching between a pattern prepared from a design data, and a depression, or a protrusion of an image pattern obtained by imaging using a scanning electron microscope, according to one embodiment of the invention.
FIG. 5 is a drawing for explaining a pattern shape comparison for verifying a pattern matching result, according to one embodiment of the invention.
FIGS. 6A, 6B, 6C and 6D are drawings for explaining a pattern matching method utilizing depression/protrusion determination in a striking pattern and a hole pattern, according to one embodiment of the invention.
FIG. 7 is a drawing for explaining an embodiment to cut out a part of a design data of a complicated shape, as a matching pattern.
FIG. 8 is a drawing for explaining an embodiment to display together a design data with low magnification, and a design data with high magnification.