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Hitoshi Maeda
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Mask blank, phase shift mask, and method of manufacturing semicondu...
Patent number
11,720,014
Issue date
Aug 8, 2023
Hoya Corporation
Hitoshi Maeda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of manufacturing semiconductor device
Patent number
11,705,361
Issue date
Jul 18, 2023
Renesas Electronics Corporation
Hitoshi Maeda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mask blank, phase-shift mask, and method of manufacturing semicondu...
Patent number
11,442,357
Issue date
Sep 13, 2022
Hoya Corporation
Hitoshi Maeda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mask blank, phase shift mask, and method for manufacturing semicond...
Patent number
11,415,875
Issue date
Aug 16, 2022
Hoya Corporation
Hitoshi Maeda
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Mask blank, phase shift mask, and method of manufacturing semicondu...
Patent number
11,333,966
Issue date
May 17, 2022
Hoya Corporation
Osamu Nozawa
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Mask blank, phase shift mask, and method of manufacturing semicondu...
Patent number
11,022,875
Issue date
Jun 1, 2021
Hoya Corporation
Kazutake Taniguchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mask blank, phase shift mask, and method for manufacturing semicond...
Patent number
11,009,787
Issue date
May 18, 2021
Hoya Corporation
Hitoshi Maeda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scanning probe microscope
Patent number
6,745,618
Issue date
Jun 8, 2004
Renesas Technology Corp.
Yukari Imai
G01 - MEASURING TESTING
Information
Patent Grant
Scanning probe microscope
Patent number
6,545,470
Issue date
Apr 8, 2003
Mitsubishi Denki Kabushiki Kaisha
Yukari Imai
G01 - MEASURING TESTING
Information
Patent Grant
Method for evaluating a semiconductor device
Patent number
6,027,949
Issue date
Feb 22, 2000
Mitsubishi Denki Kabushiki Kaisha
Hitoshi Maeda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and a process of manufacturing the same
Patent number
5,780,870
Issue date
Jul 14, 1998
Mitsubishi Denki Kabushiki Kaisha
Hitoshi Maeda
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20240234528
Publication date
Jul 11, 2024
RENESAS ELECTRONICS CORPORATION
Hitoshi MAEDA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASK BLANK, PHASE SHIFT MASK, AND METHOD FOR PRODUCING SEMICONDUCTO...
Publication number
20240184194
Publication date
Jun 6, 2024
HOYA CORPORATION
Hitoshi MAEDA
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20240136419
Publication date
Apr 25, 2024
RENESAS ELECTRONICS CORPORATION
Hitoshi MAEDA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASK BLANK, PHASE SHIFT MASK, AND METHOD FOR PRODUCING SEMICONDUCTO...
Publication number
20230393457
Publication date
Dec 7, 2023
HOYA CORPORATION
Osamu NOZAWA
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
MASK BLANK, PHASE SHIFT MASK, AND METHOD OF MANUFACTURING SEMICONDU...
Publication number
20230314929
Publication date
Oct 5, 2023
HOYA CORPORATION
Hitoshi MAEDA
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
MASK BLANK, TRANSFER MASK, AND METHOD OF MANUFACTURING SEMICONDUCTO...
Publication number
20230142180
Publication date
May 11, 2023
HOYA CORPORATION
Hitoshi MAEDA
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
MASK BLANK AND METHOD OF MANUFACTURING PHOTOMASK
Publication number
20230069092
Publication date
Mar 2, 2023
HOYA CORPORATION
Hitoshi MAEDA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASK BLANK, PHASE SHIFT MASK, AND METHOD OF MANUFACTURING SEMICONDU...
Publication number
20220342294
Publication date
Oct 27, 2022
HOYA CORPORATION
Hiroaki SHISHIDO
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
MASK BLANK, PHASE SHIFT MASK AND METHOD FOR PRODUCING SEMICONDUCTOR...
Publication number
20220252972
Publication date
Aug 11, 2022
HOYA CORPORATION
Hitoshi MAEDA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASK BLANK, PHASE SHIFT MASK, METHOD OF MANUFACTURING PHASE SHIFT M...
Publication number
20220128898
Publication date
Apr 28, 2022
HOYA CORPORATION
Hitoshi MAEDA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASK BLANK, PHASE SHIFT MASK, AND METHOD FOR MANUFACTURING SEMICOND...
Publication number
20220121104
Publication date
Apr 21, 2022
HOYA CORPORATION
Hitoshi MAEDA
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
Publication number
20220068706
Publication date
Mar 3, 2022
RENESAS ELECTRONICS CORPORATION
Hitoshi MAEDA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASK BLANK, TRANSFER MASK, AND SEMICONDUCTOR-DEVICE MANUFACTURING M...
Publication number
20220043335
Publication date
Feb 10, 2022
HOYA CORPORATION
Ryo OHKUBO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASK BLANK, TRANSFER MASK, AND SEMICONDUCTOR-DEVICE MANUFACTURING M...
Publication number
20220035235
Publication date
Feb 3, 2022
HOYA CORPORATION
Ryo OHKUBO
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
MASK BLANK, PHASE SHIFT MASK, AND METHOD OF MANUFACTURING SEMICONDU...
Publication number
20210364909
Publication date
Nov 25, 2021
HOYA CORPORATION
Osamu NOZAWA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASK BLANK, PHASE SHIFT MASK, AND METHOD FOR MANUFACTURING SEMICOND...
Publication number
20210255538
Publication date
Aug 19, 2021
HOYA CORPORATION
Hitoshi MAEDA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASK BLANK, PHASE-SHIFT MASK, AND SEMICONDUCTOR DEVICE MANUFACTURIN...
Publication number
20210208497
Publication date
Jul 8, 2021
HOYA CORPORATION
Hitoshi MAEDA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASK BLANK, PHASE-SHIFT MASK, AND SEMICONDUCTOR DEVICE MANUFACTURIN...
Publication number
20210132488
Publication date
May 6, 2021
HOYA CORPORATION
Hiroaki SHISHIDO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASK BLANK, PHASE SHIFT MASK, AND METHOD FOR MANUFACTURING SEMICOND...
Publication number
20210088895
Publication date
Mar 25, 2021
HOYA CORPORATION
Hitoshi MAEDA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASK BLANK, PHASE SHIFT MASK, AND METHOD FOR MANUFACTURING SEMICOND...
Publication number
20210026235
Publication date
Jan 28, 2021
HOYA CORPORATION
Hitoshi MAEDA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASK BLANK, PHASE SHIFT MASK, AND METHOD FOR MANUFACTURING SEMICOND...
Publication number
20200409252
Publication date
Dec 31, 2020
HOYA CORPORATION
Kazutake TANIGUCHI
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
MASK BLANK, TRANSFER MASK, AND METHOD FOR MANUFACTURING SEMICONDUCT...
Publication number
20200285144
Publication date
Sep 10, 2020
HOYA CORPORATION
Hitoshi MAEDA
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Cantilever having improved resolution and manufacturing method therof
Publication number
20040150413
Publication date
Aug 5, 2004
Renesas Technology Corp.
Hitoshi Maeda
G01 - MEASURING TESTING
Information
Patent Application
Scanning probe microscope
Publication number
20030115939
Publication date
Jun 26, 2003
Mitsubishi Denki Kabushiki Kaisha
Yukari Imai
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor device inspecting method using conducting AFM
Publication number
20030057988
Publication date
Mar 27, 2003
Mitsubishi Denki Kabushiki Kaisha
Hitoshi Maeda
G01 - MEASURING TESTING
Information
Patent Application
Electronic device having multilayer interconnection structure
Publication number
20030047810
Publication date
Mar 13, 2003
Mitsubishi Denki Kabushiki Kaisha
Hitoshi Maeda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Scanning probe microscope
Publication number
20030025498
Publication date
Feb 6, 2003
Mitsubishi Denki Kabushiki Kaisha
Yukari Imai
B82 - NANO-TECHNOLOGY