Hitoshi Miwa

Person

Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for duty cycle measurement, analysis, and compe...
- Patent number 10,775,431
- Issue date Sep 15, 2020
- SanDisk Technologies LLC
- Hitoshi Miwa
- G01 - MEASURING TESTING
Information Patent Grant
Input/output interface circuits and methods for memory devices
- Patent number 9,646,708
- Issue date May 9, 2017
- SanDisk Technologies LLC
- Hitoshi Miwa
- G11 - INFORMATION STORAGE
Information Patent Grant
Search for impedance calibration
- Patent number 9,531,382
- Issue date Dec 27, 2016
- SanDisk Technologies LLC
- Hitoshi Miwa
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Reducing weak-erase type read disturb in 3D non-volatile memory
- Patent number 9,171,632
- Issue date Oct 27, 2015
- SanDisk Technologies Inc.
- Yingda Dong
- G11 - INFORMATION STORAGE
Information Patent Grant
Programming time improvement for non-volatile memory
- Patent number 8,988,945
- Issue date Mar 24, 2015
- SanDisk Technologies Inc.
- Hitoshi Miwa
- G11 - INFORMATION STORAGE
Information Patent Grant
Programming time improvement for non-volatile memory
- Patent number 8,854,890
- Issue date Oct 7, 2014
- SanDisk Technologies Inc.
- Hitoshi Miwa
- G11 - INFORMATION STORAGE
Information Patent Grant
Reducing weak-erase type read disturb in 3D non-volatile memory
- Patent number 8,830,755
- Issue date Sep 9, 2014
- SanDisk Technologies Inc.
- Yingda Dong
- G11 - INFORMATION STORAGE
Information Patent Grant
Reducing weak-erase type read disturb in 3D non-volatile memory
- Patent number 8,670,285
- Issue date Mar 11, 2014
- SanDisk Technologies Inc.
- Yingda Dong
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Systems and Methods for Duty Cycle Measurement, Analysis, and Compe...
- Publication number 20190004111
- Publication date Jan 3, 2019
- SanDisk Technologies LLC
- Hitoshi Miwa
- G01 - MEASURING TESTING
Information Patent Application
INPUT/OUTPUT INTERFACE CIRCUITS AND METHODS FOR MEMORY DEVICES
- Publication number 20160329106
- Publication date Nov 10, 2016
- SANDISK TECHNOLOGIES INC.
- Hitoshi Miwa
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUS FOR CALIBRATING OFF-CHIP DRIVER/ON-DIE TERMINATION CIRCUITS
- Publication number 20160254812
- Publication date Sep 1, 2016
- SANDISK TECHNOLOGIES INC.
- Hitoshi Miwa
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
PROGRAMMING TIME IMPROVEMENT FOR NON-VOLATILE MEMORY
- Publication number 20150103592
- Publication date Apr 16, 2015
- SANDISK TECHNOLOGIES INC.
- Hitoshi Miwa
- G11 - INFORMATION STORAGE
Information Patent Application
REDUCING WEAK-ERASE TYPE READ DISTURB IN 3D NON-VOLATILE MEMORY
- Publication number 20140247659
- Publication date Sep 4, 2014
- SANDISK TECHNOLOGIES INC.
- Yingda Dong
- G11 - INFORMATION STORAGE
Information Patent Application
Reducing Weak-Erase Type Read Disturb In 3D Non-Volatile Memory
- Publication number 20140056065
- Publication date Feb 27, 2014
- SANDISK TECHNOLOGIES INC.
- Yingda Dong
- G11 - INFORMATION STORAGE
Information Patent Application
Reducing Weak-Erase Type Read Disturb In 3D Non-Volatile Memory
- Publication number 20130201760
- Publication date Aug 8, 2013
- Yingda Dong
- G11 - INFORMATION STORAGE

Hitoshi Miwa

Person

Patents Grantslast 30 patents

Systems and methods for duty cycle measurement, analysis, and compe...

Input/output interface circuits and methods for memory devices

Search for impedance calibration

Reducing weak-erase type read disturb in 3D non-volatile memory

Programming time improvement for non-volatile memory

Programming time improvement for non-volatile memory

Reducing weak-erase type read disturb in 3D non-volatile memory

Reducing weak-erase type read disturb in 3D non-volatile memory

Patents Applicationslast 30 patents

Systems and Methods for Duty Cycle Measurement, Analysis, and Compe...

INPUT/OUTPUT INTERFACE CIRCUITS AND METHODS FOR MEMORY DEVICES

APPARATUS FOR CALIBRATING OFF-CHIP DRIVER/ON-DIE TERMINATION CIRCUITS

PROGRAMMING TIME IMPROVEMENT FOR NON-VOLATILE MEMORY

REDUCING WEAK-ERASE TYPE READ DISTURB IN 3D NON-VOLATILE MEMORY

Reducing Weak-Erase Type Read Disturb In 3D Non-Volatile Memory

Reducing Weak-Erase Type Read Disturb In 3D Non-Volatile Memory