Hon Lee Kon

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Georgetown, MY

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Patents Grantslast 30 patents

Information Patent Grant
Temperature and voltage controlled integrated circuit processes
- Patent number 7,345,495
- Issue date Mar 18, 2008
- Intel Corporation
- Daniel J. Dangelo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Actively controlled embedded burn-in board thermal heaters
- Publication number 20080302783
- Publication date Dec 11, 2008
- Anthony Yeh Chiing Wong
- G01 - MEASURING TESTING
Information Patent Application
Monitoring multiple electronic devices under test
- Publication number 20060290366
- Publication date Dec 28, 2006
- Intel Corporation
- Hon Lee Kon
- G01 - MEASURING TESTING
Information Patent Application
Temperature and voltage controlled integrated circuit processes
- Publication number 20060002161
- Publication date Jan 5, 2006
- Daniel J. Dangelo
- G01 - MEASURING TESTING