Horst Baumeister

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Muenchen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Detection of environmental conditions in a semiconductor chip
- Patent number 9,793,220
- Issue date Oct 17, 2017
- INTEL DEUTSCHLAND GMBH
- Hans-Joachim Barth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for detecting a crack in a semiconductor wafer...
- Patent number 7,973,547
- Issue date Jul 5, 2011
- Infineon Technologies AG
- Alois Nitsch
- G01 - MEASURING TESTING
Information Patent Grant
Method for the in-situ fabrication of DFB lasers
- Patent number 6,794,209
- Issue date Sep 21, 2004
- Infineon Technologies AG
- Horst Baumeister
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Masking method for producing semiconductor components, particularly...
- Patent number 6,699,778
- Issue date Mar 2, 2004
- Infineon Technologies AG
- Bernd Borchert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
In-situ mask technique for producing III-V semiconductor components
- Patent number 6,599,843
- Issue date Jul 29, 2003
- Infineon Technologies AG
- Horst Baumeister
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT PACKAGE REDISTRIBUTION LAYERS WITH METAL-INSULAT...
- Publication number 20220310777
- Publication date Sep 29, 2022
- Intel Corporation
- David O'Sullivan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTION OF ENVIRONMENTAL CONDITIONS IN A SEMICONDUCTOR CHIP
- Publication number 20130240884
- Publication date Sep 19, 2013
- Intel Mobile Communications GmbH
- Hans-Joachim Barth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Apparatus for Detecting a Crack in a Semiconductor Wafer...
- Publication number 20100039128
- Publication date Feb 18, 2010
- Alois Nitsch
- G01 - MEASURING TESTING
Information Patent Application
Method for the in-situ fabrication of DFB lasers
- Publication number 20030003615
- Publication date Jan 2, 2003
- Horst Baumeister
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
In-situ mask technique for producing III-V semiconductor components
- Publication number 20020182873
- Publication date Dec 5, 2002
- Horst Baumeister
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Masking method for producing semiconductor components, particularly...
- Publication number 20020182879
- Publication date Dec 5, 2002
- Bernd Borchert
- H01 - BASIC ELECTRIC ELEMENTS