HSIEH-SHEN HSIEH

Person

Changhua County, TW

People

Patents Grantslast 30 patents

Information Patent Grant
High-implant channel semiconductor device and method for manufactur...
- Patent number 12,191,811
- Issue date Jan 7, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chia-Chung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test circuit and method
- Patent number 12,007,436
- Issue date Jun 11, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Hsieh-Hung Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Power amplifiers testing system and related testing method
- Patent number 11,906,598
- Issue date Feb 20, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Hsieh-Hung Hsieh
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
High-implant channel semiconductor device and method for manufactur...
- Patent number 11,791,773
- Issue date Oct 17, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chia-Chung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test circuit and method
- Patent number 11,768,235
- Issue date Sep 26, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Hsieh-Hung Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Inductor with an electrode structure
- Patent number 11,769,621
- Issue date Sep 26, 2023
- Cyntec Co., Ltd.
- Chi-Hsun Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of using varainductor having ground and floating planes
- Patent number 11,711,056
- Issue date Jul 25, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yi-Hsuan Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic component structure with thermal conductive filler and met...
- Patent number 11,710,595
- Issue date Jul 25, 2023
- Cyntec Co., Ltd.
- Yi-Ting Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Buried channel semiconductor device and method for manufacturing th...
- Patent number 11,646,312
- Issue date May 9, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chia-Chung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test circuit and method
- Patent number 11,555,848
- Issue date Jan 17, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Hsieh-Hung Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Power amplifiers testing system and related testing method
- Patent number 11,493,563
- Issue date Nov 8, 2022
- Taiwan Semiconductor Manufacturing Company Ltd.
- Hsieh-Hung Hsieh
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Varainductor having ground and floating planes and method of using
- Patent number 11,362,624
- Issue date Jun 14, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yi-Hsuan Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ingress-protective mechanism of wire-wound magnetic component
- Patent number 11,250,982
- Issue date Feb 15, 2022
- Cyntec Co., Ltd.
- Yi-Ting Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Buried channel semiconductor device and method for manufacturing th...
- Patent number 11,094,694
- Issue date Aug 17, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chia-Chung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test circuit and method
- Patent number 11,079,428
- Issue date Aug 3, 2021
- Taiwan Semiconductor Manufacturing Company Ltd.
- Hsieh-Hung Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
High-implant channel semiconductor device and method for manufactur...
- Patent number 11,063,559
- Issue date Jul 13, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chia-Chung Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Transmitter power detection method
- Patent number 10,879,862
- Issue date Dec 29, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd
- Hong-Lin Chu
- G01 - MEASURING TESTING
Information Patent Grant
Varainductor having ground and floating planes
- Patent number 10,756,672
- Issue date Aug 25, 2020
- TAIWAN SEMINCONDUCTOR MANUFACTURING COMPANY, LTD.
- Yi-Hsuan Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing magnetic core elements
- Patent number 10,679,788
- Issue date Jun 9, 2020
- Cyntec Co., Ltd.
- Hsieh-Shen Hsieh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inductor with an electrode structure
- Patent number 10,553,349
- Issue date Feb 4, 2020
- Cyntec Co., Ltd.
- Chi-Hsun Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmitter circuit with power detection
- Patent number 10,554,190
- Issue date Feb 4, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd
- Hong-Lin Chu
- G01 - MEASURING TESTING
Information Patent Grant
Buried channel semiconductor device and method for manufacturing th...
- Patent number 10,529,711
- Issue date Jan 7, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chia-Chung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for producing a wireless charging coil
- Patent number 10,447,062
- Issue date Oct 15, 2019
- Cyntec Co., Ltd.
- Kuan-Yu Chiu
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Transformer
- Patent number 10,340,074
- Issue date Jul 2, 2019
- Cyntec Co., Ltd.
- Kuan-Yu Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual-mode RF transmission frontend
- Patent number 10,256,783
- Issue date Apr 9, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Hong-Lin Chu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Electrode structure and the corresponding electrical component usin...
- Patent number 10,224,138
- Issue date Mar 5, 2019
- Cyntec Co., Ltd.
- Chi-Hsun Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Planar reactor
- Patent number 10,134,522
- Issue date Nov 20, 2018
- Cyntec Co., Ltd.
- Wei Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing magnetic core elements
- Patent number 10,121,585
- Issue date Nov 6, 2018
- Cyntec Co., Ltd.
- Hsieh-Shen Hsieh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmitter power detection circuit and method
- Patent number 10,079,583
- Issue date Sep 18, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd
- Hong-Lin Chu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for RFID tag testing
- Patent number 10,031,161
- Issue date Jul 24, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tsung-Hsiung Li
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MAGNETIC COMPONENT
- Publication number 20250029765
- Publication date Jan 23, 2025
- CYNTEC CO., LTD.
- Hsin-Jung Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RFIC WITH SUBSTRATE PARTITION
- Publication number 20240388266
- Publication date Nov 21, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wei Ling Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Millimeter-Wave Passive Circuit Designs with Wafer-Level Chip-Scale...
- Publication number 20240363461
- Publication date Oct 31, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsieh-Hung Hsieh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE
- Publication number 20240355728
- Publication date Oct 24, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kai-Chun Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC COMPONENT
- Publication number 20240321498
- Publication date Sep 26, 2024
- CYNTEC CO., LTD.
- Yung-Shou Hsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC COMPONENT
- Publication number 20240321500
- Publication date Sep 26, 2024
- CYNTEC CO., LTD.
- Yung-Shou Hsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AMPLIFIER SYSTEM
- Publication number 20240283416
- Publication date Aug 22, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kunal Mahaseth
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
POWER AMPLIFIERS TESTING SYSTEM AND RELATED TESTING METHOD
- Publication number 20240142544
- Publication date May 2, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- HSIEH-HUNG HSIEH
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MAGNETIC COMPONENT
- Publication number 20240029936
- Publication date Jan 25, 2024
- CYNTEC CO., LTD.
- Hsin-Jung Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM, METHOD, CIRCUIT, AND DEVICE FOR MILLIMETER-WAVE MULTI-STAGE...
- Publication number 20230402975
- Publication date Dec 14, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wei Ling Chang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
HIGH-IMPLANT CHANNEL SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTUR...
- Publication number 20230387856
- Publication date Nov 30, 2023
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY
- Chia-Chung CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST CIRCUIT AND METHOD
- Publication number 20230375614
- Publication date Nov 23, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsieh-Hung HSIEH
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC COMPONENT STRUCTURE WITH THERMAL CONDUCTIVE FILLER AND MET...
- Publication number 20230335327
- Publication date Oct 19, 2023
- CYNTEC CO., LTD.
- Yi-Ting Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST CIRCUIT AND METHOD
- Publication number 20230160954
- Publication date May 25, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsieh-Hung HSIEH
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC COMPONENT STRUCTURE WITH THERMAL CONDUCTIVE FILLER
- Publication number 20230014778
- Publication date Jan 19, 2023
- CYNTEC CO., LTD.
- Chun-Tiao Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POWER AMPLIFIERS TESTING SYSTEM AND RELATED TESTING METHOD
- Publication number 20220381808
- Publication date Dec 1, 2022
- Taiwan Semiconductor Manufacturing company Ltd.
- HSIEH-HUNG HSIEH
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC COMPONENT
- Publication number 20220301756
- Publication date Sep 22, 2022
- CYNTEC CO., LTD.
- Shao-Wei Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF USING VARAINDUCTOR HAVING GROUND AND FLOATING PLANES
- Publication number 20220286087
- Publication date Sep 8, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yi-Hsuan LIU
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
BURIED CHANNEL SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING TH...
- Publication number 20210375862
- Publication date Dec 2, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Chung CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST CIRCUIT AND METHOD
- Publication number 20210341535
- Publication date Nov 4, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsieh-Hung HSIEH
- G01 - MEASURING TESTING
Information Patent Application
HIGH-IMPLANT CHANNEL SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTUR...
- Publication number 20210344303
- Publication date Nov 4, 2021
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY
- Chia-Chung CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST CIRCUIT AND METHOD
- Publication number 20210181251
- Publication date Jun 17, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Hsieh-Hung HSIEH
- G01 - MEASURING TESTING
Information Patent Application
POWER AMPLIFIERS TESTING SYSTEM AND RELATED TESTING METHOD
- Publication number 20210132158
- Publication date May 6, 2021
- Taiwan Semiconductor Manufacturing company Ltd.
- HSIEH-HUNG HSIEH
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
VARAINDUCTOR HAVING GROUND AND FLOATING PLANES AND METHOD OF USING
- Publication number 20200358398
- Publication date Nov 12, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yi-Hsuan LIU
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MAGNETIC COMPONENT STRUCTURE WITH THERMAL CONDUCTIVE FILLER AND MET...
- Publication number 20200286667
- Publication date Sep 10, 2020
- CYNTEC CO., LTD.
- Yi-Ting Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSMITTER POWER DETECTION METHOD
- Publication number 20200169236
- Publication date May 28, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hong-Lin CHU
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
BURIED CHANNEL SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING TH...
- Publication number 20200135730
- Publication date Apr 30, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chia-Chung CHEN
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
INDUCTOR WITH AN ELECTRODE STRUCTURE
- Publication number 20200135386
- Publication date Apr 30, 2020
- CYNTEC CO., LTD.
- CHI-HSUN LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INGRESS-PROTECTIVE MECHANISM OF WIRE-WOUND MAGNETIC COMPONENT
- Publication number 20200005982
- Publication date Jan 2, 2020
- CYNTEC CO., LTD.
- YI-TING LAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING MAGNETIC CORE ELEMENTS
- Publication number 20190051453
- Publication date Feb 14, 2019
- CYNTEC CO., LTD.
- Hsieh-Shen Hsieh
- H01 - BASIC ELECTRIC ELEMENTS

HSIEH-SHEN HSIEH

Person

Patents Grantslast 30 patents

High-implant channel semiconductor device and method for manufactur...

Test circuit and method

Power amplifiers testing system and related testing method

High-implant channel semiconductor device and method for manufactur...

Test circuit and method

Inductor with an electrode structure

Method of using varainductor having ground and floating planes

Magnetic component structure with thermal conductive filler and met...

Buried channel semiconductor device and method for manufacturing th...

Test circuit and method

Power amplifiers testing system and related testing method

Varainductor having ground and floating planes and method of using

Ingress-protective mechanism of wire-wound magnetic component

Buried channel semiconductor device and method for manufacturing th...

Test circuit and method

High-implant channel semiconductor device and method for manufactur...

Transmitter power detection method

Varainductor having ground and floating planes

Method of manufacturing magnetic core elements

Inductor with an electrode structure

Transmitter circuit with power detection

Buried channel semiconductor device and method for manufacturing th...

Method for producing a wireless charging coil

Transformer

Dual-mode RF transmission frontend

Electrode structure and the corresponding electrical component usin...

Planar reactor

Method of manufacturing magnetic core elements

Transmitter power detection circuit and method

Method and apparatus for RFID tag testing

Patents Applicationslast 30 patents

MAGNETIC COMPONENT

RFIC WITH SUBSTRATE PARTITION

Millimeter-Wave Passive Circuit Designs with Wafer-Level Chip-Scale...

SEMICONDUCTOR STRUCTURE

MAGNETIC COMPONENT

MAGNETIC COMPONENT

AMPLIFIER SYSTEM

POWER AMPLIFIERS TESTING SYSTEM AND RELATED TESTING METHOD

MAGNETIC COMPONENT

SYSTEM, METHOD, CIRCUIT, AND DEVICE FOR MILLIMETER-WAVE MULTI-STAGE...

HIGH-IMPLANT CHANNEL SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTUR...

TEST CIRCUIT AND METHOD

MAGNETIC COMPONENT STRUCTURE WITH THERMAL CONDUCTIVE FILLER AND MET...

TEST CIRCUIT AND METHOD

MAGNETIC COMPONENT STRUCTURE WITH THERMAL CONDUCTIVE FILLER

POWER AMPLIFIERS TESTING SYSTEM AND RELATED TESTING METHOD

MAGNETIC COMPONENT

METHOD OF USING VARAINDUCTOR HAVING GROUND AND FLOATING PLANES

BURIED CHANNEL SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING TH...

TEST CIRCUIT AND METHOD

HIGH-IMPLANT CHANNEL SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTUR...

TEST CIRCUIT AND METHOD

POWER AMPLIFIERS TESTING SYSTEM AND RELATED TESTING METHOD

VARAINDUCTOR HAVING GROUND AND FLOATING PLANES AND METHOD OF USING

MAGNETIC COMPONENT STRUCTURE WITH THERMAL CONDUCTIVE FILLER AND MET...

TRANSMITTER POWER DETECTION METHOD

BURIED CHANNEL SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING TH...

INDUCTOR WITH AN ELECTRODE STRUCTURE

INGRESS-PROTECTIVE MECHANISM OF WIRE-WOUND MAGNETIC COMPONENT

METHOD OF MANUFACTURING MAGNETIC CORE ELEMENTS