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Hugh W. Littlebury
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Chandler, AZ, US
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Patents Grants
last 30 patents
Information
Patent Grant
Integral semiconductor wafer map recording
Patent number
5,256,578
Issue date
Oct 26, 1993
Motorola, Inc.
Dean Corley
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Continuously self configuring distributed control system
Patent number
5,233,510
Issue date
Aug 3, 1993
Motorola, Inc.
Roger D. Brueckner
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Low resistance probe for semiconductor
Patent number
5,177,438
Issue date
Jan 5, 1993
Motorola, Inc.
Hugh W. Littlebury
G01 - MEASURING TESTING
Information
Patent Grant
Forming isolation resistors with resistive elastomers
Patent number
5,142,449
Issue date
Aug 25, 1992
Motorola, Inc.
Hugh W. Littlebury
G01 - MEASURING TESTING
Information
Patent Grant
Method for parallel testing of semiconductor devices
Patent number
5,012,187
Issue date
Apr 30, 1991
Motorola, Inc.
Hugh W. Littlebury
G01 - MEASURING TESTING
Information
Patent Grant
Means and method for testing integrated circuits attached to a lead...
Patent number
5,008,615
Issue date
Apr 16, 1991
Motorola, Inc.
Hugh W. Littlebury
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for testing high pin count integrated circuits
Patent number
4,989,209
Issue date
Jan 29, 1991
Motorola, Inc.
Hugh W. Littlebury
G01 - MEASURING TESTING
Information
Patent Grant
Method for assembling, testing, and packaging integrated circuits
Patent number
4,985,988
Issue date
Jan 22, 1991
Motorola, Inc.
Hugh W. Littlebury
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for high speed integrated circuit testing
Patent number
4,972,413
Issue date
Nov 20, 1990
Motorola, Inc.
Hugh W. Littlebury
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for burning in integrated circuit wafers
Patent number
4,968,931
Issue date
Nov 6, 1990
Motorola, Inc.
Hugh W. Littlebury
G01 - MEASURING TESTING
Information
Patent Grant
Method of recording test results of die on a wafer
Patent number
4,928,002
Issue date
May 22, 1990
Motorola Inc.
Dean Corley
G01 - MEASURING TESTING
Information
Patent Grant
Automated circuit tester
Patent number
4,604,744
Issue date
Aug 5, 1986
Motorola Inc.
Hugh Littlebury
G01 - MEASURING TESTING