Number | Name | Date | Kind |
---|---|---|---|
3596228 | Reed, Jr. | Jul 1971 | |
3970934 | Aksu | Jul 1976 | |
3984620 | Robillard et al. | Oct 1976 | |
4204317 | Winn | May 1980 | |
4466183 | Burns | Aug 1984 | |
4567545 | Nettler, Jr. | Jan 1986 | |
4689556 | Cedrone | Aug 1987 | |
4701781 | Sankhagowit | Oct 1987 | |
4763409 | Takekawa et al. | Aug 1988 | |
4764723 | Strid | Aug 1988 | |
4791473 | Phy | Dec 1988 | |
4796080 | Phy | Jan 1989 | |
4806409 | Walter et al. | Feb 1989 | |
4820976 | Brown | Apr 1989 |
Entry |
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Barsotti et al., "Very High Density Probing", IEEE 1988, International Test Conference; pp. 608-614; 10-4-1988. |
Leslie et al., "Membrane Probe Card Technology", IEEE 1988 International Test Conference; pp. 601-607, 12/1988. |
Brochure: "Automatic Test Equipment for IC and VLSI Devices"; ANDO Electric, 12/1988. |