Huntington W. Curtis

Person

Chelsea, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for testing and fault isolation of high density p...
- Patent number 5,621,327
- Issue date Apr 15, 1997
- International Business Machines Corporation
- Shinwu Chiang
- G01 - MEASURING TESTING
Information Patent Grant
Model generation system having closed-loop extrusion nozzle positio...
- Patent number 5,402,351
- Issue date Mar 28, 1995
- International Business Machines Corporation
- John S. Batchelder
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
System and method for testing and fault isolation of high density p...
- Patent number 5,402,072
- Issue date Mar 28, 1995
- International Business Machines Corporation
- Shinwu Chiang
- G01 - MEASURING TESTING
Information Patent Grant
Model generation system having closed-loop extrusion nozzle positio...
- Patent number 5,303,141
- Issue date Apr 12, 1994
- International Business Machines Corporation
- John S. Batchelder
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Contactless technique for semicondutor wafer testing
- Patent number 4,812,756
- Issue date Mar 14, 1989
- International Business Machines Corporation
- Huntington W. Curtis
- G01 - MEASURING TESTING
Information Patent Grant
Chemical analysis system including a test package and rotor combina...
- Patent number 4,390,499
- Issue date Jun 28, 1983
- International Business Machines Corporation
- Huntington W. Curtis
- G01 - MEASURING TESTING
Information Patent Grant
Multiplication mode bistable field effect transistor and memory uti...
- Patent number 3,974,486
- Issue date Aug 10, 1976
- International Business Machines Corporation
- Huntington W. Curtis
- G11 - INFORMATION STORAGE

Huntington W. Curtis

Person

Patents Grantslast 30 patents

System and method for testing and fault isolation of high density p...

Model generation system having closed-loop extrusion nozzle positio...

System and method for testing and fault isolation of high density p...

Model generation system having closed-loop extrusion nozzle positio...

Contactless technique for semicondutor wafer testing

Chemical analysis system including a test package and rotor combina...

Multiplication mode bistable field effect transistor and memory uti...