Hyeck-Jin Jeong

Person

Cheonan-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor package transferring apparatus and method of manufact...
- Patent number 8,937,483
- Issue date Jan 20, 2015
- Samsung Electronics Co., Ltd.
- Hyeck-Jin Jeong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for testing semiconductor chip
- Patent number 7,420,382
- Issue date Sep 2, 2008
- Samsung Electronics Co., Ltd.
- Jun-Young Ko
- G01 - MEASURING TESTING
Information Patent Grant
POGO pin and test socket including the same
- Patent number 7,245,138
- Issue date Jul 17, 2007
- Samsung Electronics Co., Ltd.
- Hyeck-Jin Jeong
- G01 - MEASURING TESTING
Information Patent Grant
Insert having independently movable latch mechanism for semiconduct...
- Patent number 7,235,991
- Issue date Jun 26, 2007
- Samsung Electronics Co., Ltd.
- Jin-Woog Kim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR PACKAGE TRANSFERRING APPARATUS AND METHOD OF MANUFACT...
- Publication number 20120043253
- Publication date Feb 23, 2012
- Hyeck-Jin Jeong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method of manufacturing the same
- Publication number 20090174078
- Publication date Jul 9, 2009
- SAMSUNG ELECTRONICS CO., LTD.
- Hyeck-Jin Jeong
- G01 - MEASURING TESTING
Information Patent Application
Insert with support for semiconductor package
- Publication number 20070182432
- Publication date Aug 9, 2007
- SAMSUNG ELECTRONICS CO., LTD.
- Hyeck-Jin Jeong
- G01 - MEASURING TESTING
Information Patent Application
Self-cleaning socket pin
- Publication number 20070141877
- Publication date Jun 21, 2007
- Samsung Electronics Co. Ltd.
- Se-Un Lee
- G01 - MEASURING TESTING
Information Patent Application
Insert having independently movable latch mechanism for semiconduct...
- Publication number 20070075702
- Publication date Apr 5, 2007
- SAMSUNG ELECTRONICS CO., LTD.
- Jin-Woog Kim
- G01 - MEASURING TESTING
Information Patent Application
Apparatus, customer tray, and method for testing semiconductor pack...
- Publication number 20070013404
- Publication date Jan 18, 2007
- SAMSUNG ELECTRONICS CO., LTD.
- Seok-young Yoon
- G01 - MEASURING TESTING
Information Patent Application
POGO pin and test socket including the same
- Publication number 20060145719
- Publication date Jul 6, 2006
- Hyeck-Jin Jeong
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for testing semiconductor chip
- Publication number 20060119375
- Publication date Jun 8, 2006
- Jun-Young Ko
- G01 - MEASURING TESTING

Hyeck-Jin Jeong

Person

Patents Grantslast 30 patents

Semiconductor package transferring apparatus and method of manufact...

Apparatus and method for testing semiconductor chip

POGO pin and test socket including the same

Insert having independently movable latch mechanism for semiconduct...

Patents Applicationslast 30 patents

SEMICONDUCTOR PACKAGE TRANSFERRING APPARATUS AND METHOD OF MANUFACT...

Semiconductor device and method of manufacturing the same

Insert with support for semiconductor package

Self-cleaning socket pin

Insert having independently movable latch mechanism for semiconduct...

Apparatus, customer tray, and method for testing semiconductor pack...

POGO pin and test socket including the same

Apparatus and method for testing semiconductor chip