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Hyeon-Seag Kim
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San Jose, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Determination of device failure characteristic
Patent number
7,155,359
Issue date
Dec 26, 2006
Advanced Micro Devices, Inc.
Hyeon-Seag Kim
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor component and method of manufacture and monitoring
Patent number
6,929,963
Issue date
Aug 16, 2005
Advanced Micro Devices, Inc.
Hyeon-Seag Kim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Space-saving test structures having improved capabilities
Patent number
6,909,293
Issue date
Jun 21, 2005
Advanced Micro Devices, Inc.
Hyeon-Seag Kim
G01 - MEASURING TESTING
Information
Patent Grant
Test structure for determining electromigration and interlayer diel...
Patent number
6,897,476
Issue date
May 24, 2005
Advanced Micro Devices, Inc.
Hyeon-Seag Kim
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for predicting semiconductor device lifetime
Patent number
6,873,932
Issue date
Mar 29, 2005
Advanced Micro Devices, Inc.
Hyeon-Seag Kim
G01 - MEASURING TESTING
Information
Patent Grant
Structure and method for a two-bit memory cell
Patent number
6,861,696
Issue date
Mar 1, 2005
Advanced Micro Devices, Inc.
Hyeon-Seag Kim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Maximum VCC calculation method for hot carrier qualification
Patent number
6,856,160
Issue date
Feb 15, 2005
Advanced Micro Devices, Inc.
Hyeon-Seag Kim
G01 - MEASURING TESTING
Information
Patent Grant
Method for adjusting a Weibull slope for variations in temperature...
Patent number
6,831,451
Issue date
Dec 14, 2004
Advanced Micro Devices, Inc.
Hyeon-Seag Kim
G11 - INFORMATION STORAGE
Information
Patent Grant
Hot carrier oxide qualification method
Patent number
6,825,684
Issue date
Nov 30, 2004
Advanced Micro Devices, Inc.
Hyeon-Seag Kim
G01 - MEASURING TESTING
Information
Patent Grant
High density floating gate flash memory and fabrication processes t...
Patent number
6,812,514
Issue date
Nov 2, 2004
Advanced Micro Devices, Inc.
Nian Yang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for determining a Weibull slope having a bias voltage variat...
Patent number
6,806,696
Issue date
Oct 19, 2004
Advanced Micro Devices, Inc.
Hyeon-Seag Kim
G11 - INFORMATION STORAGE
Information
Patent Grant
Method of detecting shallow trench isolation corner thinning by ele...
Patent number
6,784,682
Issue date
Aug 31, 2004
Advanced Micro Devices, Inc.
Tien-Chun Yang
G01 - MEASURING TESTING
Information
Patent Grant
Process to improve the Vss line formation for high density flash me...
Patent number
6,784,061
Issue date
Aug 31, 2004
Advanced Micro Devices, Inc.
Nian Yang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
MOSFET with SiGe source/drain regions and epitaxial gate dielectric
Patent number
6,762,463
Issue date
Jul 13, 2004
Advanced Micro Devices, Inc.
Hyeon-Seag Kim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for determining an operating voltage using a sour...
Patent number
6,737,876
Issue date
May 18, 2004
Advanced Micro Devices, Inc.
Hyeon-Seag Kim
G01 - MEASURING TESTING
Information
Patent Grant
Method of detecting shallow trench isolation corner thinning by ele...
Patent number
6,734,028
Issue date
May 11, 2004
Advanced Micro Devices, Inc.
Tien-Chun Yang
G01 - MEASURING TESTING
Information
Patent Grant
Flash memory cell with minimized floating gate to drain/source over...
Patent number
6,693,009
Issue date
Feb 17, 2004
Advanced Micro Devices, Inc.
Hyeon-Seag Kim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High density floating gate flash memory and fabrication processes t...
Patent number
6,660,588
Issue date
Dec 9, 2003
Advanced Micro Devices, Inc.
Nian Yang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for providing source/drain-gate spatial overlap e...
Patent number
6,646,326
Issue date
Nov 11, 2003
Advanced Micro Devices, Inc.
Hyeon-Seag Kim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for increasing core gain in flash memory device using strain...
Patent number
6,642,106
Issue date
Nov 4, 2003
Advanced Micro Devices, Inc.
Nian Yang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Epitaxial silicon growth and usage of epitaxial gate insulator for...
Patent number
6,624,488
Issue date
Sep 23, 2003
Advanced Micro Devices, Inc.
Hyeon-Seag Kim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
MOS transistors with high-k dielectric gate insulator for reducing...
Patent number
6,621,114
Issue date
Sep 16, 2003
Advanced Micro Devices, Inc.
Hyeon-Seag Kim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for qualifying an ONO layer in a semiconductor de...
Patent number
6,617,179
Issue date
Sep 9, 2003
Advanced Micro Devices, Inc.
Hyeon-Seag Kim
G11 - INFORMATION STORAGE
Information
Patent Grant
High voltage oxidation method for highly reliable flash memory devices
Patent number
6,534,363
Issue date
Mar 18, 2003
Advanced Micro Devices, Inc.
Hyeon-Seag Kim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for reducing thinning of field isolation structur...
Patent number
6,514,822
Issue date
Feb 4, 2003
Advanced Micro Devices, Inc.
Hyeon-Seag Kim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for qualifying an ONO layer in a semiconductor de...
Patent number
6,509,202
Issue date
Jan 21, 2003
Advanced Micro Devices, Inc.
Hyeon-Seag Kim
G01 - MEASURING TESTING
Information
Patent Grant
Method for fabricating self-aligned gate of flash memory cell
Patent number
6,475,863
Issue date
Nov 5, 2002
Advanced Micro Devices, Inc.
Hyeon-Seag Kim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Fabrication of gate of P-channel field effect transistor with added...
Patent number
6,376,323
Issue date
Apr 23, 2002
Advanced Micro Devices, Inc.
Hyeon-Seag Kim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Fabrication of P-channel field effect transistor with minimized deg...
Patent number
6,365,450
Issue date
Apr 2, 2002
Advanced Micro Devices, Inc.
Hyeon-Seag Kim
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Space-saving test structures having improved capabilities
Publication number
20040212376
Publication date
Oct 28, 2004
Advanced Micro Devices, Inc.
Hyeon-Seag Kim
G01 - MEASURING TESTING
Information
Patent Application
Interconnect structure having improved stress migration reliability
Publication number
20040173803
Publication date
Sep 9, 2004
Advanced Micro Devices, Inc.
Hyeon-Seag Kim
H01 - BASIC ELECTRIC ELEMENTS