Hyeongcheol LEE

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Patents Applicationslast 30 patents

Information Patent Application
SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE INSPECTION METHOD
- Publication number 20240175915
- Publication date May 30, 2024
- Samsung Electronics Co., Ltd.
- SEKYE JEON
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING AND MEASURING SEMICONDUCTOR DEVICE
- Publication number 20230332954
- Publication date Oct 19, 2023
- Samsung Electronics Co., Ltd.
- Hyeongcheol LEE
- G01 - MEASURING TESTING