Hyuk RYU

Person

Seoul, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Complementary Colpitts voltage controlled oscillator with low power...
- Patent number 9,312,810
- Issue date Apr 12, 2016
- Chung-Ang University Industry - Academy Cooperation Foundation
- Dong-Hyun Baek
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
CMOS transistor having different PMOS and NMOS gate electrode struc...
- Patent number 7,348,636
- Issue date Mar 25, 2008
- Samsung Electronics Co., Ltd.
- Hyuk-Ju Ryu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a semiconductor device having a gate struct...
- Patent number 7,332,400
- Issue date Feb 19, 2008
- Samsung Electronics Co., Ltd.
- You-Seung Jin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing multi-thickness gate dielectric layer of s...
- Patent number 7,323,420
- Issue date Jan 29, 2008
- Samsung Electronics Co., Ltd.
- Kyung-soo Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
CMOS device with improved performance and method of fabricating the...
- Patent number 7,285,831
- Issue date Oct 23, 2007
- Samsung Electronics Co., Ltd.
- Mu-kyeng Jung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing multi-thickness gate dielectric layer of s...
- Patent number 7,179,750
- Issue date Feb 20, 2007
- Samsung Electronics, Co., Ltd.
- Kyung-soo Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a semiconductor device having a gate struct...
- Patent number 7,008,835
- Issue date Mar 7, 2006
- Samsung Electronics Co., Ltd.
- You-Seung Jin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating semiconductor device having notched gate
- Patent number 6,858,907
- Issue date Feb 22, 2005
- Samsung Electronics Co., Ltd.
- Hyuk-Ju Ryu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
CMOS transistor having different PMOS and NMOS gate electrode struc...
- Patent number 6,855,641
- Issue date Feb 15, 2005
- Samsung Electronics Co., Ltd.
- Hyuk-Ju Ryu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure of semiconductor device and method for manufacturing the...
- Patent number 6,764,910
- Issue date Jul 20, 2004
- Samsung Electronics Co., Ltd.
- Hyuk-ju Ryu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure of semiconductor device and method for manufacturing the...
- Patent number 6,548,862
- Issue date Apr 15, 2003
- Samsung Electronics Co., Ltd.
- Hyuk-ju Ryu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS FOR MEASURING FIELD OF VIEW OF LIDAR AND METHOD FOR MEASU...
- Publication number 20240302501
- Publication date Sep 12, 2024
- HL KLEMOVE CORP.
- Hyuk RYU
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR CORRECTING DISTANCE DISTORTION TO IMPROVE...
- Publication number 20230273302
- Publication date Aug 31, 2023
- HL KLEMOVE CORP.
- Kimoon KANG
- G01 - MEASURING TESTING
Information Patent Application
LIDAR SENSOR AND TARGET DETECTION METHOD USING THE SAME
- Publication number 20230266439
- Publication date Aug 24, 2023
- HL KLEMOVE CORP.
- Hyuk RYU
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR MANUFACTURING LIDAR RECEIVER AND METHOD FOR MANUFACTU...
- Publication number 20230176202
- Publication date Jun 8, 2023
- HL KLEMOVE CORP.
- Yun Ki HAN
- G01 - MEASURING TESTING
Information Patent Application
LIDAR FOR SHORT RANGE AND LONG RANGE USING SINGLE LIGHT SOURCE
- Publication number 20230041288
- Publication date Feb 9, 2023
- HL KLEMOVE CORP.
- Yun Ki HAN
- G01 - MEASURING TESTING
Information Patent Application
LIDAR DEVICE
- Publication number 20230042957
- Publication date Feb 9, 2023
- HL KLEMOVE CORP.
- Yun Ki Han
- G01 - MEASURING TESTING
Information Patent Application
TIMING COMPENSATION DEVICE FOR OPTICAL OUTPUT SIGNAL OF LIDAR AND M...
- Publication number 20230043021
- Publication date Feb 9, 2023
- HL KLEMOVE CORP.
- Yun Ki HAN
- G01 - MEASURING TESTING
Information Patent Application
LIDAR SYSTEM USING LIGHT SOURCE HAVING DIFFERENT WAVELENGTHS
- Publication number 20230038743
- Publication date Feb 9, 2023
- HL KLEMOVE CORP.
- YUN KI HAN
- G01 - MEASURING TESTING
Information Patent Application
LIGHT RECEIVING MODULE AND LIDAR APPARATUS COMPRISING THE SAME
- Publication number 20230034553
- Publication date Feb 2, 2023
- Yun Ki HAN
- G02 - OPTICS
Information Patent Application
SPATIAL DIVISION STRUCTURE AND LIGHT REFLECTION DEVICE AND LIDAR SC...
- Publication number 20230035782
- Publication date Feb 2, 2023
- HL KLEMOVE CORP.
- Yun Ki HAN
- G02 - OPTICS
Information Patent Application
COMPLEMENTARY COLPITTS VOLTAGE CONTROLLED OSCILLATOR WITH LOW POWER...
- Publication number 20150244319
- Publication date Aug 27, 2015
- Chung-Ang University Industry-Academy Cooperation Foundation
- Dong-Hyun BAEK
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Trench isolation methods of semiconductor device
- Publication number 20080032483
- Publication date Feb 7, 2008
- Samsung Electronics Co., Ltd.
- Hyuk-Ju Ryu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for manufacturing multi-thickness gate dielectric layer of s...
- Publication number 20070117391
- Publication date May 24, 2007
- Samsung Electronics, Co., Ltd.
- Kyung-soo Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Trench isolation methods of semiconductor device
- Publication number 20060240636
- Publication date Oct 26, 2006
- Hyuk-Ju Ryu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of manufacturing a semiconductor device having a gate struct...
- Publication number 20060099766
- Publication date May 11, 2006
- Samsung Electronics, Co., Ltd.
- You-Seung Jin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CMOS device with improved performance and method of fabricating the...
- Publication number 20060027876
- Publication date Feb 9, 2006
- SAMSUNG ELECTRONICS CO., LTD.
- Mu-kyeng Jung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CMOS transistor having different PMOS and NMOS gate electrode struc...
- Publication number 20050116297
- Publication date Jun 2, 2005
- Samsung Electronics, Co., Ltd.
- Hyuk-Ju Ryu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of manufacturing a semiconductor device
- Publication number 20050112834
- Publication date May 26, 2005
- SAMSUNG ELECTRONICS CO., LTD.
- You-Seung Jin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods of forming integrated circuit devices using buffer layers c...
- Publication number 20040185608
- Publication date Sep 23, 2004
- Myoung-hwan Oh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for manufacturing multi-thickness gate dielectric layer of s...
- Publication number 20040087159
- Publication date May 6, 2004
- SAMSUNG ELECTRONICS CO., LTD.
- Kyung-Soo Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CMOS transistor having different PMOS and NMOS gate electrode struc...
- Publication number 20030203560
- Publication date Oct 30, 2003
- SAMSUNG ELECTRONICS CO., LTD.
- Hyuk-Ju Ryu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Structure of semiconductor device and method for manufacturing the...
- Publication number 20030151097
- Publication date Aug 14, 2003
- Hyuk-Ju Ryu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Structure of semiconductor device and method for manufacturing the...
- Publication number 20030030103
- Publication date Feb 13, 2003
- SAMSUNG ELECTRONICS CO., LTD.
- Hyuk-ju Ryu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of fabricating semiconductor device having notched gate
- Publication number 20020142523
- Publication date Oct 3, 2002
- SAMSUNG ELECTRONICS CO., LTD.
- Hyuk-Ju Ryu
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Complementary Colpitts voltage controlled oscillator with low power...

CMOS transistor having different PMOS and NMOS gate electrode struc...

Method of manufacturing a semiconductor device having a gate struct...

Method for manufacturing multi-thickness gate dielectric layer of s...

CMOS device with improved performance and method of fabricating the...

Method for manufacturing multi-thickness gate dielectric layer of s...

Method of manufacturing a semiconductor device having a gate struct...

Method of fabricating semiconductor device having notched gate

CMOS transistor having different PMOS and NMOS gate electrode struc...

Structure of semiconductor device and method for manufacturing the...

Structure of semiconductor device and method for manufacturing the...

Patents Applicationslast 30 patents

APPARATUS FOR MEASURING FIELD OF VIEW OF LIDAR AND METHOD FOR MEASU...

METHOD AND APPARATUS FOR CORRECTING DISTANCE DISTORTION TO IMPROVE...

LIDAR SENSOR AND TARGET DETECTION METHOD USING THE SAME

APPARATUS FOR MANUFACTURING LIDAR RECEIVER AND METHOD FOR MANUFACTU...

LIDAR FOR SHORT RANGE AND LONG RANGE USING SINGLE LIGHT SOURCE

LIDAR DEVICE

TIMING COMPENSATION DEVICE FOR OPTICAL OUTPUT SIGNAL OF LIDAR AND M...

LIDAR SYSTEM USING LIGHT SOURCE HAVING DIFFERENT WAVELENGTHS

LIGHT RECEIVING MODULE AND LIDAR APPARATUS COMPRISING THE SAME

SPATIAL DIVISION STRUCTURE AND LIGHT REFLECTION DEVICE AND LIDAR SC...

COMPLEMENTARY COLPITTS VOLTAGE CONTROLLED OSCILLATOR WITH LOW POWER...

Trench isolation methods of semiconductor device

Method for manufacturing multi-thickness gate dielectric layer of s...

Trench isolation methods of semiconductor device

Method of manufacturing a semiconductor device having a gate struct...

CMOS device with improved performance and method of fabricating the...

CMOS transistor having different PMOS and NMOS gate electrode struc...

Method of manufacturing a semiconductor device

Methods of forming integrated circuit devices using buffer layers c...

Method for manufacturing multi-thickness gate dielectric layer of s...

CMOS transistor having different PMOS and NMOS gate electrode struc...

Structure of semiconductor device and method for manufacturing the...

Structure of semiconductor device and method for manufacturing the...

Method of fabricating semiconductor device having notched gate