Membership
Tour
Register
Log in
Hyun Jae Kim
Follow
Person
Shanghai, CN
People
Overview
Industries
Organizations
People
Information
Impact
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR AVOIDING POLYSILICON DEFECT
Publication number
20080132076
Publication date
Jun 5, 2008
Semiconductor Manufacturing International ( Shanghai) Corporation
Yun Yang
H01 - BASIC ELECTRIC ELEMENTS