Membership
Tour
Register
Log in
Ian C. Shay
Follow
Person
Cambridge, MA, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Internal material condition monitoring for control
Patent number
8,981,018
Issue date
Mar 17, 2015
Jentek Sensors, Inc.
Neil J. Goldfine
G05 - CONTROLLING REGULATING
Information
Patent Grant
Magnetic field characterization of stresses and properties in mater...
Patent number
8,237,433
Issue date
Aug 7, 2012
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field characterization of stresses and properties in mater...
Patent number
7,876,094
Issue date
Jan 25, 2011
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Absolute property measurements using electromagnetic sensors
Patent number
7,696,748
Issue date
Apr 13, 2010
Jentek Sensors, Inc.
Darrell E. Schlicker
G01 - MEASURING TESTING
Information
Patent Grant
Applied and residual stress measurements using magnetic field sensors
Patent number
7,526,964
Issue date
May 5, 2009
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Material condition monitoring with multiple sensing modes
Patent number
7,451,657
Issue date
Nov 18, 2008
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
High resolution inductive sensor arrays for UXO
Patent number
7,411,390
Issue date
Aug 12, 2008
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Self-monitoring metals, alloys and materials
Patent number
7,188,532
Issue date
Mar 13, 2007
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Method for inspecting a channel using a flexible sensor
Patent number
7,183,764
Issue date
Feb 27, 2007
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Hidden feature characterization using a database of sensor responses
Patent number
7,161,351
Issue date
Jan 9, 2007
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Test circuit having parallel drive segments and a plurality of sens...
Patent number
7,049,811
Issue date
May 23, 2006
Jentek Sensors, Inc.
Darrell E. Schlicker
G01 - MEASURING TESTING
Information
Patent Grant
High resolution inductive sensor arrays for material and defect cha...
Patent number
6,995,557
Issue date
Feb 7, 2006
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field sensor having a switchable drive current spatial dis...
Patent number
6,992,482
Issue date
Jan 31, 2006
Jentek Sensors, Inc.
Ian Shay
G01 - MEASURING TESTING
Information
Patent Grant
Eddy current sensor arrays having drive windings with extended port...
Patent number
6,784,662
Issue date
Aug 31, 2004
Jentek Sensors, Inc.
Darrell E. Schlicker
G01 - MEASURING TESTING
Information
Patent Grant
Inspection method using penetrant and dielectrometer
Patent number
6,781,387
Issue date
Aug 24, 2004
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
High resolution inductive sensor arrays for material and defect cha...
Patent number
6,727,691
Issue date
Apr 27, 2004
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
INTERNAL MATERIAL CONDITION MONITORING FOR CONTROL
Publication number
20150160144
Publication date
Jun 11, 2015
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Magnetic Field Characterization of Stresses and Properties in Mater...
Publication number
20110163742
Publication date
Jul 7, 2011
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Magnetic field characterization of stresses and properties in mater...
Publication number
20100045277
Publication date
Feb 25, 2010
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Self-monitoring metals, alloys and materials
Publication number
20070227255
Publication date
Oct 4, 2007
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Magnetic field characterization of stresses and properties in mater...
Publication number
20070114993
Publication date
May 24, 2007
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Automated drawing tool and method for drawing a sensor layout
Publication number
20060186880
Publication date
Aug 24, 2006
Darrell E. Schlicker
G01 - MEASURING TESTING
Information
Patent Application
Segmented field sensors
Publication number
20060076952
Publication date
Apr 13, 2006
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Internal material condition monitoring for control
Publication number
20060009865
Publication date
Jan 12, 2006
JENTEK Sensors, Inc.
Neil J. Goldfine
G05 - CONTROLLING REGULATING
Information
Patent Application
Magnetic field sensor having a switchable drive current spatial dis...
Publication number
20060009923
Publication date
Jan 12, 2006
Ian Shay
G01 - MEASURING TESTING
Information
Patent Application
Segmented field sensors
Publication number
20050248339
Publication date
Nov 10, 2005
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Material condition monitoring with multiple sensing modes
Publication number
20050171703
Publication date
Aug 4, 2005
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Absolute property measurements using electromagnetic sensors
Publication number
20050127908
Publication date
Jun 16, 2005
JENTEK Sensors, Inc.
Darrell E. Schlicker
G01 - MEASURING TESTING
Information
Patent Application
Hidden feature characterization using eddy current sensors and arrays
Publication number
20050088172
Publication date
Apr 28, 2005
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Self-monitoring metals, alloys and materials
Publication number
20050083032
Publication date
Apr 21, 2005
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Hybrid wound/etched winding constructs for scanning and monitoring
Publication number
20050007106
Publication date
Jan 13, 2005
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
High resolution inductive sensor arrays for material and defect cha...
Publication number
20040239317
Publication date
Dec 2, 2004
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Eddy current sensor arrays having drive windings with extended port...
Publication number
20040232911
Publication date
Nov 25, 2004
JENTEK Sensors, Inc.
Darrell E. Schlicker
G01 - MEASURING TESTING
Information
Patent Application
Life extending probe and method
Publication number
20040124834
Publication date
Jul 1, 2004
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Magnetic field characterization of stresses and properties in mater...
Publication number
20040056654
Publication date
Mar 25, 2004
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
High resolution inductive sensor arrays for UXO
Publication number
20040021461
Publication date
Feb 5, 2004
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
High throughput absolute flaw imaging
Publication number
20040004475
Publication date
Jan 8, 2004
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Applied and residual stress measurements using magnetic field sensors
Publication number
20030173958
Publication date
Sep 18, 2003
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
High resolution hidden damage imaging
Publication number
20030164700
Publication date
Sep 4, 2003
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Segmented field dielectrometer
Publication number
20030080744
Publication date
May 1, 2003
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Eddy current sensor arrays
Publication number
20030071615
Publication date
Apr 17, 2003
JENTEK Sensors
Darrell E. Schlicker
G01 - MEASURING TESTING
Information
Patent Application
Deep penetration magnetoquasistatic arrays
Publication number
20020158626
Publication date
Oct 31, 2002
JENTEK Sensors, Inc.
Ian Shay
G01 - MEASURING TESTING
Information
Patent Application
High resolution inductive sensor arrays for material and defect cha...
Publication number
20020105325
Publication date
Aug 8, 2002
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING