Igor V. Chernushevich

Person

North York, CA

People

Patents Grantslast 30 patents

Information Patent Grant
Two-and-a-half channel detection system for time-of-flight (TOF) ma...
- Patent number 10,784,098
- Issue date Sep 22, 2020
- DH Technologies Development Pte. Ltd.
- Igor Chernushevich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion optical elements
- Patent number 9,653,273
- Issue date May 16, 2017
- DH Technologies Development Pte. Ltd.
- William Morgan Loyd
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Windowing combined with ion-ion reactions for chemical noise elimin...
- Patent number 9,390,238
- Issue date Jul 12, 2016
- DH Technologies Development Pte. Ltd.
- John Lawrence Campbell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Ion fragmentation in mass spectrometry
- Patent number 7,737,396
- Issue date Jun 15, 2010
- MDS Analytical Technologies, a business unit of MDS Inc.
- Igor Chernushevich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Confining ions with fast-oscillating electric fields
- Patent number 7,557,344
- Issue date Jul 7, 2009
- MDS Analytical Technologies, a business unit of MDS Inc.
- Igor Chernushevich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for mass analysis of samples
- Patent number 7,504,621
- Issue date Mar 17, 2009
- MDS Inc.
- Igor Chernushevich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer multiple device interface for parallel configurat...
- Patent number 7,358,488
- Issue date Apr 15, 2008
- MDS Inc.
- Igor V. Chernushevich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for mass analysis of samples
- Patent number 7,126,114
- Issue date Oct 24, 2006
- MDS Inc.
- Igor Chernushevich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MS/MS scan methods for a quadrupole/time of flight tandem mass spec...
- Patent number 6,507,019
- Issue date Jan 14, 2003
- MDS Inc.
- Igor Chernushevich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MS/MS scan methods for a quadrupole/time of flight tandem mass spec...
- Patent number 6,285,027
- Issue date Sep 4, 2001
- MDS Inc.
- Igor Chernushevich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for improved signal-to-noise for multiply charged ions
- Patent number 6,166,378
- Issue date Dec 26, 2000
- MDS Inc.
- Bruce Thomson
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Space Charge Reduction in TOF-MS
- Publication number 20240312776
- Publication date Sep 19, 2024
- DH Technologies Development Pte. Ltd.
- Pavel RYUMIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Reducing AC Effects on Ions Entering Ion Guide with Pulsing Auxilia...
- Publication number 20240242958
- Publication date Jul 18, 2024
- DH Technologies Development Pte. Ltd.
- Igor Chernushevich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dynamically Concentrating Ion Packets in the Extraction Region of a...
- Publication number 20210366701
- Publication date Nov 25, 2021
- DH Technologies Development Pte. Ltd.
- Nic BLOOMFIELD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Two-and-a-Half Channel Detection System for Time-of-Flight (TOF) Ma...
- Publication number 20200020517
- Publication date Jan 16, 2020
- DH Technologies Development Pte. Ltd.
- Igor Chernushevich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems and Methods for Recording Average Ion Response
- Publication number 20160209361
- Publication date Jul 21, 2016
- DH Technologies Development Pte. Ltd.
- Nic G. Bloomfield
- G01 - MEASURING TESTING
Information Patent Application
Windowing Combined with Ion-Ion Reactions for Chemical Noise Elimin...
- Publication number 20140357502
- Publication date Dec 4, 2014
- John Lawrence Campbell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ION FRAGMENTATION IN MASS SPECTROMETRY
- Publication number 20090189071
- Publication date Jul 30, 2009
- MDS Analytical Technologies, a Business Unit of MDS Inc., doing it business t...
- Igor Chernushevich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONFINING IONS WITH FAST-OSCILLATING ELECTRIC FIELDS
- Publication number 20090014645
- Publication date Jan 15, 2009
- Igor CHERNUSHEVICH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometer multiple device interface for parallel configurat...
- Publication number 20070057178
- Publication date Mar 15, 2007
- MDS Inc.
- Igor V. Chernushevich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR MASS ANALYSIS OF SAMPLES
- Publication number 20070023645
- Publication date Feb 1, 2007
- MDS Inc., doing business through its MDS Sciex Division
- Igor Chernushevich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and system for mass analysis of samples
- Publication number 20050194531
- Publication date Sep 8, 2005
- MDS Inc., doing business through its MDS Sciex Division
- Igor Chernushevich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MS/MS scan methods for a quadrupole/time of flight tandem mass spec...
- Publication number 20020030159
- Publication date Mar 14, 2002
- Igor Chernushevich
- H01 - BASIC ELECTRIC ELEMENTS

Igor V. Chernushevich

Person

Patents Grantslast 30 patents

Two-and-a-half channel detection system for time-of-flight (TOF) ma...

Ion optical elements

Windowing combined with ion-ion reactions for chemical noise elimin...

Ion fragmentation in mass spectrometry

Confining ions with fast-oscillating electric fields

Method and system for mass analysis of samples

Mass spectrometer multiple device interface for parallel configurat...

Method and system for mass analysis of samples

MS/MS scan methods for a quadrupole/time of flight tandem mass spec...

MS/MS scan methods for a quadrupole/time of flight tandem mass spec...

Method for improved signal-to-noise for multiply charged ions

Patents Applicationslast 30 patents

Space Charge Reduction in TOF-MS

Reducing AC Effects on Ions Entering Ion Guide with Pulsing Auxilia...

Dynamically Concentrating Ion Packets in the Extraction Region of a...

Two-and-a-Half Channel Detection System for Time-of-Flight (TOF) Ma...

Systems and Methods for Recording Average Ion Response

Windowing Combined with Ion-Ion Reactions for Chemical Noise Elimin...

ION FRAGMENTATION IN MASS SPECTROMETRY

CONFINING IONS WITH FAST-OSCILLATING ELECTRIC FIELDS

Mass spectrometer multiple device interface for parallel configurat...

METHOD AND SYSTEM FOR MASS ANALYSIS OF SAMPLES

Method and system for mass analysis of samples

MS/MS scan methods for a quadrupole/time of flight tandem mass spec...