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Igor V. Peidous
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last 30 patents
Information
Patent Grant
Dislocation free local oxidation of silicon with suppression of nar...
Patent number
6,380,610
Issue date
Apr 30, 2002
Chartered Semiconductor Manufacturing Ltd.
Igor V. Peidous
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and mask structure for self-aligning ion implanting to form...
Patent number
6,271,575
Issue date
Aug 7, 2001
Chartered Semiconductor Manufacturing Ltd.
Igor V. Peidous
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
LOCOS mask for suppression of narrow space field oxide thinning and...
Patent number
6,249,035
Issue date
Jun 19, 2001
Chartered Semiconductor Manufacturing Ltd.
Igor V. Peidous
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of filling shallow trenches
Patent number
6,180,490
Issue date
Jan 30, 2001
Chartered Semiconductor Manufacturing Ltd.
Vladislav Vassiliev
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Locos mask for suppression of narrow space field oxide thinning and...
Patent number
6,071,793
Issue date
Jun 6, 2000
Chartered Semiconductor Manufacturing Ltd.
Igor V. Peidous
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sub-quarter-micron MOSFET and method of its manufacturing
Patent number
6,049,107
Issue date
Apr 11, 2000
Chartered Semiconductor Manufacturing Ltd.
Igor V. Peidous
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method to form shallow trench isolation structures with improved is...
Patent number
6,027,982
Issue date
Feb 22, 2000
Chartered Semiconductor Manufacturing Ltd.
Igor V. Peidous
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and mask structure for self-aligning ion implanting to form...
Patent number
6,027,963
Issue date
Feb 22, 2000
Chartered Semiconductor Manufacturing Ltd.
Igor V. Peidous
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and mask structure for self-aligning ion implanting to form...
Patent number
6,022,768
Issue date
Feb 8, 2000
Chartered Semiconductor Manufacturing Ltd.
Igor V. Peidous
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and mask structure for self-aligning ion implanting to form...
Patent number
6,001,700
Issue date
Dec 14, 1999
Chartered Semiconductor Manufacturing Ltd.
Igor V. Peidous
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Shallow trench isolation of MOSFETS with reduced corner parasitic c...
Patent number
5,989,978
Issue date
Nov 23, 1999
Chartered Semiconductor Manufacturing, Ltd.
Igor V. Peidous
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for making sub-quarter-micron MOSFET
Patent number
5,937,297
Issue date
Aug 10, 1999
Chartered Semiconductor Manufacturing, Ltd.
Igor V. Peidous
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of shallow trench isolation
Patent number
5,930,646
Issue date
Jul 27, 1999
Chartered Semiconductor Manufacturing, Ltd.
Henry Gerung
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Dislocation free local oxidation of silicon with suppression of nar...
Patent number
5,894,059
Issue date
Apr 13, 1999
Chartered Semiconductor Manufacturing Company Ltd.
Igor V. Peidous
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and mask structure for self-aligning ion implanting to form...
Patent number
5,849,613
Issue date
Dec 15, 1998
Chartered Semiconductor Manufacturing Ltd.
Igor V. Peidous
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Locos with bird's beak suppression by a nitrogen implantation
Patent number
5,789,305
Issue date
Aug 4, 1998
Chartered Semiconductor Manufacturing Ltd.
Igor V. Peidous
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Narrow deep trench isolation process with trench filling by oxidation
Patent number
5,721,174
Issue date
Feb 24, 1998
Chartered Semiconductor Manufacturing Pte Ltd
Igor V. Peidous
H01 - BASIC ELECTRIC ELEMENTS