Ikuyoshi Nakatani

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Kyoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for measuring insulation film thickness of sem...
- Patent number 5,568,252
- Issue date Oct 22, 1996
- Dainippon Screen Manufacturing Co., Ltd.
- Tatsufumi Kusuda
- G01 - MEASURING TESTING
Information Patent Grant
Optical gap measuring device using frustrated internal reflection
- Patent number 5,239,183
- Issue date Aug 24, 1993
- Dainippon Screen Mfg. Co., Ltd.
- Motohiro Kouno
- G01 - MEASURING TESTING
Information Patent Grant
Method of and apparatus for measuring electric characteristics of s...
- Patent number 5,233,291
- Issue date Aug 3, 1993
- Dainippon Screen Mfg. Co., Ltd.
- Motohiro Kouno
- G01 - MEASURING TESTING
Information Patent Grant
Gap measuring device and method using frustrated internal reflection
- Patent number 5,225,690
- Issue date Jul 6, 1993
- Dainippon Screen Mfg. Co., Ltd.
- Takamasa Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Heat processing apparatus for semiconductor manufacturing
- Patent number 4,803,948
- Issue date Feb 14, 1989
- Dainippon Screen Mfg. Co., Ltd.
- Keiji Nakagawa
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...