Ilseok Son

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Albany, NY, US

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Patents Applicationslast 30 patents

Information Patent Application
WAFER BONDING OVERLAY MEASUREMENT SYSTEM
- Publication number 20250233022
- Publication date Jul 17, 2025
- TOKYO ELECTRON LIMITED
- Ilseok SON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR PANEL POLISHING
- Publication number 20250196283
- Publication date Jun 19, 2025
- TOKYO ELECTRON LIMITED
- Christopher NETZBAND
- B24 - GRINDING POLISHING
Information Patent Application
TORSIONAL SHEAR TESTING FOR SEMICONDUCTOR SURFACE BONDS
- Publication number 20250180453
- Publication date Jun 5, 2025
- TOKYO ELECTRON LIMITED
- Christopher Michael Netzband
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR PROTECTING TO REUSE SILICON CARRIER WAFER BASED ON IR L...
- Publication number 20250079166
- Publication date Mar 6, 2025
- TOKYO ELECTRON LIMITED
- Panupong JAIPAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Release Layer for IR Laser Lift-Off Process
- Publication number 20250054904
- Publication date Feb 13, 2025
- TOKYO ELECTRON LIMITED
- Panupong JAIPAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR BONDING SEMICONDUCTOR DEVICES
- Publication number 20240243006
- Publication date Jul 18, 2024
- TOKYO ELECTRON LIMITED
- Scott Lefevre
- H01 - BASIC ELECTRIC ELEMENTS