Inbar Weintrob

Person

Tel Aviv, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Efficient integrated circuit simulation and testing
- Patent number 12,216,976
- Issue date Feb 4, 2025
- PROTEANTECS LTD.
- Evelyn Landman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit workload, temperature, and/or sub-threshold leak...
- Patent number 12,092,684
- Issue date Sep 17, 2024
- PROTEANTECS LTD.
- Eyal Fayneh
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit margin measurement and failure prediction device
- Patent number 11,841,395
- Issue date Dec 12, 2023
- PROTEANTECS LTD.
- Evelyn Landman
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit I/O integrity and degradation monitoring
- Patent number 11,762,789
- Issue date Sep 19, 2023
- PROTEANTECS LTD.
- Eyal Fayneh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit degradation estimation and time-of-failure predi...
- Patent number 11,740,281
- Issue date Aug 29, 2023
- PROTEANTECS LTD.
- Eyal Fayneh
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit workload, temperature and/or subthreshold leakag...
- Patent number 11,408,932
- Issue date Aug 9, 2022
- PROTEANTECS LTD.
- Eyal Fayneh
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit pad failure detection
- Patent number 11,391,771
- Issue date Jul 19, 2022
- PROTEANTECS LTD.
- Eyal Fayneh
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit margin measurement and failure prediction device
- Patent number 11,385,282
- Issue date Jul 12, 2022
- PROTEANTECS LTD.
- Evelyn Landman
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit I/O integrity and degradation monitoring
- Patent number 11,275,700
- Issue date Mar 15, 2022
- PROTEANTECS LTD.
- Eyal Fayneh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Efficient integrated circuit simulation and testing
- Patent number 11,132,485
- Issue date Sep 28, 2021
- PROTEANTECS LTD.
- Evelyn Landman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit I/O integrity and degradation monitoring
- Patent number 10,740,262
- Issue date Aug 11, 2020
- PROTEANTECS LTD.
- Eyal Fayneh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus, system, and method for providing clock signal on demand
- Patent number 9,367,080
- Issue date Jun 14, 2016
- Intel Corporation
- Alexander Gendler
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT SIMULATOR FOR DEGRADATION ESTIMATION AND TIME-OF...
- Publication number 20250012852
- Publication date Jan 9, 2025
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE, AND/OR SUB-THRESHOLD LEAK...
- Publication number 20240418770
- Publication date Dec 19, 2024
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
ADAPTIVE FREQUENCY SCALING BASED ON CLOCK CYCLE TIME MEASUREMENT
- Publication number 20240372554
- Publication date Nov 7, 2024
- PROTEANTECS LTD.
- Eyal FAYNEH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT DEGRADATION ESTIMATION AND TIME-OF-FAILURE PREDI...
- Publication number 20240353476
- Publication date Oct 24, 2024
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE
- Publication number 20240036105
- Publication date Feb 1, 2024
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT PAD FAILURE DETECTION
- Publication number 20240004812
- Publication date Jan 4, 2024
- PROTEANTECS LTD.
- Eyal FAYNEH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE, AND/OR SUB-THRESHOLD LEAK...
- Publication number 20230341460
- Publication date Oct 26, 2023
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE
- Publication number 20230046999
- Publication date Feb 16, 2023
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT PAD FAILURE DETECTION
- Publication number 20220349935
- Publication date Nov 3, 2022
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION OF UNKNOWN BIAS AND DEVICE PARAMETERS OF INTEGRATED C...
- Publication number 20220343048
- Publication date Oct 27, 2022
- PROTEANTECS LTD.
- Eyal FAYNEH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ON-DIE THERMAL SENSING NETWORK FOR INTEGRATED CIRCUITS
- Publication number 20220268644
- Publication date Aug 25, 2022
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT DEGRADATION ESTIMATION AND TIME-OF-FAILURE PREDI...
- Publication number 20220260630
- Publication date Aug 18, 2022
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT I/O INTEGRITY AND DEGRADATION MONITORING
- Publication number 20220156206
- Publication date May 19, 2022
- PROTEANTECS LTD.
- Eyal FAYNEH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EFFICIENT INTEGRATED CIRCUIT SIMULATION AND TESTING
- Publication number 20220012395
- Publication date Jan 13, 2022
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EFFICIENT INTEGRATED CIRCUIT SIMULATION AND TESTING
- Publication number 20210165941
- Publication date Jun 3, 2021
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE
- Publication number 20200393506
- Publication date Dec 17, 2020
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT I/O INTEGRITY AND DEGRADATION MONITORING
- Publication number 20200371972
- Publication date Nov 26, 2020
- PROTEANTECS LTD.
- Eyal FAYNEH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT PAD FAILURE DETECTION
- Publication number 20200363468
- Publication date Nov 19, 2020
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE AND/OR SUBTHRESHOLD LEAKAG...
- Publication number 20200333393
- Publication date Oct 22, 2020
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit I/O integrity and degradation monitoring
- Publication number 20200210354
- Publication date Jul 2, 2020
- PROTEANTECS LTD.
- Eyal FAYNEH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS, SYSTEM, AND METHOD FOR PROVIDING CLOCK SIGNAL ON DEMAND
- Publication number 20130166939
- Publication date Jun 27, 2013
- Alexander Gendler
- G06 - COMPUTING CALCULATING COUNTING

Inbar Weintrob

Person

Patents Grantslast 30 patents

Efficient integrated circuit simulation and testing

Integrated circuit workload, temperature, and/or sub-threshold leak...

Integrated circuit margin measurement and failure prediction device

Integrated circuit I/O integrity and degradation monitoring

Integrated circuit degradation estimation and time-of-failure predi...

Integrated circuit workload, temperature and/or subthreshold leakag...

Integrated circuit pad failure detection

Integrated circuit margin measurement and failure prediction device

Integrated circuit I/O integrity and degradation monitoring

Efficient integrated circuit simulation and testing

Integrated circuit I/O integrity and degradation monitoring

Apparatus, system, and method for providing clock signal on demand

Patents Applicationslast 30 patents

INTEGRATED CIRCUIT SIMULATOR FOR DEGRADATION ESTIMATION AND TIME-OF...

INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE, AND/OR SUB-THRESHOLD LEAK...

ADAPTIVE FREQUENCY SCALING BASED ON CLOCK CYCLE TIME MEASUREMENT

INTEGRATED CIRCUIT DEGRADATION ESTIMATION AND TIME-OF-FAILURE PREDI...

INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE

INTEGRATED CIRCUIT PAD FAILURE DETECTION

INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE, AND/OR SUB-THRESHOLD LEAK...

INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE

INTEGRATED CIRCUIT PAD FAILURE DETECTION

DETERMINATION OF UNKNOWN BIAS AND DEVICE PARAMETERS OF INTEGRATED C...

ON-DIE THERMAL SENSING NETWORK FOR INTEGRATED CIRCUITS

INTEGRATED CIRCUIT DEGRADATION ESTIMATION AND TIME-OF-FAILURE PREDI...

INTEGRATED CIRCUIT I/O INTEGRITY AND DEGRADATION MONITORING

EFFICIENT INTEGRATED CIRCUIT SIMULATION AND TESTING

EFFICIENT INTEGRATED CIRCUIT SIMULATION AND TESTING

INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE

INTEGRATED CIRCUIT I/O INTEGRITY AND DEGRADATION MONITORING

INTEGRATED CIRCUIT PAD FAILURE DETECTION

INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE AND/OR SUBTHRESHOLD LEAKAG...

Integrated circuit I/O integrity and degradation monitoring

APPARATUS, SYSTEM, AND METHOD FOR PROVIDING CLOCK SIGNAL ON DEMAND