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Ingo Mueller
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Aalen, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Particle beam system for adjusting the current of individual partic...
Patent number
11,562,880
Issue date
Jan 24, 2023
Carl Zeiss MultiSEM GmbH
Dirk Zeidler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam system
Patent number
11,562,881
Issue date
Jan 24, 2023
Carl Zeiss MultiSEM GmbH
Dirk Zeidler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam system
Patent number
11,164,715
Issue date
Nov 2, 2021
Carl Zeiss MultiSEM GmbH
Dirk Zeidler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam system
Patent number
10,811,215
Issue date
Oct 20, 2020
Carl Zeiss MultiSEM GmbH
Dirk Zeidler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Particle beam system and method for operating a particle optical unit
Patent number
9,991,089
Issue date
Jun 5, 2018
Carl Zeiss Microscopy GmbH
Ingo Mueller
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Particle beam system and method for operating a particle optical unit
Patent number
9,799,485
Issue date
Oct 24, 2017
Carl Zeiss Microscopy GmbH
Ingo Mueller
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR OPERATING A MULTI-BEAM PARTICLE MICROSCOPE WITH FAST CLO...
Publication number
20240128048
Publication date
Apr 18, 2024
Carl Zeiss MultiSEM GmbH
Ingo Mueller
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTIPLE PARTICLE BEAM MICROSCOPE AND ASSOCIATED METHOD WITH FAST A...
Publication number
20230245852
Publication date
Aug 3, 2023
Carl Zeiss MultiSEM GmbH
Dirk Zeidler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PARTICLE BEAM SYSTEM WITH MULTI-SOURCE SYSTEM AND MULTI-BEAM PARTIC...
Publication number
20230065475
Publication date
Mar 2, 2023
Carl Zeiss MultiSEM GmbH
Dirk Zeidler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
HIGH THROUGHPUT MULTI-BEAM CHARGED PARTICLE INSPECTION SYSTEM WITH...
Publication number
20230043036
Publication date
Feb 9, 2023
Carl Zeiss MultiSEM GmbH
Dirk Zeidler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PARTICLE BEAM SYSTEM INCLUDING A MULTI-BEAM DEFLECTION DEVICE AND A...
Publication number
20220277927
Publication date
Sep 1, 2022
Carl Zeiss MultiSEM GmbH
Stefan Schubert
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTIPLE PARTICLE BEAM MICROSCOPE AND ASSOCIATED METHOD WITH AN IMP...
Publication number
20220246388
Publication date
Aug 4, 2022
Carl Zeiss MultiSEM GmbH
Nicole Rauwolf
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR OPERATING A MULTIPLE PARTICLE BEAM SYSTEM WHILE ALTERING...
Publication number
20220130640
Publication date
Apr 28, 2022
Carl Zeiss MultiSEM GmbH
Hans Fritz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged Particle Beam System
Publication number
20220108864
Publication date
Apr 7, 2022
Carl Zeiss MultiSEM GmbH
Dirk Zeidler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PARTICLE BEAM SYSTEM FOR ADJUSTING THE CURRENT OF INDIVIDUAL PARTIC...
Publication number
20210210303
Publication date
Jul 8, 2021
Carl Zeiss MultiSEM GmbH
Dirk Zeidler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Particle Beam System
Publication number
20210142980
Publication date
May 13, 2021
Carl Zeiss MultiSEM GmbH
Dirk Zeidler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED PARTICLE BEAM SYSTEM
Publication number
20200411274
Publication date
Dec 31, 2020
Carl Zeiss MultiSEM GmbH
Dirk Zeidler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED PARTICLE BEAM SYSTEM
Publication number
20190355545
Publication date
Nov 21, 2019
CARL ZEISS MICROSCOPY GMBH
Dirk Zeidler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PARTICLE BEAM SYSTEM AND METHOD FOR OPERATING A PARTICLE OPTICAL UNIT
Publication number
20180040454
Publication date
Feb 8, 2018
CARL ZEISS MICROSCOPY GMBH
Ingo Mueller
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PARTICLE BEAM SYSTEM AND METHOD FOR OPERATING A PARTICLE OPTICAL UNIT
Publication number
20150357157
Publication date
Dec 10, 2015
CARL ZEISS MICROSCOPY GMBH
Ingo Mueller
H01 - BASIC ELECTRIC ELEMENTS