Ingrid De Wolf

Person

Leuven, BE

People

Patents Grantslast 30 patents

Information Patent Grant
Method for the electrical bonding of semiconductor components
- Patent number 11,362,061
- Issue date Jun 14, 2022
- Imec VZW
- Lin Hou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of detecting manufacturing defects by thermal stimulation
- Patent number 10,777,471
- Issue date Sep 15, 2020
- Imec VZW
- Kristof J. P. Jacobs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for aligning micro-electronic components
- Patent number 9,799,632
- Issue date Oct 24, 2017
- Imec VZW
- Vikas Dubey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for aligning micro-electronic components
- Patent number 9,601,459
- Issue date Mar 21, 2017
- Imec VZW
- Vikas Dubey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lock in thermal laser stimulation through one side of the device wh...
- Patent number 9,098,892
- Issue date Aug 4, 2015
- DCG Systems, Inc.
- Herve Deslandes
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Lock in thermal laser stimulation through one side of the device wh...
- Patent number 9,025,020
- Issue date May 5, 2015
- DCG Systems, Inc.
- Herve Deslandes
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for reducing substrate charging
- Patent number 8,294,976
- Issue date Oct 23, 2012
- IMEC
- Ingrid De Wolf
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Emission microscope and method for continuous wavelength spectroscopy
- Patent number 6,043,882
- Issue date Mar 28, 2000
- IMEC vzw
- Ingrid De Wolf
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR THE ELECTRICAL BONDING OF SEMICONDUCTOR COMPONENTS
- Publication number 20200402950
- Publication date Dec 24, 2020
- IMEC vzw
- Lin Hou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF DETECTING MANUFACTURING DEFECTS BY THERMAL STIMULATION
- Publication number 20200075431
- Publication date Mar 5, 2020
- IMEC vzw
- Kristof J.P. Jacobs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Aligning Micro-Electronic Components
- Publication number 20170186733
- Publication date Jun 29, 2017
- IMEC vzw
- Vikas Dubey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Producing an Integrated Circuit Device with Enhanced Mec...
- Publication number 20170011956
- Publication date Jan 12, 2017
- IMEC vzw
- Ingrid DE WOLF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR INSPECTION OF A SEMICONDUCTOR DEVICE
- Publication number 20170005018
- Publication date Jan 5, 2017
- IMEC vzw
- Ingrid De Wolf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LOCK IN THERMAL LASER STIMULATION THROUGH ONE SIDE OF THE DEVICE WH...
- Publication number 20150338458
- Publication date Nov 26, 2015
- DCG SYSTEMS, INC.
- Herve Deslandes
- G01 - MEASURING TESTING
Information Patent Application
Method for Aligning Micro-Electronic Components
- Publication number 20150179605
- Publication date Jun 25, 2015
- IMEC vzw
- Vikas Dubey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LOCK IN THERMAL LASER STIMULATION THROUGH ONE SIDE OF THE DEVICE WH...
- Publication number 20140210994
- Publication date Jul 31, 2014
- DCG Systems, Inc.
- Herve Deslandes
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR REDUCING SUBSTRATE CHARGING
- Publication number 20120279837
- Publication date Nov 8, 2012
- Katholieke Universiteit Leuven
- Ingrid De Wolf
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Semiconductor device and method of producing the same
- Publication number 20070040281
- Publication date Feb 22, 2007
- Hirokazu Nakayama
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Ingrid De Wolf

Person

Patents Grantslast 30 patents

Method for the electrical bonding of semiconductor components

Method of detecting manufacturing defects by thermal stimulation

Method for aligning micro-electronic components

Method for aligning micro-electronic components

Lock in thermal laser stimulation through one side of the device wh...

Lock in thermal laser stimulation through one side of the device wh...

Method for reducing substrate charging

Emission microscope and method for continuous wavelength spectroscopy

Patents Applicationslast 30 patents

METHOD FOR THE ELECTRICAL BONDING OF SEMICONDUCTOR COMPONENTS

METHOD OF DETECTING MANUFACTURING DEFECTS BY THERMAL STIMULATION

Method for Aligning Micro-Electronic Components

Method for Producing an Integrated Circuit Device with Enhanced Mec...

METHOD AND DEVICE FOR INSPECTION OF A SEMICONDUCTOR DEVICE

LOCK IN THERMAL LASER STIMULATION THROUGH ONE SIDE OF THE DEVICE WH...

Method for Aligning Micro-Electronic Components

LOCK IN THERMAL LASER STIMULATION THROUGH ONE SIDE OF THE DEVICE WH...

METHOD FOR REDUCING SUBSTRATE CHARGING

Semiconductor device and method of producing the same