Ira G. Pollock

Person

Hillsboro, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Automatic probe ground connection checking techniques
- Patent number 11,454,651
- Issue date Sep 27, 2022
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Automatic probe ground connection checking techniques
- Patent number 11,249,111
- Issue date Feb 15, 2022
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Probe tip and probe assembly
- Patent number 10,241,133
- Issue date Mar 26, 2019
- Tektronix, Inc.
- Julie A. Campbell
- G05 - CONTROLLING REGULATING
Information Patent Grant
Test and measurement probe with adjustable test point contact
- Patent number 10,168,356
- Issue date Jan 1, 2019
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Tri-mode probe with automatic skew adjustment
- Patent number 10,145,822
- Issue date Dec 4, 2018
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
High impedance compliant probe tip
- Patent number 10,119,992
- Issue date Nov 6, 2018
- Tektronix, Inc.
- William A. Hagerup
- G01 - MEASURING TESTING
Information Patent Grant
Automatic probe ground connection checking techniques
- Patent number 10,041,975
- Issue date Aug 7, 2018
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
High impedance compliant probe tip
- Patent number 9,810,715
- Issue date Nov 7, 2017
- Tektronix, Inc.
- Julie A. Campbell
- G05 - CONTROLLING REGULATING
Information Patent Grant
High performance LIGA spring interconnect system for probing applic...
- Patent number 9,568,499
- Issue date Feb 14, 2017
- Tektronix, Inc.
- James H. McGrath
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automatic probe ground connection checking techniques
- Patent number 9,194,888
- Issue date Nov 24, 2015
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
High performance multiport connector system using LIGA springs
- Patent number 9,142,903
- Issue date Sep 22, 2015
- Tektronix, Inc.
- James H. McGrath
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Signal acquisition system having reduced probe loading of a device...
- Patent number 8,810,258
- Issue date Aug 19, 2014
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Grant
Signal acquisition system having a compensation digital filter
- Patent number 8,791,706
- Issue date Jul 29, 2014
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Grant
Signal acquisition system having reduced probe loading of a device...
- Patent number 8,723,530
- Issue date May 13, 2014
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Grant
Signal acquisition system having reduced probe loading of a device...
- Patent number 8,564,308
- Issue date Oct 22, 2013
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Grant
Signal acquisition system having probe cable termination in a signa...
- Patent number 8,456,173
- Issue date Jun 4, 2013
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Signal acquisition system having reduced probe loading of a device...
- Patent number 8,436,624
- Issue date May 7, 2013
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Grant
Signal acquisition system having a compensation digital filter
- Patent number 8,278,940
- Issue date Oct 2, 2012
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing probe with printed tip
- Patent number 8,091,225
- Issue date Jan 10, 2012
- Tektronix, Inc.
- Leonard A. Roland
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and apparatus for probing
- Patent number 8,067,718
- Issue date Nov 29, 2011
- Tektronix, Inc.
- Robert A. Nordstrom
- G01 - MEASURING TESTING
Information Patent Grant
Probe with printed tip
- Patent number 7,940,067
- Issue date May 10, 2011
- Tektronix, Inc.
- Leonard A. Roland
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Probing adapter for a signal acquisition probe having pivoting, com...
- Patent number 7,592,822
- Issue date Sep 22, 2009
- Tektronix, Inc.
- Gary W. Reed
- G01 - MEASURING TESTING
Information Patent Grant
Wide bandwidth attenuator input circuit for a measurement probe
- Patent number 7,550,962
- Issue date Jun 23, 2009
- Tektronix, Inc.
- Ira G. Pollock
- G01 - MEASURING TESTING
Information Patent Grant
Wide bandwidth attenuator input circuit for a measurement probe
- Patent number 7,402,991
- Issue date Jul 22, 2008
- Tektronix, Inc.
- Ira G. Pollock
- G01 - MEASURING TESTING
Information Patent Grant
Wide bandwidth attenuator input circuit for a measurement probe
- Patent number 7,256,575
- Issue date Aug 14, 2007
- Tektronix, Inc.
- Ira G. Pollock
- G01 - MEASURING TESTING
Information Patent Grant
Differential termination attenuator network for a measurement probe...
- Patent number 7,164,994
- Issue date Jan 16, 2007
- Tektronix, Inc.
- Richard A. Van Epps
- G01 - MEASURING TESTING
Information Patent Grant
Differential termination and attenuator network for a measurement p...
- Patent number 7,164,995
- Issue date Jan 16, 2007
- Tektronix, Inc.
- Ira G. Pollock
- G01 - MEASURING TESTING
Information Patent Grant
Differential termination and attenuator network for a measurement p...
- Patent number 7,162,375
- Issue date Jan 9, 2007
- Tektronix, Inc.
- Richard A. Van Epps
- G01 - MEASURING TESTING
Information Patent Grant
Attachable/detachable probing tip system for a measurement probing...
- Patent number 7,056,134
- Issue date Jun 6, 2006
- Tektronix, Inc.
- Jim L. Martin
- G01 - MEASURING TESTING
Information Patent Grant
Test vector definition system employing template concept
- Patent number 4,860,291
- Issue date Aug 22, 1989
- Tektronix, Inc.
- Wendell W. Damm
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Automatic Probe Ground Connection Checking Techniques
- Publication number 20210088553
- Publication date Mar 25, 2021
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
Automatic Probe Ground Connection Checking Techniques
- Publication number 20180313870
- Publication date Nov 1, 2018
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
PROBE TIP AND PROBE ASSEMBLY
- Publication number 20180059139
- Publication date Mar 1, 2018
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT PROBE WITH ADJUSTABLE TEST POINT CONTACT
- Publication number 20170052216
- Publication date Feb 23, 2017
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Application
HIGH IMPEDANCE COMPLIANT PROBE TIP
- Publication number 20160291054
- Publication date Oct 6, 2016
- Tektronix, Inc.
- William A. Hagerup
- G01 - MEASURING TESTING
Information Patent Application
HIGH IMPEDANCE COMPLIANT PROBE TIP
- Publication number 20160187382
- Publication date Jun 30, 2016
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Application
FAULT DETECTION FOR A FLEXIBLE PROBE TIP
- Publication number 20160178665
- Publication date Jun 23, 2016
- Tektronix, Inc.
- James H. McGrath
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC PROBE GROUND CONNECTION CHECKING TECHNIQUES
- Publication number 20160077128
- Publication date Mar 17, 2016
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
TRI-MODE PROBE WITH AUTOMATIC SKEW ADJUSTMENT
- Publication number 20160033455
- Publication date Feb 4, 2016
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
HIGH PERFORMANCE LIGA SPRING INTERCONNECT SYSTEM FOR PROBING APPLIC...
- Publication number 20150145545
- Publication date May 28, 2015
- Tektronix, Inc.
- James H. McGrath
- G01 - MEASURING TESTING
Information Patent Application
HIGH PERFORMANCE MULTIPORT CONNECTOR SYSTEM USING LIGA SPRINGS
- Publication number 20150147922
- Publication date May 28, 2015
- Tektronix, Inc.
- James H. McGrath
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC PROBE GROUND CONNECTION CHECKING TECHNIQUES
- Publication number 20140103951
- Publication date Apr 17, 2014
- Daniel G. KNIERIM
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL ACQUISITION SYSTEM HAVING REDUCED PROBE LOADING OF A DEVICE...
- Publication number 20130221985
- Publication date Aug 29, 2013
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Application
Signal Acquisition System Having Reduced Probe Loading of a Device...
- Publication number 20130134999
- Publication date May 30, 2013
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Application
Signal Acquisition System Having a Compensation Digital Filter
- Publication number 20120268140
- Publication date Oct 25, 2012
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Application
PROBE WITH PRINTED TIP
- Publication number 20110121849
- Publication date May 26, 2011
- Tektronix, Inc.
- Leonard A. ROLAND
- G01 - MEASURING TESTING
Information Patent Application
Signal Acquisition System Having a Compensation Digital Filter
- Publication number 20110074391
- Publication date Mar 31, 2011
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Application
Low Capacitance Signal Acquisition System
- Publication number 20110074441
- Publication date Mar 31, 2011
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Application
Signal Acquisition System Having Reduced Probe Loading of a Device...
- Publication number 20110074392
- Publication date Mar 31, 2011
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Application
Signal Acquisition System Having Probe Cable Termination in a Signa...
- Publication number 20110074389
- Publication date Mar 31, 2011
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
Signal Acquisition System Having Reduced Probe Loading of a Device...
- Publication number 20110074390
- Publication date Mar 31, 2011
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Application
PROBE WITH PRINTED TIP
- Publication number 20100060304
- Publication date Mar 11, 2010
- Tektronix, Inc.
- Leonard A. ROLAND
- G01 - MEASURING TESTING
Information Patent Application
Probing Adapter for a Signal Acquisition Probe
- Publication number 20090153159
- Publication date Jun 18, 2009
- Tektronix, Inc.
- Gary W. Reed
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for probing
- Publication number 20070257025
- Publication date Nov 8, 2007
- Robert A. Nordstrom
- G01 - MEASURING TESTING
Information Patent Application
Wide Bandwidth Attenuator Input Circuit for a Measurement Probe
- Publication number 20070164730
- Publication date Jul 19, 2007
- Ira G. Pollock
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Wide Bandwidth Attenuator Input Circuit for a Measurement Probe
- Publication number 20070164731
- Publication date Jul 19, 2007
- Ira G. Pollock
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Wide bandwidth attenuator input circuit for a measurement probe
- Publication number 20060284681
- Publication date Dec 21, 2006
- Ira G. Pollock
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Differential termination attenuator network for a measurement probe...
- Publication number 20060176030
- Publication date Aug 10, 2006
- Richard A. Van Epps
- G01 - MEASURING TESTING
Information Patent Application
Differential termination and attenuator network for a measurement p...
- Publication number 20060176074
- Publication date Aug 10, 2006
- Richard A. Van Epps
- G01 - MEASURING TESTING
Information Patent Application
Differential termination and attenuator network for a measurement p...
- Publication number 20060178846
- Publication date Aug 10, 2006
- Ira G. Pollock
- G01 - MEASURING TESTING

Ira G. Pollock

Person

Patents Grantslast 30 patents

Automatic probe ground connection checking techniques

Automatic probe ground connection checking techniques

Probe tip and probe assembly

Test and measurement probe with adjustable test point contact

Tri-mode probe with automatic skew adjustment

High impedance compliant probe tip

Automatic probe ground connection checking techniques

High impedance compliant probe tip

High performance LIGA spring interconnect system for probing applic...

Automatic probe ground connection checking techniques

High performance multiport connector system using LIGA springs

Signal acquisition system having reduced probe loading of a device...

Signal acquisition system having a compensation digital filter

Signal acquisition system having reduced probe loading of a device...

Signal acquisition system having reduced probe loading of a device...

Signal acquisition system having probe cable termination in a signa...

Signal acquisition system having reduced probe loading of a device...

Signal acquisition system having a compensation digital filter

Method of manufacturing probe with printed tip

Method and apparatus for probing

Probe with printed tip

Probing adapter for a signal acquisition probe having pivoting, com...

Wide bandwidth attenuator input circuit for a measurement probe

Wide bandwidth attenuator input circuit for a measurement probe

Wide bandwidth attenuator input circuit for a measurement probe

Differential termination attenuator network for a measurement probe...

Differential termination and attenuator network for a measurement p...

Differential termination and attenuator network for a measurement p...

Attachable/detachable probing tip system for a measurement probing...

Test vector definition system employing template concept

Patents Applicationslast 30 patents

Automatic Probe Ground Connection Checking Techniques

Automatic Probe Ground Connection Checking Techniques

PROBE TIP AND PROBE ASSEMBLY

TEST AND MEASUREMENT PROBE WITH ADJUSTABLE TEST POINT CONTACT

HIGH IMPEDANCE COMPLIANT PROBE TIP

HIGH IMPEDANCE COMPLIANT PROBE TIP

FAULT DETECTION FOR A FLEXIBLE PROBE TIP

AUTOMATIC PROBE GROUND CONNECTION CHECKING TECHNIQUES

TRI-MODE PROBE WITH AUTOMATIC SKEW ADJUSTMENT

HIGH PERFORMANCE LIGA SPRING INTERCONNECT SYSTEM FOR PROBING APPLIC...

HIGH PERFORMANCE MULTIPORT CONNECTOR SYSTEM USING LIGA SPRINGS

AUTOMATIC PROBE GROUND CONNECTION CHECKING TECHNIQUES

SIGNAL ACQUISITION SYSTEM HAVING REDUCED PROBE LOADING OF A DEVICE...

Signal Acquisition System Having Reduced Probe Loading of a Device...

Signal Acquisition System Having a Compensation Digital Filter

PROBE WITH PRINTED TIP

Signal Acquisition System Having a Compensation Digital Filter

Low Capacitance Signal Acquisition System

Signal Acquisition System Having Reduced Probe Loading of a Device...

Signal Acquisition System Having Probe Cable Termination in a Signa...

Signal Acquisition System Having Reduced Probe Loading of a Device...

PROBE WITH PRINTED TIP

Probing Adapter for a Signal Acquisition Probe

Method and apparatus for probing

Wide Bandwidth Attenuator Input Circuit for a Measurement Probe

Wide Bandwidth Attenuator Input Circuit for a Measurement Probe

Wide bandwidth attenuator input circuit for a measurement probe

Differential termination attenuator network for a measurement probe...

Differential termination and attenuator network for a measurement p...

Differential termination and attenuator network for a measurement p...