Ira Harris Leventhal

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Shielded socket and carrier for high-volume test of semiconductor d...
- Patent number 12,203,958
- Issue date Jan 21, 2025
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for multidimensional dynamic part average testing
- Patent number 12,007,428
- Issue date Jun 11, 2024
- Advantest Corporation
- Kenneth Butler
- G01 - MEASURING TESTING
Information Patent Grant
Thermal solution for massively parallel testing
- Patent number 11,940,487
- Issue date Mar 26, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Shielded socket and carrier for high-volume test of semiconductor d...
- Patent number 11,821,913
- Issue date Nov 21, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Passive carrier-based device delivery for slot-based high-volume se...
- Patent number 11,808,812
- Issue date Nov 7, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Carrier based high volume system level testing of devices with pop...
- Patent number 11,742,055
- Issue date Aug 29, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G11 - INFORMATION STORAGE
Information Patent Grant
Carrier based high volume system level testing of devices with pop...
- Patent number 11,587,640
- Issue date Feb 21, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Thermal solution for massively parallel testing
- Patent number 11,549,981
- Issue date Jan 10, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Examination apparatus, examination method, recording medium storing...
- Patent number 11,244,443
- Issue date Feb 8, 2022
- Advantest Corporation
- Kosuke Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated validation and calibration portable test systems and methods
- Patent number 10,701,571
- Issue date Jun 30, 2020
- w2bi, Inc.
- Dinesh Doshi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Automated configurable portable test systems and methods
- Patent number 10,681,570
- Issue date Jun 9, 2020
- w2bi, Inc.
- Dinesh Doshi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Local portable test systems and methods
- Patent number 10,548,033
- Issue date Jan 28, 2020
- w2bi, Inc.
- Dinesh Doshi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Methodology of using the various capabilities of the smart box to p...
- Patent number 10,530,499
- Issue date Jan 7, 2020
- w2bi, Inc.
- Derek Diperna
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Smart box for automatic feature testing of smart phones and other d...
- Patent number 10,491,314
- Issue date Nov 26, 2019
- w2bi, Inc.
- Derek Diperna
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Smart box for automatic feature testing of smart phones and other d...
- Patent number 10,432,328
- Issue date Oct 1, 2019
- w2bi, Inc.
- Derek Diperna
- G05 - CONTROLLING REGULATING
Information Patent Grant
Cloud-based services for management of cell-based test systems
- Patent number 10,251,079
- Issue date Apr 2, 2019
- w2bi, Inc.
- Dinesh Doshi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Methodology of using the various capabilities of the smart box to p...
- Patent number 10,171,184
- Issue date Jan 1, 2019
- w2bi, Inc.
- Derek Diperna
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device profile-driven automation for cell-based test systems
- Patent number 10,158,552
- Issue date Dec 18, 2018
- w2bi, Inc.
- Dinesh Doshi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Smart box for automatic feature testing of smart phones and other d...
- Patent number 10,020,899
- Issue date Jul 10, 2018
- w2bi, Inc.
- Derek Diperna
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Smart box for automatic feature testing of smart phones and other d...
- Patent number 9,948,411
- Issue date Apr 17, 2018
- W2BI, INC.
- Derek Diperna
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Pseudo tester-per-site functionality on natively tester-per-pin aut...
- Patent number 9,606,183
- Issue date Mar 28, 2017
- Advantest Corporation
- Gerald Moon
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for massively parallel multi-wafer test
- Patent number 9,335,347
- Issue date May 10, 2016
- Advantest Corporation
- John W. Andberg
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SHIELDED SOCKET AND CARRIER FOR HIGH-VOLUME TEST OF SEMICONDUCTOR D...
- Publication number 20240027492
- Publication date Jan 25, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Application
PASSIVE CARRIER-BASED DEVICE DELIVERY FOR SLOT-BASED HIGH-VOLUME SE...
- Publication number 20230314512
- Publication date Oct 5, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Application
THERMAL SOLUTION FOR MASSIVELY PARALLEL TESTING
- Publication number 20230228812
- Publication date Jul 20, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Application
CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...
- Publication number 20230197185
- Publication date Jun 22, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEMS AND METHODS FOR MULTIDIMENSIONAL DYNAMIC PART AVERAGE TESTING
- Publication number 20230111543
- Publication date Apr 13, 2023
- Kenneth Butler
- G01 - MEASURING TESTING
Information Patent Application
CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...
- Publication number 20230062440
- Publication date Mar 2, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G11 - INFORMATION STORAGE
Information Patent Application
CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...
- Publication number 20220284982
- Publication date Sep 8, 2022
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G11 - INFORMATION STORAGE
Information Patent Application
SHIELDED SOCKET AND CARRIER FOR HIGH-VOLUME TEST OF SEMICONDUCTOR D...
- Publication number 20220137092
- Publication date May 5, 2022
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Application
PASSIVE CARRIER-BASED DEVICE DELIVERY FOR SLOT-BASED HIGH-VOLUME SE...
- Publication number 20220137129
- Publication date May 5, 2022
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Application
THERMAL SOLUTION FOR MASSIVELY PARALLEL TESTING
- Publication number 20220107360
- Publication date Apr 7, 2022
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Application
EXAMINATION APPARATUS, EXAMINATION METHOD, RECORDING MEDIUM STORING...
- Publication number 20210027443
- Publication date Jan 28, 2021
- Advantest Corporation
- Kosuke IKEDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODOLOGY OF USING THE VARIOUS CAPABILITIES OF THE SMART BOX TO P...
- Publication number 20190020423
- Publication date Jan 17, 2019
- w2bi, Inc.
- DEREK DIPERNA
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
SMART BOX FOR AUTOMATIC FEATURE TESTING OF SMART PHONES AND OTHER D...
- Publication number 20180316443
- Publication date Nov 1, 2018
- w2bi, Inc.
- DEREK DIPERNA
- G05 - CONTROLLING REGULATING
Information Patent Application
DEVICE PROFILE-DRIVEN AUTOMATION FOR CELL-BASED TEST SYSTEMS
- Publication number 20180048555
- Publication date Feb 15, 2018
- w2bi, Inc.
- Dinesh Doshi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
AUTOMATED CONFIGURABLE PORTABLE TEST SYSTEMS AND METHODS
- Publication number 20180049051
- Publication date Feb 15, 2018
- w2bi, Inc.
- Dinesh Doshi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
LOCAL PORTABLE TEST SYSTEMS AND METHODS
- Publication number 20180049052
- Publication date Feb 15, 2018
- w2bi, Inc.
- Dinesh Doshi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
AUTOMATED VALIDATION AND CALIBRATION PORTABLE TEST SYSTEMS AND METHODS
- Publication number 20180049050
- Publication date Feb 15, 2018
- w2bi, Inc.
- Dinesh Doshi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
CLOUD-BASED SERVICES FOR MANAGEMENT OF CELL-BASED TEST SYSTEMS
- Publication number 20180049054
- Publication date Feb 15, 2018
- w2bi, Inc.
- Dinesh Doshi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SMART BOX FOR AUTOMATIC FEATURE TESTING OF SMART PHONES AND OTHER D...
- Publication number 20160337053
- Publication date Nov 17, 2016
- w2bi, Inc.
- DEREK DIPERNA
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
SMART BOX FOR AUTOMATIC FEATURE TESTING OF SMART PHONES AND OTHER D...
- Publication number 20160187877
- Publication date Jun 30, 2016
- w2bi, Inc.
- Derek DIPERNA
- G01 - MEASURING TESTING
Information Patent Application
METHODOLOGY OF USING THE VARIOUS CAPABILITIES OF THE SMART BOX TO P...
- Publication number 20160192213
- Publication date Jun 30, 2016
- w2bi, Inc.
- DEREK DIPERNA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SMART BOX FOR AUTOMATIC FEATURE TESTING OF SMART PHONES AND OTHER D...
- Publication number 20160187876
- Publication date Jun 30, 2016
- w2bi, Inc.
- Derek DIPERNA
- G01 - MEASURING TESTING
Information Patent Application
PSEUDO TESTER-PER-SITE FUNCTIONALITY ON NATIVELY TESTER-PER-PIN AUT...
- Publication number 20140114603
- Publication date Apr 24, 2014
- Gerald Moon
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MASSIVELY PARALLEL MULTI-WAFER TEST
- Publication number 20140070828
- Publication date Mar 13, 2014
- John W. Andberg
- G01 - MEASURING TESTING

Ira Harris Leventhal

Person

Patents Grantslast 30 patents

Shielded socket and carrier for high-volume test of semiconductor d...

Systems and methods for multidimensional dynamic part average testing

Thermal solution for massively parallel testing

Shielded socket and carrier for high-volume test of semiconductor d...

Passive carrier-based device delivery for slot-based high-volume se...

Carrier based high volume system level testing of devices with pop...

Carrier based high volume system level testing of devices with pop...

Thermal solution for massively parallel testing

Examination apparatus, examination method, recording medium storing...

Automated validation and calibration portable test systems and methods

Automated configurable portable test systems and methods

Local portable test systems and methods

Methodology of using the various capabilities of the smart box to p...

Smart box for automatic feature testing of smart phones and other d...

Smart box for automatic feature testing of smart phones and other d...

Cloud-based services for management of cell-based test systems

Methodology of using the various capabilities of the smart box to p...

Device profile-driven automation for cell-based test systems

Smart box for automatic feature testing of smart phones and other d...

Smart box for automatic feature testing of smart phones and other d...

Pseudo tester-per-site functionality on natively tester-per-pin aut...

Method and apparatus for massively parallel multi-wafer test

Patents Applicationslast 30 patents

SHIELDED SOCKET AND CARRIER FOR HIGH-VOLUME TEST OF SEMICONDUCTOR D...

PASSIVE CARRIER-BASED DEVICE DELIVERY FOR SLOT-BASED HIGH-VOLUME SE...

THERMAL SOLUTION FOR MASSIVELY PARALLEL TESTING

CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...

SYSTEMS AND METHODS FOR MULTIDIMENSIONAL DYNAMIC PART AVERAGE TESTING

CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...

CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP...

SHIELDED SOCKET AND CARRIER FOR HIGH-VOLUME TEST OF SEMICONDUCTOR D...

PASSIVE CARRIER-BASED DEVICE DELIVERY FOR SLOT-BASED HIGH-VOLUME SE...

THERMAL SOLUTION FOR MASSIVELY PARALLEL TESTING

EXAMINATION APPARATUS, EXAMINATION METHOD, RECORDING MEDIUM STORING...

METHODOLOGY OF USING THE VARIOUS CAPABILITIES OF THE SMART BOX TO P...

SMART BOX FOR AUTOMATIC FEATURE TESTING OF SMART PHONES AND OTHER D...

DEVICE PROFILE-DRIVEN AUTOMATION FOR CELL-BASED TEST SYSTEMS

AUTOMATED CONFIGURABLE PORTABLE TEST SYSTEMS AND METHODS

LOCAL PORTABLE TEST SYSTEMS AND METHODS

AUTOMATED VALIDATION AND CALIBRATION PORTABLE TEST SYSTEMS AND METHODS

CLOUD-BASED SERVICES FOR MANAGEMENT OF CELL-BASED TEST SYSTEMS

SMART BOX FOR AUTOMATIC FEATURE TESTING OF SMART PHONES AND OTHER D...

SMART BOX FOR AUTOMATIC FEATURE TESTING OF SMART PHONES AND OTHER D...

METHODOLOGY OF USING THE VARIOUS CAPABILITIES OF THE SMART BOX TO P...

SMART BOX FOR AUTOMATIC FEATURE TESTING OF SMART PHONES AND OTHER D...

PSEUDO TESTER-PER-SITE FUNCTIONALITY ON NATIVELY TESTER-PER-PIN AUT...

METHOD AND APPARATUS FOR MASSIVELY PARALLEL MULTI-WAFER TEST