Isao Nagaoki

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electron microscope and sample observation method
- Patent number 10,083,814
- Issue date Sep 25, 2018
- Hitachi High-Technologies Corporation
- Isao Nagaoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample holder and charged particle device
- Patent number 9,721,752
- Issue date Aug 1, 2017
- Hitachi High-Technologies Corporation
- Yasuhira Nagakubo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged corpuscular ray apparatus
- Patent number 8,928,485
- Issue date Jan 6, 2015
- Hitachi High-Technologies Corporation
- Hideki Kikuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope and sample observation method
- Patent number 8,586,922
- Issue date Nov 19, 2013
- Hitachi High-Technologies Corporation
- Isao Nagaoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 8,426,811
- Issue date Apr 23, 2013
- Hitachi High-Technologies Corporation
- Isao Nagaoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 8,288,725
- Issue date Oct 16, 2012
- Hitachi High-Technologies Corporation
- Akiko Fujisawa
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscopy
- Patent number 8,044,352
- Issue date Oct 25, 2011
- Hitachi High-Technologies Corporation
- Kotaro Hosoya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number D636005
- Issue date Apr 12, 2011
- Hitachi High-Technologies Corporation
- Mitsuru Oonuma
- D16 - Photography and optical equipment
Information Patent Grant
Image forming method and electron microscope
- Patent number 7,838,834
- Issue date Nov 23, 2010
- Hitachi High-Technologies Corporation
- Isao Nagaoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 7,838,829
- Issue date Nov 23, 2010
- Hitachi High-Technologies Corporation
- Akiko Fujisawa
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for observing a specimen in a field of view of an...
- Patent number 7,544,936
- Issue date Jun 9, 2009
- Hitachi, Ltd.
- Hiromi Inada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sample observation method and transmission electron microscope
- Patent number 7,214,938
- Issue date May 8, 2007
- Hitachi Science Systems, Ltd.
- Eiko Nakazawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for observing a specimen in a field of view of an...
- Patent number 7,164,129
- Issue date Jan 16, 2007
- Hitachi, Ltd.
- Hiromi Inada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron microscope
- Patent number 7,041,977
- Issue date May 9, 2006
- Hitachi, Ltd.
- Eiko Nakazawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for observing a specimen in a field of view of an...
- Patent number 7,022,989
- Issue date Apr 4, 2006
- Hitachi, Ltd.
- Hiromi Inada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for observing a specimen in a field of view of an...
- Patent number 7,012,254
- Issue date Mar 14, 2006
- Hitachi, Ltd.
- Hiromi Inada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sample observation method and transmission electron microscope
- Patent number 6,982,420
- Issue date Jan 3, 2006
- Hitachi Science Systems Ltd.
- Eiko Nakazawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron microscope
- Patent number 6,888,139
- Issue date May 3, 2005
- Hitachi, Ltd.
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for observing a specimen in a field of view of an...
- Patent number 6,878,934
- Issue date Apr 12, 2005
- Hitachi, Ltd.
- Hiromi Inada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron microscope and means to set observation conditions
- Patent number 6,875,983
- Issue date Apr 5, 2005
- Hitachi, Ltd.
- Eiko Nakazawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of observing a sample by a transmission electron microscope
- Patent number 6,777,679
- Issue date Aug 17, 2004
- Hitachi High-Technologies Corporation
- Isao Nagaoki
- G01 - MEASURING TESTING
Information Patent Grant
Autoadjusting electron microscope
- Patent number 6,570,156
- Issue date May 27, 2003
- Hitachi, Ltd.
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 6,472,663
- Issue date Oct 29, 2002
- Hitachi, Ltd.
- Isao Nagaoki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM APPARATUS, ELECTRON MICROSCOPE AND SAMPLE OBS...
- Publication number 20170323762
- Publication date Nov 9, 2017
- Hitachi High-Technologies Corporation
- Toshiyuki OOYAGI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE HOLDER FOR CHARGED PARTICLE BEAM DEVICE, AND CHARGED PARTICL...
- Publication number 20170018397
- Publication date Jan 19, 2017
- Hitachi High-Technologies Corporation
- Yuya SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
Sample Holder and Charged Particle Device
- Publication number 20160211109
- Publication date Jul 21, 2016
- Hitachi High-Technologies Corporation
- Yasuhira NAGAKUBO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope and Sample Observation Method
- Publication number 20160064183
- Publication date Mar 3, 2016
- Hitachi High-Technologies Corporation
- Isao NAGAOKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOUNDPROOF COVER FOR CHARGED-PARTICLE BEAM DEVICE, AND CHARGED-PART...
- Publication number 20150041676
- Publication date Feb 12, 2015
- Hitachi High-Technologies Corporation
- Daisuke Muto
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Application
ELECTRON MICROSCOPE
- Publication number 20140103208
- Publication date Apr 17, 2014
- Hitachi High-Technologies Corporation
- Hiroyuki Noda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSMISSION INTERFERENCE MICROSCOPE
- Publication number 20130163076
- Publication date Jun 27, 2013
- Isao Nagaoki
- G02 - OPTICS
Information Patent Application
ELECTRON MICROSCOPE, AND METHOD FOR ADJUSTNG OPTICAL AXIS OF ELECTR...
- Publication number 20130062519
- Publication date Mar 14, 2013
- Toshiyuki Oyagi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transmission Electron Microscope and Sample Observation Method
- Publication number 20120235035
- Publication date Sep 20, 2012
- Hitachi High-Technologies Corporation
- Isao Nagaoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING CHARGED PARTICLE MICROSCOPE
- Publication number 20110254944
- Publication date Oct 20, 2011
- Tohru Ishitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE
- Publication number 20110133084
- Publication date Jun 9, 2011
- Isao Nagaoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED CORPUSCULAR RAY APPARATUS
- Publication number 20110115637
- Publication date May 19, 2011
- Hideki Kikuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20110062327
- Publication date Mar 17, 2011
- Hitachi High-Technologies Corporation
- Akiko FUJISAWA
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON MICROSCOPY
- Publication number 20090242792
- Publication date Oct 1, 2009
- Hitachi High-Technologies Corporation
- KOTARO HOSOYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20080224037
- Publication date Sep 18, 2008
- Hitachi High-Technologies Corporation
- Akiko FUJISAWA
- G01 - MEASURING TESTING
Information Patent Application
Image Forming Method and Electron Microscope
- Publication number 20080224040
- Publication date Sep 18, 2008
- Hitachi High-Technologies Corporation
- Isao Nagaoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning Transmission Charged Particle Beam Device
- Publication number 20080197282
- Publication date Aug 21, 2008
- Hitachi High-Technologies Corporation
- Yoshihiko Nakayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and device for observing a specimen in a field of view of an...
- Publication number 20070176103
- Publication date Aug 2, 2007
- Hiromi Inada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and device for observing a specimen in a field of view of an...
- Publication number 20060097169
- Publication date May 11, 2006
- Hiromi Inada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Sample observation method and transmission electron microscope
- Publication number 20060011838
- Publication date Jan 19, 2006
- Eiko Nakazawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Electron microscope
- Publication number 20050145792
- Publication date Jul 7, 2005
- Eiko Nakazawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and device for observing a specimen in a field of view of an...
- Publication number 20050035293
- Publication date Feb 17, 2005
- Hiromi Inada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and device for observing a specimen in a field of view of an...
- Publication number 20040173749
- Publication date Sep 9, 2004
- Hiromi Inada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Sample observation method and transmission electron microscope
- Publication number 20040114788
- Publication date Jun 17, 2004
- Eiko Nakazawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Electron microscope
- Publication number 20030201393
- Publication date Oct 30, 2003
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of observing a sample by a transmission electron microscope
- Publication number 20030183762
- Publication date Oct 2, 2003
- Isao Nagaoki
- G01 - MEASURING TESTING
Information Patent Application
Electron microscope
- Publication number 20020175282
- Publication date Nov 28, 2002
- Eiko Nakazawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE
- Publication number 20020033451
- Publication date Mar 21, 2002
- ISAO NAGAOKI
- G01 - MEASURING TESTING
Information Patent Application
Method and device for observing a specimen in a field of view of an...
- Publication number 20020027199
- Publication date Mar 7, 2002
- Hiromi Inada
- G01 - MEASURING TESTING

Isao Nagaoki

Person

Patents Grantslast 30 patents

Electron microscope and sample observation method

Sample holder and charged particle device

Charged corpuscular ray apparatus

Transmission electron microscope and sample observation method

Electron microscope

Charged particle beam device

Electron microscopy

Electron microscope

Image forming method and electron microscope

Charged particle beam device

Method and device for observing a specimen in a field of view of an...

Sample observation method and transmission electron microscope

Method and device for observing a specimen in a field of view of an...

Electron microscope

Method and device for observing a specimen in a field of view of an...

Method and device for observing a specimen in a field of view of an...

Sample observation method and transmission electron microscope

Electron microscope

Method and device for observing a specimen in a field of view of an...

Electron microscope and means to set observation conditions

Method of observing a sample by a transmission electron microscope

Autoadjusting electron microscope

Electron microscope

Patents Applicationslast 30 patents

CHARGED PARTICLE BEAM APPARATUS, ELECTRON MICROSCOPE AND SAMPLE OBS...

SAMPLE HOLDER FOR CHARGED PARTICLE BEAM DEVICE, AND CHARGED PARTICL...

Sample Holder and Charged Particle Device

Electron Microscope and Sample Observation Method

SOUNDPROOF COVER FOR CHARGED-PARTICLE BEAM DEVICE, AND CHARGED-PART...

ELECTRON MICROSCOPE

TRANSMISSION INTERFERENCE MICROSCOPE

ELECTRON MICROSCOPE, AND METHOD FOR ADJUSTNG OPTICAL AXIS OF ELECTR...

Transmission Electron Microscope and Sample Observation Method

SCANNING CHARGED PARTICLE MICROSCOPE

ELECTRON MICROSCOPE

CHARGED CORPUSCULAR RAY APPARATUS

Charged Particle Beam Device

ELECTRON MICROSCOPY

Charged Particle Beam Device

Image Forming Method and Electron Microscope

Scanning Transmission Charged Particle Beam Device

Method and device for observing a specimen in a field of view of an...

Method and device for observing a specimen in a field of view of an...

Sample observation method and transmission electron microscope

Electron microscope

Method and device for observing a specimen in a field of view of an...

Method and device for observing a specimen in a field of view of an...

Sample observation method and transmission electron microscope

Electron microscope

Method of observing a sample by a transmission electron microscope

Electron microscope

ELECTRON MICROSCOPE

Method and device for observing a specimen in a field of view of an...