Isao Shikata

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Kasugai City, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for inspecting defect of article to be inspected
- Patent number 8,422,014
- Issue date Apr 16, 2013
- NGK Insulators, Ltd.
- Tatsuhiko Hatano
- G01 - MEASURING TESTING
Information Patent Grant
Display device
- Patent number 7,444,052
- Issue date Oct 28, 2008
- NGK Insulators, Ltd.
- Kenichi Iwauchi
- G02 - OPTICS
Information Patent Grant
Optical system of display
- Patent number 6,753,998
- Issue date Jun 22, 2004
- NGK Insulators, Ltd.
- Yukihisa Takeuchi
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR INSPECTING DEFECT OF ARTICLE TO BE INSPECTED
- Publication number 20100201983
- Publication date Aug 12, 2010
- NGK Insulators, Ltd.
- Tatsuhiko Hatano
- G01 - MEASURING TESTING
Information Patent Application
Light source
- Publication number 20060214557
- Publication date Sep 28, 2006
- NGK Insulators, Ltd.
- Iwao Ohwada
- B82 - NANO-TECHNOLOGY
Information Patent Application
Light source
- Publication number 20060214556
- Publication date Sep 28, 2006
- NGK Insulators, Ltd.
- Iwao Ohwada
- B82 - NANO-TECHNOLOGY
Information Patent Application
Display device
- Publication number 20050232573
- Publication date Oct 20, 2005
- Sharp Kabushiki Kaisha
- Kenichi Iwauchi
- G02 - OPTICS
Information Patent Application
Optical system of display
- Publication number 20030063046
- Publication date Apr 3, 2003
- NGK Insulators, Ltd.
- Yukihisa Takeuchi
- G02 - OPTICS
Information Patent Application
Display system with cooling device
- Publication number 20030043091
- Publication date Mar 6, 2003
- NGK Insulators, Ltd.
- Yukihisa Takeuchi
- G02 - OPTICS