Ishtiaq Ahsan

Person

Wappingers Falls, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Post silicide testing for replacement high-k metal gate technologies
- Patent number 8,610,451
- Issue date Dec 17, 2013
- International Business Machines Corporation
- Ishtiaq Ahsan
- G01 - MEASURING TESTING
Information Patent Grant
In-line voltage contrast detection of PFET silicide encroachment
- Patent number 8,039,837
- Issue date Oct 18, 2011
- International Business Machines Corporation
- Oliver D. Patterson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device defect type determination method and structure
- Patent number 7,781,239
- Issue date Aug 24, 2010
- International Business Machines Corporation
- Ishtiaq Ahsan
- G01 - MEASURING TESTING
Information Patent Grant
Test structure for resistive open detection using voltage contrast...
- Patent number 7,733,109
- Issue date Jun 8, 2010
- International Business Machines Corporation
- Ishtiaq Ahsan
- G01 - MEASURING TESTING
Information Patent Grant
Structure and method for monitoring and characterizing pattern dens...
- Patent number 7,719,005
- Issue date May 18, 2010
- International Buriness Machines Corporation
- Ishtiaq Ahsan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure to monitor arcing in the processing steps of metal layer...
- Patent number 7,612,371
- Issue date Nov 3, 2009
- International Business Machines Corporation
- Ishtiaq Ahsan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory array peripheral structures and use
- Patent number 7,515,502
- Issue date Apr 7, 2009
- International Business Machines Corporation
- Ishtiaq Ahsan
- G11 - INFORMATION STORAGE
Information Patent Grant
Determining thermal absorption using ring oscillator
- Patent number 7,408,421
- Issue date Aug 5, 2008
- International Business Machines Corporation
- Ishtiaq Ahsan
- G01 - MEASURING TESTING
Information Patent Grant
Structure for monitoring semiconductor polysilicon gate profile
- Patent number 7,396,694
- Issue date Jul 8, 2008
- International Business Machines Corporation
- Ishtiaq Ahsan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure for monitoring semiconductor polysilicon gate profile
- Patent number 7,135,346
- Issue date Nov 14, 2006
- International Business Machines Corporation
- Ishtiaq Ahsan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Capacitive monitors for detecting metal extrusion during electromig...
- Patent number 7,119,545
- Issue date Oct 10, 2006
- International Business Machines Corporation
- Ishtiaq Ahsan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST STRUCTURE AND METHOD OF TESTING A MICROCHIP
- Publication number 20150294738
- Publication date Oct 15, 2015
- International Business Machines Corporation
- Ishtiaq AHSAN
- G11 - INFORMATION STORAGE
Information Patent Application
POST SILICIDE TESTING FOR REPLACEMENT HIGH-K METAL GATE TECHNOLOGIES
- Publication number 20120119778
- Publication date May 17, 2012
- International Business Machines Corporation
- Ishtiaq Ahsan
- G01 - MEASURING TESTING
Information Patent Application
BODY CONTACT STRUCTURE FOR IN-LINE VOLTAGE CONTRAST DETECTION OF PF...
- Publication number 20100301331
- Publication date Dec 2, 2010
- International Business Machines Corporation
- Oliver D. Patterson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE DEFECT TYPE DETERMINATION METHOD AND STRUCTURE
- Publication number 20090179661
- Publication date Jul 16, 2009
- International Business Machines Corporation
- Ishtiaq Ahsan
- G01 - MEASURING TESTING
Information Patent Application
TEST STRUCTURE AND METHOD FOR RESISTIVE OPEN DETECTION USING VOLTAG...
- Publication number 20090096461
- Publication date Apr 16, 2009
- International Business Machines Corporation
- Ishtiaq Ahsan
- G01 - MEASURING TESTING
Information Patent Application
MEMORY ARRAY PERIPHERAL STRUCTURES AND USE
- Publication number 20090073796
- Publication date Mar 19, 2009
- International Business Machines Corporation
- Ishtiaq Ahsan
- G11 - INFORMATION STORAGE
Information Patent Application
STRUCTURE AND METHOD FOR MONITORING AND CHARACTERIZING PATTERN DENS...
- Publication number 20080185583
- Publication date Aug 7, 2008
- International Business Machines Corporation
- ISHTIAQ AHSAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETERMINING THERMAL ABSORPTION USING RING OSCILLATOR
- Publication number 20080007354
- Publication date Jan 10, 2008
- Ishtiaq Ahsan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
STRUCTURE TO MONITOR ARCING IN THE PROCESSING STEPS OF METAL LAYER...
- Publication number 20070164421
- Publication date Jul 19, 2007
- International Business Machines Corporation
- Ishtiaq Ahsan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE FOR MONITORING SEMICONDUCTOR POLYSILICON GATE PROFILE
- Publication number 20070087593
- Publication date Apr 19, 2007
- International Business Machines Corporation
- Ishtiaq Ahsan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CAPACITIVE MONITORS FOR DETECTING METAL EXTRUSION DURING ELECTROMIG...
- Publication number 20060066314
- Publication date Mar 30, 2006
- International Business Machines Corporation
- Ishtiaq Ahsan
- G01 - MEASURING TESTING
Information Patent Application
Structure for monitoring semiconductor polysilicon gate profile
- Publication number 20060024853
- Publication date Feb 2, 2006
- International Busines Machines Corporation
- Ishtiaq Ahsan
- H01 - BASIC ELECTRIC ELEMENTS

Ishtiaq Ahsan

Person

Patents Grantslast 30 patents

Post silicide testing for replacement high-k metal gate technologies

In-line voltage contrast detection of PFET silicide encroachment

Semiconductor device defect type determination method and structure

Test structure for resistive open detection using voltage contrast...

Structure and method for monitoring and characterizing pattern dens...

Structure to monitor arcing in the processing steps of metal layer...

Memory array peripheral structures and use

Determining thermal absorption using ring oscillator

Structure for monitoring semiconductor polysilicon gate profile

Structure for monitoring semiconductor polysilicon gate profile

Capacitive monitors for detecting metal extrusion during electromig...

Patents Applicationslast 30 patents

TEST STRUCTURE AND METHOD OF TESTING A MICROCHIP

POST SILICIDE TESTING FOR REPLACEMENT HIGH-K METAL GATE TECHNOLOGIES

BODY CONTACT STRUCTURE FOR IN-LINE VOLTAGE CONTRAST DETECTION OF PF...

SEMICONDUCTOR DEVICE DEFECT TYPE DETERMINATION METHOD AND STRUCTURE

TEST STRUCTURE AND METHOD FOR RESISTIVE OPEN DETECTION USING VOLTAG...

MEMORY ARRAY PERIPHERAL STRUCTURES AND USE

STRUCTURE AND METHOD FOR MONITORING AND CHARACTERIZING PATTERN DENS...

DETERMINING THERMAL ABSORPTION USING RING OSCILLATOR

STRUCTURE TO MONITOR ARCING IN THE PROCESSING STEPS OF METAL LAYER...

STRUCTURE FOR MONITORING SEMICONDUCTOR POLYSILICON GATE PROFILE

CAPACITIVE MONITORS FOR DETECTING METAL EXTRUSION DURING ELECTROMIG...

Structure for monitoring semiconductor polysilicon gate profile