IVO W. RANGELOW

Person

BAUNATAL GERMAN, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Coated active cantilever probes for use in topography imaging in op...
- Patent number 11,906,546
- Issue date Feb 20, 2024
- Massachusetts Institute of Technology
- Fangzhou Xia
- G01 - MEASURING TESTING
Information Patent Grant
Substrate for a controlled implantation of ions and method of prepa...
- Patent number 11,798,987
- Issue date Oct 24, 2023
- PARCAN NANOTECH CO., LTD.
- Ivo Rangelow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of aligning a first article relative to a second article
- Patent number 10,025,207
- Issue date Jul 17, 2018
- Universitat Kassel
- Ivo Rangelow
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Compact ion source neutron generator
- Patent number 9,161,429
- Issue date Oct 13, 2015
- The Regents of the University of California
- Thomas Schenkel
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Microscope probe and method for use of same
- Patent number 8,997,258
- Issue date Mar 31, 2015
- National Institute of Standards and Technology
- Vladimir Aksyuk
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for investigating surface properties of differ...
- Patent number 8,689,359
- Issue date Apr 1, 2014
- Nano Analytik GmbH
- Ivo W. Rangelow
- G01 - MEASURING TESTING
Information Patent Grant
Etching radical controlled gas chopped deep reactive ion etching
- Patent number 8,546,264
- Issue date Oct 1, 2013
- The Regents of the University of California
- Deirdre Olynick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for an atomic force microscope for the study and...
- Patent number 8,479,311
- Issue date Jul 2, 2013
- Technische Universitat Ilmenau
- Stefan Kubsky
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for forming a through via in a semiconductor element and sem...
- Patent number 8,466,061
- Issue date Jun 18, 2013
- Infineon Technologies AG
- Stefan Kolb
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for the micromechanical positioning and handling...
- Patent number 8,312,561
- Issue date Nov 13, 2012
- Technische Universitaet Ilmenau
- Ivo W. Rangelow
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Microsystem component with a device deformable under the effect of...
- Patent number 8,128,282
- Issue date Mar 6, 2012
- Universitaet Kassel
- Ivo Rangelow
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Apparatus for aligning a first article relative to a second article
- Patent number 7,946,029
- Issue date May 24, 2011
- Universitat Kassel
- Ivo Rangelow
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Shadow mask and method for producing a shadow mask
- Patent number 7,183,043
- Issue date Feb 27, 2007
- Universitat Kassel
- Jan Meijer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Device and method for maskless AFM microlithography
- Patent number 7,141,808
- Issue date Nov 28, 2006
- Ivo Rangelow
- G11 - INFORMATION STORAGE
Information Patent Grant
Device and method of positionally accurate implantation of individu...
- Patent number 7,126,139
- Issue date Oct 24, 2006
- The Regents of the University of California
- Thomas Schenkel
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
A STEPPER LITHOGRAPHY APPARATUS AND OPERATING METHOD THEREFOR, AND...
- Publication number 20240103373
- Publication date Mar 28, 2024
- Parcan Nanotech Co., Ltd.
- Xiangqian ZHOU
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SUB-NANOSCALE HIGH-PRECISION LITHOGRAPHY WRITING FIELD STITCHING ME...
- Publication number 20230296990
- Publication date Sep 21, 2023
- Parcan Nanotech Co., Ltd.
- Xiangqian ZHOU
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SUBSTRATE FOR A CONTROLLED IMPLANTATION OF IONS AND METHOD OF PREPA...
- Publication number 20220069080
- Publication date Mar 3, 2022
- PARCAN NANOTECH CO., LTD.
- Ivo RANGELOW
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROSCOPE PROBE AND METHOD FOR USE OF SAME
- Publication number 20140338074
- Publication date Nov 13, 2014
- NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
- VLADIMIR AKSYUK
- G01 - MEASURING TESTING
Information Patent Application
COMPACT ION SOURCE NEUTRON GENERATOR
- Publication number 20130044846
- Publication date Feb 21, 2013
- Regents of the University of California
- Thomas Schenkel
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
METHOD OF ALIGNING A FIRST ARTICLE RELATIVE TO A SECOND ARTICLE AND...
- Publication number 20110219635
- Publication date Sep 15, 2011
- Universitat Kassel
- Ivo Rangelow
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR AN ATOMIC FORCE MICROSCOPE FOR THE STUDY AND...
- Publication number 20110055985
- Publication date Mar 3, 2011
- TECHNISCHE UNIVERSITÄT ILMENAU
- Stefan Kubsky
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INVESTIGATING SURFACE PROPERTIES OF DIFFER...
- Publication number 20110047662
- Publication date Feb 24, 2011
- Ivo W. Rangelow
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR THE MICROMECHANICAL POSITIONING AND HANDLING...
- Publication number 20100017921
- Publication date Jan 21, 2010
- TECHNISCHE UNIVERSITAET ILMENAU
- Ivo W. Rangelow
- G01 - MEASURING TESTING
Information Patent Application
MICROSYSTEM COMPONENT WITH A DEVICE DEFORMABLE UNDER THE EFFECT OF...
- Publication number 20090213900
- Publication date Aug 27, 2009
- Ivo Rangelow
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
A METHOD OF ALIGNING A FIRST ARTICLE RELATIVE TO A SECOND ARTICLE A...
- Publication number 20070248892
- Publication date Oct 25, 2007
- Ivo Rangelow
- G01 - MEASURING TESTING
Information Patent Application
ETCHING RADICAL CONTROLLED GAS CHOPPED DEEP REACTIVE ION ETCHING
- Publication number 20070015371
- Publication date Jan 18, 2007
- The Regents of the University of California.
- Deirdre L. Olynick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Measuring system for the combined scanning and analysis of microtec...
- Publication number 20060238206
- Publication date Oct 26, 2006
- SUSS Micro Tec Systems GmbH
- Lukas M Eng
- G01 - MEASURING TESTING
Information Patent Application
Device and method for maskless afm microlithography
- Publication number 20050225011
- Publication date Oct 13, 2005
- Ivo Rangelow
- G01 - MEASURING TESTING
Information Patent Application
Device and method of positionally accurate implantation of individu...
- Publication number 20050077486
- Publication date Apr 14, 2005
- Thomas Schenkel
- B82 - NANO-TECHNOLOGY
Information Patent Application
Shadow mask and method for producing a shadow mask
- Publication number 20040219465
- Publication date Nov 4, 2004
- Jan Meijer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

IVO W. RANGELOW

Person

Patents Grantslast 30 patents

Coated active cantilever probes for use in topography imaging in op...

Substrate for a controlled implantation of ions and method of prepa...

Method of aligning a first article relative to a second article

Compact ion source neutron generator

Microscope probe and method for use of same

Apparatus and method for investigating surface properties of differ...

Etching radical controlled gas chopped deep reactive ion etching

Device and method for an atomic force microscope for the study and...

Method for forming a through via in a semiconductor element and sem...

Device and method for the micromechanical positioning and handling...

Microsystem component with a device deformable under the effect of...

Apparatus for aligning a first article relative to a second article

Shadow mask and method for producing a shadow mask

Device and method for maskless AFM microlithography

Device and method of positionally accurate implantation of individu...

Patents Applicationslast 30 patents

A STEPPER LITHOGRAPHY APPARATUS AND OPERATING METHOD THEREFOR, AND...

SUB-NANOSCALE HIGH-PRECISION LITHOGRAPHY WRITING FIELD STITCHING ME...

SUBSTRATE FOR A CONTROLLED IMPLANTATION OF IONS AND METHOD OF PREPA...

MICROSCOPE PROBE AND METHOD FOR USE OF SAME

COMPACT ION SOURCE NEUTRON GENERATOR

METHOD OF ALIGNING A FIRST ARTICLE RELATIVE TO A SECOND ARTICLE AND...

DEVICE AND METHOD FOR AN ATOMIC FORCE MICROSCOPE FOR THE STUDY AND...

APPARATUS AND METHOD FOR INVESTIGATING SURFACE PROPERTIES OF DIFFER...

DEVICE AND METHOD FOR THE MICROMECHANICAL POSITIONING AND HANDLING...

MICROSYSTEM COMPONENT WITH A DEVICE DEFORMABLE UNDER THE EFFECT OF...

A METHOD OF ALIGNING A FIRST ARTICLE RELATIVE TO A SECOND ARTICLE A...

ETCHING RADICAL CONTROLLED GAS CHOPPED DEEP REACTIVE ION ETCHING

Measuring system for the combined scanning and analysis of microtec...

Device and method for maskless afm microlithography

Device and method of positionally accurate implantation of individu...

Shadow mask and method for producing a shadow mask