Iwao Ichikawa

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Nishinomiya-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Laser beam inspection apparatus
- Patent number 6,618,135
- Issue date Sep 9, 2003
- Matsushita Electric Industrial Co., Ltd.
- Iwao Ichikawa
- G01 - MEASURING TESTING
Information Patent Grant
Wiring pattern inspection apparatus for printed circuit board
- Patent number 5,787,191
- Issue date Jul 28, 1998
- Matsushita Electric Industrial Co., Ltd.
- Hideaki Kawamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wiring pattern inspection apparatus for printed circuit board
- Patent number 5,459,795
- Issue date Oct 17, 1995
- Matsushita Electric Industrial Co., Ltd.
- Hideaki Kawamura
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Laser beam inspection apparatus
- Publication number 20010002861
- Publication date Jun 7, 2001
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Iwao Ichikawa
- G01 - MEASURING TESTING