Iwasaki Kouji

Person

Chiba-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Particle removing method, particle removing device, atomic force mi...
- Patent number 8,657,962
- Issue date Feb 25, 2014
- AOI Electronics Co., Ltd.
- Hiroki Hayashi
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Focused ion beam system and sample processing method using the same
- Patent number 8,581,206
- Issue date Nov 12, 2013
- SII NanoTechnology Inc.
- Xin Man
- G01 - MEASURING TESTING
Information Patent Grant
Micro cross-section processing method
- Patent number 8,304,721
- Issue date Nov 6, 2012
- SII NanoTechnology Inc.
- Kouji Iwasaki
- G01 - MEASURING TESTING
Information Patent Grant
Composite focused ion beam device, and processing observation metho...
- Patent number 8,269,194
- Issue date Sep 18, 2012
- SII NanoTechnology Inc.
- Takashi Kaito
- G01 - MEASURING TESTING
Information Patent Grant
Method of preparing a transmission electron microscope sample and a...
- Patent number 8,191,168
- Issue date May 29, 2012
- SII NanoTechnology Inc.
- Xin Man
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Composite charged particle beam apparatus, method of processing a s...
- Patent number 7,973,280
- Issue date Jul 5, 2011
- SII NanoTechnology Inc.
- Haruo Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Nanobio device of imitative anatomy structure
- Patent number 7,736,893
- Issue date Jun 15, 2010
- SII NanoTechnology Inc.
- Masanao Munekane
- G01 - MEASURING TESTING
Information Patent Grant
Focused ion beam apparatus and method of preparing/observing sample
- Patent number 7,626,165
- Issue date Dec 1, 2009
- Sii Nano Technology Inc.
- Kouji Iwasaki
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,442,942
- Issue date Oct 28, 2008
- SII NanoTechnology Inc.
- Haruo Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Probe and small sample pick up mechanism
- Patent number 7,404,339
- Issue date Jul 29, 2008
- Sii Nano Technology Inc.
- Masanao Munekane
- G01 - MEASURING TESTING
Information Patent Grant
Sample support prepared by semiconductor silicon process technique
- Patent number 7,345,289
- Issue date Mar 18, 2008
- SII NanoTechnology Inc.
- Kouji Iwasaki
- G01 - MEASURING TESTING
Information Patent Grant
Ion beam device and ion beam processing method, and holder member
- Patent number 7,297,944
- Issue date Nov 20, 2007
- SII NanoTechnology Inc.
- Toshio Kodama
- G01 - MEASURING TESTING
Information Patent Grant
Ion beam device and ion beam processing method
- Patent number 7,276,691
- Issue date Oct 2, 2007
- SII NanoTechnology Inc.
- Toshio Kodama
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for fabricating three-dimensional microstructure
- Patent number 7,267,731
- Issue date Sep 11, 2007
- SII NanoTechnology Inc.
- Kouji Iwasaki
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Micro-sample pick-up apparatus and micro-sample pick-up method
- Patent number 7,067,823
- Issue date Jun 27, 2006
- SII NanoTechnology Inc.
- Kouji Iwasaki
- G01 - MEASURING TESTING
Information Patent Grant
EPL mask processing method and device thereof
- Patent number 7,060,397
- Issue date Jun 13, 2006
- SII NanoTechnology Inc.
- Yo Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thin specimen producing method and apparatus
- Patent number 7,002,150
- Issue date Feb 21, 2006
- SII NanoTechnology Inc.
- Kouji Iwasaki
- G01 - MEASURING TESTING
Information Patent Grant
Ion beam apparatus, ion beam processing method and sample holder me...
- Patent number 6,838,685
- Issue date Jan 4, 2005
- SII NanoTechnology Inc.
- Toshio Kodama
- G01 - MEASURING TESTING
Information Patent Grant
Ion beam processing position correction method
- Patent number 6,593,583
- Issue date Jul 15, 2003
- Seiko Instruments Inc.
- Kouji Iwasaki
- G01 - MEASURING TESTING
Information Patent Grant
Micromachining method for workpiece observation
- Patent number 6,395,347
- Issue date May 28, 2002
- Seiko Instruments Inc.
- Tatsuya Adachi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FOCUSED ION BEAM SYSTEM AND SAMPLE PROCESSING METHOD USING THE SAME
- Publication number 20100213386
- Publication date Aug 26, 2010
- Xin Man
- G01 - MEASURING TESTING
Information Patent Application
MICRO CROSS-SECTION PROCESSING METHOD
- Publication number 20100215868
- Publication date Aug 26, 2010
- Kouji Iwasaki
- G01 - MEASURING TESTING
Information Patent Application
COMPOSITE FOCUSED ION BEAM DEVICE, AND PROCESSING OBSERVATION METHO...
- Publication number 20100176296
- Publication date Jul 15, 2010
- Takashi Kaito
- G01 - MEASURING TESTING
Information Patent Application
Composite charged particle beam apparatus, method of processing a s...
- Publication number 20090206254
- Publication date Aug 20, 2009
- Haruo Takahashi
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PREPARING A TRANSMISSION ELECTRON MICROSCOPE SAMPLE AND A...
- Publication number 20090119807
- Publication date May 7, 2009
- Xin Man
- G01 - MEASURING TESTING
Information Patent Application
Particle removing method, particle removing device, atomic force mi...
- Publication number 20080307866
- Publication date Dec 18, 2008
- AOI ELECTRONICS CO., LTD.
- Hayashi Hiroki
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20080265158
- Publication date Oct 30, 2008
- Kouji Iwasaki
- G01 - MEASURING TESTING
Information Patent Application
Focused ion beam apparatus and method of preparing/observing sample
- Publication number 20080073586
- Publication date Mar 27, 2008
- Kouji Iwasaki
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam apparatus
- Publication number 20070045560
- Publication date Mar 1, 2007
- Haruo Takahashi
- G01 - MEASURING TESTING
Information Patent Application
Nanobio device of imitative anatomy structure
- Publication number 20060188946
- Publication date Aug 24, 2006
- Masanao Munekane
- G01 - MEASURING TESTING
Information Patent Application
Sample support prepared by semiconductor silicon process technique
- Publication number 20060189021
- Publication date Aug 24, 2006
- Kouji Iwasaki
- G01 - MEASURING TESTING
Information Patent Application
Ion beam device and ion beam processing method
- Publication number 20060163497
- Publication date Jul 27, 2006
- Toshio Kodama
- G01 - MEASURING TESTING
Information Patent Application
Probe and small sample pick up mechanism
- Publication number 20060010968
- Publication date Jan 19, 2006
- Masanao Munekane
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
Ion beam device and ion beam processing method, and holder member
- Publication number 20050236587
- Publication date Oct 27, 2005
- Toshio Kodama
- G01 - MEASURING TESTING
Information Patent Application
Minute three dimensional structure producing apparatus and method
- Publication number 20050211922
- Publication date Sep 29, 2005
- Masanao Munekane
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Focused charged particle beam apparatus
- Publication number 20050035306
- Publication date Feb 17, 2005
- Kouji Iwasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Micro-sample pick-up apparatus and micro-sample pick-up method
- Publication number 20040246465
- Publication date Dec 9, 2004
- Kouji Iwasaki
- G01 - MEASURING TESTING
Information Patent Application
Thin specimen producing method and apparatus
- Publication number 20040245464
- Publication date Dec 9, 2004
- Kouji Iwasaki
- G01 - MEASURING TESTING
Information Patent Application
Electrochemical cell
- Publication number 20040209163
- Publication date Oct 21, 2004
- Shunji Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and system for surface or cross-sectional processing and obs...
- Publication number 20040154744
- Publication date Aug 12, 2004
- Takashi Kaito
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Method and system for fabricating three-diemensional microstructure
- Publication number 20040129351
- Publication date Jul 8, 2004
- Kouji Iwasaki
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
EPL mask processing method and device thereof
- Publication number 20030232258
- Publication date Dec 18, 2003
- Yo Yamamoto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Ion beam processing position correction method
- Publication number 20010032936
- Publication date Oct 25, 2001
- Kouji Iwasaki
- G01 - MEASURING TESTING

Iwasaki Kouji

Person

Patents Grantslast 30 patents

Particle removing method, particle removing device, atomic force mi...

Focused ion beam system and sample processing method using the same

Micro cross-section processing method

Composite focused ion beam device, and processing observation metho...

Method of preparing a transmission electron microscope sample and a...

Composite charged particle beam apparatus, method of processing a s...

Nanobio device of imitative anatomy structure

Focused ion beam apparatus and method of preparing/observing sample

Charged particle beam apparatus

Probe and small sample pick up mechanism

Sample support prepared by semiconductor silicon process technique

Ion beam device and ion beam processing method, and holder member

Ion beam device and ion beam processing method

Method and system for fabricating three-dimensional microstructure

Micro-sample pick-up apparatus and micro-sample pick-up method

EPL mask processing method and device thereof

Thin specimen producing method and apparatus

Ion beam apparatus, ion beam processing method and sample holder me...

Ion beam processing position correction method

Micromachining method for workpiece observation

Patents Applicationslast 30 patents

FOCUSED ION BEAM SYSTEM AND SAMPLE PROCESSING METHOD USING THE SAME

MICRO CROSS-SECTION PROCESSING METHOD

COMPOSITE FOCUSED ION BEAM DEVICE, AND PROCESSING OBSERVATION METHO...

Composite charged particle beam apparatus, method of processing a s...

METHOD OF PREPARING A TRANSMISSION ELECTRON MICROSCOPE SAMPLE AND A...

Particle removing method, particle removing device, atomic force mi...

CHARGED PARTICLE BEAM APPARATUS

Focused ion beam apparatus and method of preparing/observing sample

Charged particle beam apparatus

Nanobio device of imitative anatomy structure

Sample support prepared by semiconductor silicon process technique

Ion beam device and ion beam processing method

Probe and small sample pick up mechanism

Ion beam device and ion beam processing method, and holder member

Minute three dimensional structure producing apparatus and method

Focused charged particle beam apparatus

Micro-sample pick-up apparatus and micro-sample pick-up method

Thin specimen producing method and apparatus

Electrochemical cell

Method and system for surface or cross-sectional processing and obs...

Method and system for fabricating three-diemensional microstructure

EPL mask processing method and device thereof

Ion beam processing position correction method