Izumi Waki

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Analysis device including solid-phase extraction material filling a...
- Patent number 9,597,612
- Issue date Mar 21, 2017
- Hitachi High-Technologies Corporation
- Tadao Yabuhara
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Solid-phase extraction apparatus and viscosity measurement apparatus
- Patent number 9,494,496
- Issue date Nov 15, 2016
- Hitachi High-Technologies Corporation
- Tadao Yabuhara
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Ionization method, ionization apparatus, and mass analysis system
- Patent number 9,377,445
- Issue date Jun 28, 2016
- Hitachi High-Technologies Corporation
- Hiroyuki Satake
- G01 - MEASURING TESTING
Information Patent Grant
Pretreatment apparatus and mass analyzing apparatus equipped with t...
- Patent number 9,207,152
- Issue date Dec 8, 2015
- Hitachi High-Technologies Corporation
- Makoto Nogami
- G01 - MEASURING TESTING
Information Patent Grant
Specimen processing system
- Patent number 9,176,037
- Issue date Nov 3, 2015
- Hitachi High-Technologies Corporation
- Katsuhiro Kanda
- G01 - MEASURING TESTING
Information Patent Grant
Pretreatment apparatus and mass spectrometer equipped with the same...
- Patent number 8,926,903
- Issue date Jan 6, 2015
- Hitachi High-Technologies Corporation
- Makoto Nogami
- G01 - MEASURING TESTING
Information Patent Grant
Immunoanalytical method and system using mass spectrometry technology
- Patent number 8,865,418
- Issue date Oct 21, 2014
- Hitachi High-Technologies Corporation
- Katsuhiro Kanda
- G01 - MEASURING TESTING
Information Patent Grant
Examination device and examination method
- Patent number 8,730,459
- Issue date May 20, 2014
- Hitachi High-Technologies Corporation
- Makoto Nogami
- G01 - MEASURING TESTING
Information Patent Grant
Sample pretreatment apparatus and mass spectrometer provided with t...
- Patent number 8,604,425
- Issue date Dec 10, 2013
- Hitachi High-Technologies Corporation
- Katsuhiro Kanda
- G01 - MEASURING TESTING
Information Patent Grant
Adhering matter inspection equipment and method for inspecting adhe...
- Patent number 8,586,916
- Issue date Nov 19, 2013
- Hitachi, Ltd.
- Hideo Kashima
- G01 - MEASURING TESTING
Information Patent Grant
Sample pretreatment apparatus and mass spectrometer provided with t...
- Patent number 8,319,179
- Issue date Nov 27, 2012
- Hitachi High-Technologies Corporation
- Katsuhiro Kanda
- G01 - MEASURING TESTING
Information Patent Grant
Adhering matter inspection equipment and method for inspecting adhe...
- Patent number 8,217,339
- Issue date Jul 10, 2012
- Hitachi, Ltd.
- Hideo Kashima
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometer
- Patent number 8,080,786
- Issue date Dec 20, 2011
- Hitachi High-Technologies Corporation
- Takashi Baba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion guide device, ion reactor, and mass analyzer
- Patent number 8,049,169
- Issue date Nov 1, 2011
- Hitachi, Ltd.
- Hiroyuki Satake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas component collector, gas component collecting device, filter pr...
- Patent number 7,882,754
- Issue date Feb 8, 2011
- Hitachi, Ltd.
- Masao Suga
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Gas monitoring apparatus
- Patent number 7,829,848
- Issue date Nov 9, 2010
- Hitachi, Ltd.
- Yasuaki Takada
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Mass spectrometer and method of mass spectrometry
- Patent number 7,820,961
- Issue date Oct 26, 2010
- Hitachi, Ltd.
- Yuichiro Hashimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for detecting chemical substances and method therefor
- Patent number 7,820,965
- Issue date Oct 26, 2010
- Hitachi, Ltd.
- Hisashi Nagano
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Mass spectrometer and mass spectrometry method
- Patent number 7,800,058
- Issue date Sep 21, 2010
- Hitachi High-Technologies Corporation
- Masuyuki Sugiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap mass spectrometer
- Patent number 7,759,641
- Issue date Jul 20, 2010
- Hitachi, Ltd.
- Hideki Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of mass spectrometry and mass spectrometer
- Patent number 7,675,033
- Issue date Mar 9, 2010
- Hitachi, Ltd.
- Yuichiro Hashimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas monitoring apparatus and gas monitoring method
- Patent number 7,663,098
- Issue date Feb 16, 2010
- Hitachi, Ltd.
- Yasuo Seto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of mass spectrometry and mass spectrometer
- Patent number 7,592,589
- Issue date Sep 22, 2009
- Hitachi, Ltd.
- Yuichiro Hashimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reaction cell and mass spectrometer
- Patent number 7,589,321
- Issue date Sep 15, 2009
- Hitachi High-Technologies Corporation
- Yuichiro Hashimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 7,589,320
- Issue date Sep 15, 2009
- Hitachi High-Technologies Corporation
- Takashi Baba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 7,569,814
- Issue date Aug 4, 2009
- Hitachi High-Technologies Corporation
- Yuichiro Hashimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 7,566,870
- Issue date Jul 28, 2009
- Hitachi High-Technologies Corporation
- Hideki Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas monitoring apparatus
- Patent number 7,449,685
- Issue date Nov 11, 2008
- Hitachi, Ltd.
- Yasuaki Takada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and mass spectrometry
- Patent number 7,420,180
- Issue date Sep 2, 2008
- Hitachi, Ltd.
- Masuyoshi Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for detecting chemical substances and method therefor
- Patent number 7,408,153
- Issue date Aug 5, 2008
- Hitachi, Ltd.
- Hisashi Nagano
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ANALYSIS DEVICE
- Publication number 20150182877
- Publication date Jul 2, 2015
- Hitachi High-Technologies Corporation
- Tadao Yabuhara
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
APPARATUS FOR PRETREATING BIOLOGICAL SAMPLES, AND MASS SPECTROMETER...
- Publication number 20150111300
- Publication date Apr 23, 2015
- Makoto NOGAMI
- G01 - MEASURING TESTING
Information Patent Application
IONIZATION METHOD, IONIZATION APPARATUS, AND MASS ANALYSIS SYSTEM
- Publication number 20150102232
- Publication date Apr 16, 2015
- Hitachi High-Technologies Corporation
- Hiroyuki Satake
- G01 - MEASURING TESTING
Information Patent Application
ANALYZER
- Publication number 20150064739
- Publication date Mar 5, 2015
- Hitachi High-Technologies Corporation
- Makoto Nogami
- G01 - MEASURING TESTING
Information Patent Application
SOLID-PHASE EXTRACTION APPARATUS AND VISCOSITY MEASUREMENT APPARATUS
- Publication number 20140137671
- Publication date May 22, 2014
- Hitachi High-Technologies Corporation
- Tadao Yabuhara
- G01 - MEASURING TESTING
Information Patent Application
Biological Sample Pretreatment Method and Apparatus
- Publication number 20130130401
- Publication date May 23, 2013
- Katsuhiro Kanda
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PRETREATMENT APPARATUS AND MASS SPECTROMETER PROVIDED WITH T...
- Publication number 20130075603
- Publication date Mar 28, 2013
- Hitachi High-Technologies Corporation
- Katsuhiro Kanda
- G01 - MEASURING TESTING
Information Patent Application
Adsorbent and Method for Producing Same
- Publication number 20130048853
- Publication date Feb 28, 2013
- Hitachi High-Technologies Corporation
- Jun Nunoshige
- G01 - MEASURING TESTING
Information Patent Application
EXAMINATION DEVICE AND EXAMINATION METHOD
- Publication number 20120206713
- Publication date Aug 16, 2012
- Hitachi High-Technologies Corporation
- Makoto Nogami
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN PROCESSING SYSTEM
- Publication number 20120134895
- Publication date May 31, 2012
- Hitachi High-Technologies Corporation
- Katsuhiro Kanda
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR PRETREATING BIOLOGICAL SAMPLES, AND MASS SPECTROMETER...
- Publication number 20120121464
- Publication date May 17, 2012
- Hitachi High-Technologies Corporation
- Makoto Nogami
- G01 - MEASURING TESTING
Information Patent Application
PRETREATMENT APPARATUS AND MASS ANALYZING APPARATUS EQUIPPED WITH T...
- Publication number 20120079875
- Publication date Apr 5, 2012
- Makoto Nogami
- G01 - MEASURING TESTING
Information Patent Application
ANALYZER
- Publication number 20120058009
- Publication date Mar 8, 2012
- Hitachi High-Technologies Corporation
- Makoto Nogami
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PRETREATMENT APPARATUS AND MASS SPECTROMETER PROVIDED WITH T...
- Publication number 20110291004
- Publication date Dec 1, 2011
- Hitachi High-Technologies Corporation
- Katsuhiro Kanda
- G01 - MEASURING TESTING
Information Patent Application
IMMUNOANALYTICAL METHOD AND SYSTEM USING MASS SPECTROMETRY TECHNOLOGY
- Publication number 20110287446
- Publication date Nov 24, 2011
- Hitachi High-Technologies Corporation
- Katsuhiro Kanda
- G01 - MEASURING TESTING
Information Patent Application
ADHERING MATTER INSPECTION EQUIPMENT AND METHOD FOR INSPECTING ADHE...
- Publication number 20110278469
- Publication date Nov 17, 2011
- Hideo Kashima
- G01 - MEASURING TESTING
Information Patent Application
PRETREATMENT APPARATUS AND MASS SPECTROMETER EQUIPPED WITH THE SAME...
- Publication number 20110157580
- Publication date Jun 30, 2011
- Hitachi High-Technologies Corporation
- Makoto Nogami
- G01 - MEASURING TESTING
Information Patent Application
Method Of Mass Spectrometry And Mass Spectrometer
- Publication number 20100219337
- Publication date Sep 2, 2010
- Yuichiro Hashimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer
- Publication number 20090294646
- Publication date Dec 3, 2009
- Hitachi High-Technologies Corporation
- Takashi Baba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION GUIDE DEVICE, ION REACTOR, AND MASS ANALYZER
- Publication number 20090278043
- Publication date Nov 12, 2009
- Hiroyuki Satake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Adhering Matter Inspection Equipment and Method for Inspecting Adhe...
- Publication number 20090200458
- Publication date Aug 13, 2009
- Hideo Kashima
- G01 - MEASURING TESTING
Information Patent Application
Method of mass spectrometry and mass spectrometer
- Publication number 20090189065
- Publication date Jul 30, 2009
- Yuichiro Hashimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus for detecting chemical substances and method therefor
- Publication number 20090084950
- Publication date Apr 2, 2009
- Hitachi, Ltd.
- Hisashi Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Gas monitoring apparatus
- Publication number 20090039253
- Publication date Feb 12, 2009
- Hitachi, Ltd.
- Yasuaki Takada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometer
- Publication number 20080156979
- Publication date Jul 3, 2008
- Hitachi High-Technologies Corporation
- Yuichiro Hashimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometer and mass spectrometry method
- Publication number 20080121795
- Publication date May 29, 2008
- Hitachi High-Technologies Corporation
- Masuyuki Sugiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND METHOD OF MASS SPECTROMETRY
- Publication number 20080116372
- Publication date May 22, 2008
- Yuichiro Hashimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Gas component collector, gas component collecting device, filter pr...
- Publication number 20080092629
- Publication date Apr 24, 2008
- Masao Suga
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Mass spectrometer
- Publication number 20080078930
- Publication date Apr 3, 2008
- Hitachi High-Technologies Corporation
- Takashi Baba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REACTION CELL AND MASS SPECTROMETER
- Publication number 20080073508
- Publication date Mar 27, 2008
- Yuichiro Hashimoto
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Analysis device including solid-phase extraction material filling a...

Solid-phase extraction apparatus and viscosity measurement apparatus

Ionization method, ionization apparatus, and mass analysis system

Pretreatment apparatus and mass analyzing apparatus equipped with t...

Specimen processing system

Pretreatment apparatus and mass spectrometer equipped with the same...

Immunoanalytical method and system using mass spectrometry technology

Examination device and examination method

Sample pretreatment apparatus and mass spectrometer provided with t...

Adhering matter inspection equipment and method for inspecting adhe...

Sample pretreatment apparatus and mass spectrometer provided with t...

Adhering matter inspection equipment and method for inspecting adhe...

Mass spectrometer

Ion guide device, ion reactor, and mass analyzer

Gas component collector, gas component collecting device, filter pr...

Gas monitoring apparatus

Mass spectrometer and method of mass spectrometry

Apparatus for detecting chemical substances and method therefor

Mass spectrometer and mass spectrometry method

Ion trap mass spectrometer

Method of mass spectrometry and mass spectrometer

Gas monitoring apparatus and gas monitoring method

Method of mass spectrometry and mass spectrometer

Reaction cell and mass spectrometer

Mass spectrometer

Mass spectrometer

Mass spectrometer

Gas monitoring apparatus

Mass spectrometer and mass spectrometry

Apparatus for detecting chemical substances and method therefor

Patents Applicationslast 30 patents

ANALYSIS DEVICE

APPARATUS FOR PRETREATING BIOLOGICAL SAMPLES, AND MASS SPECTROMETER...

IONIZATION METHOD, IONIZATION APPARATUS, AND MASS ANALYSIS SYSTEM

ANALYZER

SOLID-PHASE EXTRACTION APPARATUS AND VISCOSITY MEASUREMENT APPARATUS

Biological Sample Pretreatment Method and Apparatus

SAMPLE PRETREATMENT APPARATUS AND MASS SPECTROMETER PROVIDED WITH T...

Adsorbent and Method for Producing Same

EXAMINATION DEVICE AND EXAMINATION METHOD

SPECIMEN PROCESSING SYSTEM

APPARATUS FOR PRETREATING BIOLOGICAL SAMPLES, AND MASS SPECTROMETER...

PRETREATMENT APPARATUS AND MASS ANALYZING APPARATUS EQUIPPED WITH T...

ANALYZER

SAMPLE PRETREATMENT APPARATUS AND MASS SPECTROMETER PROVIDED WITH T...

IMMUNOANALYTICAL METHOD AND SYSTEM USING MASS SPECTROMETRY TECHNOLOGY

ADHERING MATTER INSPECTION EQUIPMENT AND METHOD FOR INSPECTING ADHE...

PRETREATMENT APPARATUS AND MASS SPECTROMETER EQUIPPED WITH THE SAME...

Method Of Mass Spectrometry And Mass Spectrometer

Mass Spectrometer

ION GUIDE DEVICE, ION REACTOR, AND MASS ANALYZER

Adhering Matter Inspection Equipment and Method for Inspecting Adhe...

Method of mass spectrometry and mass spectrometer

Apparatus for detecting chemical substances and method therefor

Gas monitoring apparatus

Mass spectrometer

Mass spectrometer and mass spectrometry method

MASS SPECTROMETER AND METHOD OF MASS SPECTROMETRY

Gas component collector, gas component collecting device, filter pr...

Mass spectrometer

REACTION CELL AND MASS SPECTROMETER