J. Rex Runyon

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Fremont, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Detecting defects on a wafer using template image matching
- Patent number 9,311,698
- Issue date Apr 12, 2016
- KLA-Tencor Corp.
- Xing Chu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Air bearing for substrate inspection device
- Patent number 8,817,250
- Issue date Aug 26, 2014
- KLA-Tencor Corporation
- Paul Doyle
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Detecting Defects on a Wafer Using Template Image Matching
- Publication number 20140193065
- Publication date Jul 10, 2014
- KLA-Tencor Corporation
- Xing Chu
- G01 - MEASURING TESTING
Information Patent Application
Referenced Inspection Device
- Publication number 20120062877
- Publication date Mar 15, 2012
- KLA-Tencor Corporation
- Paul Doyle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Referenced Inspection Device
- Publication number 20110069306
- Publication date Mar 24, 2011
- KLA-Tencor Corporation
- Paul Doyle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
UV compatible programmable spatial filter
- Publication number 20030184739
- Publication date Oct 2, 2003
- KLA-Tencor Technologies Corporation
- Dieter E. Wilk
- G02 - OPTICS