Jacek Lagowski

Person

Tampa, FL, US

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor doping characterization method using photoneutralizat...
- Patent number 12,154,833
- Issue date Nov 26, 2024
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Marshall D. Wilson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor doping characterization method using photoneutralizat...
- Patent number 12,027,430
- Issue date Jul 2, 2024
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Marshall D. Wilson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Topside contact device and method for characterization of high elec...
- Patent number 11,561,254
- Issue date Jan 24, 2023
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Marshall Wilson
- G01 - MEASURING TESTING
Information Patent Grant
Measuring semiconductor doping using constant surface potential cor...
- Patent number 10,969,370
- Issue date Apr 6, 2021
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact method to monitor and quantify effective work function...
- Patent number 10,763,179
- Issue date Sep 1, 2020
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Dmitriy Marinskiy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photoluminescence mapping of passivation defects for silicon photov...
- Patent number 9,685,906
- Issue date Jun 20, 2017
- Semilab SDI LLC
- Jacek Lagowski
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Accurate measurement of excess carrier lifetime using carrier decay...
- Patent number 8,912,799
- Issue date Dec 16, 2014
- Semiconductor Physics Laboratory Co., Ltd.
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Grant
Accurate measuring of long steady state minority carrier diffusion...
- Patent number 8,093,920
- Issue date Jan 10, 2012
- Semiconductor Diagnostics, Inc.
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact method for acquiring charge-voltage data on miniature t...
- Patent number 7,202,691
- Issue date Apr 10, 2007
- Semiconductor Diagnostics, Inc.
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Grant
Determining composition of mixed dielectrics
- Patent number 6,815,974
- Issue date Nov 9, 2004
- Semiconductor Diagnostics, Inc.
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for elevated temperature measurement with probes...
- Patent number 6,771,091
- Issue date Aug 3, 2004
- Semiconductor Diagnostics, Inc.
- Jacek J. Lagowski
- G01 - MEASURING TESTING
Information Patent Grant
Steady state method for measuring the thickness and the capacitance...
- Patent number 6,680,621
- Issue date Jan 20, 2004
- Semiconductor Diagnostics, Inc.
- Alexander Savtchouk
- G01 - MEASURING TESTING
Information Patent Grant
Steady state method for measuring the thickness and the capacitance...
- Patent number 6,597,193
- Issue date Jul 22, 2003
- Semiconductor Diagnostics, Inc.
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring stress induced leakage current and gate dielec...
- Patent number 6,538,462
- Issue date Mar 25, 2003
- Semiconductor Diagnostics, Inc.
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Grant
Method for fast and accurate determination of the minority carrier...
- Patent number 6,512,384
- Issue date Jan 28, 2003
- Semiconductor Diagnostics, Inc.
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Grant
Device for electrically contacting a floating semiconductor wafer h...
- Patent number 6,114,865
- Issue date Sep 5, 2000
- Semiconductor Diagnostics, Inc.
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of the interface trap charge in an oxide semiconductor...
- Patent number 6,037,797
- Issue date Mar 14, 2000
- Semiconductor Diagnostics, Inc.
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Grant
Elevated temperature measurement of the minority carrier lifetime i...
- Patent number 5,977,788
- Issue date Nov 2, 1999
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of the mobile ion concentration in the oxide layer of a...
- Patent number 5,773,989
- Issue date Jun 30, 1998
- University of South Florida
- Piotr Edelman
- G01 - MEASURING TESTING
Information Patent Grant
Determining long minority carrier diffusion lengths
- Patent number 5,663,657
- Issue date Sep 2, 1997
- University of South Florida
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor contaminant sensing system and method
- Patent number 5,369,495
- Issue date Nov 29, 1994
- University of South Florida
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining the minority carrier diffusion...
- Patent number 5,177,351
- Issue date Jan 5, 1993
- Jacek J. Lagowski
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining the minority carrier diffusion...
- Patent number 5,025,145
- Issue date Jun 18, 1991
- Jacek J. Lagowski
- G01 - MEASURING TESTING
Information Patent Grant
Method to determine the crystalline properties of an interface of t...
- Patent number 4,642,565
- Issue date Feb 10, 1987
- RCA Corporation
- Lubomir L. Jastrzebski
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Method to determine the crystalline properties of an interface of t...
- Patent number 4,498,772
- Issue date Feb 12, 1985
- RCA Corporation
- Lubomir L. Jastrzebski
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining oxygen content in semiconductor material
- Patent number 4,429,047
- Issue date Jan 31, 1984
- RCA Corporation
- Lubomir L. Jastrzebski
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DOPING CHARACTERIZATION METHOD USING PHOTONEUTRALIZAT...
- Publication number 20240347399
- Publication date Oct 17, 2024
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Marshall D. Wilson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TOPSIDE CONTACT DEVICE AND METHOD FOR CHARACTERIZATION OF HIGH ELEC...
- Publication number 20220381816
- Publication date Dec 1, 2022
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Marshall Wilson
- G01 - MEASURING TESTING
Information Patent Application
Charge Metrology for Integrated Measurement
- Publication number 20180315630
- Publication date Nov 1, 2018
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Dmitriy Marinskiy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Measuring semiconductor doping using constant surface potential cor...
- Publication number 20160356750
- Publication date Dec 8, 2016
- Semilab SDI LLC
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Application
NON-CONTACT METHOD TO MONITOR AND QUANTIFY EFFECTIVE WORK FUNCTION...
- Publication number 20160252565
- Publication date Sep 1, 2016
- Semilab SDI LLC
- Dmitriy Marinskiy
- G01 - MEASURING TESTING
Information Patent Application
PHOTOLUMINESCENCE MAPPING OF PASSIVATION DEFECTS FOR SILICON PHOTOV...
- Publication number 20150008952
- Publication date Jan 8, 2015
- Semilab SDI LLC
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Application
ACCURATE MEASUREMENT OF EXCESS CARRIER LIFETIME USING CARRIER DECAY...
- Publication number 20130169283
- Publication date Jul 4, 2013
- Semiconductor Physics Laboratory Co., Ltd.
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Application
ACCURATE MEASURING OF LONG STEADY STATE MINORITY CARRIER DIFFUSION...
- Publication number 20100085073
- Publication date Apr 8, 2010
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Application
ENHANCED SENSITIVITY NON-CONTACT ELECTRICAL MONITORING OF COPPER CO...
- Publication number 20090047748
- Publication date Feb 19, 2009
- Alexandre Savtchouk
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Non-contact method for acquiring charge-voltage data on miniature t...
- Publication number 20060267622
- Publication date Nov 30, 2006
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Application
Method and system for elevated temperature measurement with probes...
- Publication number 20040057497
- Publication date Mar 25, 2004
- Jacek J. Lagowski
- G01 - MEASURING TESTING
Information Patent Application
Steady state method for measuring the thickness and the capacitance...
- Publication number 20020130674
- Publication date Sep 19, 2002
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Application
Steady state method for measuring the thickness and the capacitance...
- Publication number 20020125900
- Publication date Sep 12, 2002
- Alexander Savtchouk
- G01 - MEASURING TESTING

Jacek Lagowski

Person

Patents Grantslast 30 patents

Semiconductor doping characterization method using photoneutralizat...

Semiconductor doping characterization method using photoneutralizat...

Topside contact device and method for characterization of high elec...

Measuring semiconductor doping using constant surface potential cor...

Non-contact method to monitor and quantify effective work function...

Photoluminescence mapping of passivation defects for silicon photov...

Accurate measurement of excess carrier lifetime using carrier decay...

Accurate measuring of long steady state minority carrier diffusion...

Non-contact method for acquiring charge-voltage data on miniature t...

Determining composition of mixed dielectrics

Method and system for elevated temperature measurement with probes...

Steady state method for measuring the thickness and the capacitance...

Steady state method for measuring the thickness and the capacitance...

Method for measuring stress induced leakage current and gate dielec...

Method for fast and accurate determination of the minority carrier...

Device for electrically contacting a floating semiconductor wafer h...

Measurement of the interface trap charge in an oxide semiconductor...

Elevated temperature measurement of the minority carrier lifetime i...

Measurement of the mobile ion concentration in the oxide layer of a...

Determining long minority carrier diffusion lengths

Semiconductor contaminant sensing system and method

Method and apparatus for determining the minority carrier diffusion...

Method and apparatus for determining the minority carrier diffusion...

Method to determine the crystalline properties of an interface of t...

Method to determine the crystalline properties of an interface of t...

Method for determining oxygen content in semiconductor material

Patents Applicationslast 30 patents

SEMICONDUCTOR DOPING CHARACTERIZATION METHOD USING PHOTONEUTRALIZAT...

TOPSIDE CONTACT DEVICE AND METHOD FOR CHARACTERIZATION OF HIGH ELEC...

Charge Metrology for Integrated Measurement

Measuring semiconductor doping using constant surface potential cor...

NON-CONTACT METHOD TO MONITOR AND QUANTIFY EFFECTIVE WORK FUNCTION...

PHOTOLUMINESCENCE MAPPING OF PASSIVATION DEFECTS FOR SILICON PHOTOV...

ACCURATE MEASUREMENT OF EXCESS CARRIER LIFETIME USING CARRIER DECAY...

ACCURATE MEASURING OF LONG STEADY STATE MINORITY CARRIER DIFFUSION...

ENHANCED SENSITIVITY NON-CONTACT ELECTRICAL MONITORING OF COPPER CO...

Non-contact method for acquiring charge-voltage data on miniature t...

Method and system for elevated temperature measurement with probes...

Steady state method for measuring the thickness and the capacitance...

Steady state method for measuring the thickness and the capacitance...