Jack Frost

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Tigard, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Electrical characterization for a semiconductor device pin
- Patent number 8,907,697
- Issue date Dec 9, 2014
- Teseda Corporation
- Jack Frost
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Electrical Characterization for a Semiconductor Device Pin
- Publication number 20130049790
- Publication date Feb 28, 2013
- TESEDA CORPORATION
- Jack Frost
- G01 - MEASURING TESTING