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Jaime D. Morillo
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Wappingers Falls, NY, US
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Patents Grants
last 30 patents
Information
Patent Grant
Target and method for mask-to-wafer CD, pattern placement and overl...
Patent number
9,097,989
Issue date
Aug 4, 2015
International Business Machines Corporation
Christopher P. Ausschnitt
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Fabrication of lithographic image fields using a proximity stitch m...
Patent number
9,087,740
Issue date
Jul 21, 2015
International Business Machines Corporation
Christopher P. Ausschnitt
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Multilayer alignment and overlay target and measurement method
Patent number
8,339,605
Issue date
Dec 25, 2012
International Business Machines Corporation
Christopher P. Ausschnitt
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Multi layer alignment and overlay target and measurement method
Patent number
8,107,079
Issue date
Jan 31, 2012
International Business Machines Corporation
Christopher P. Ausschnitt
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Multi layer alignment and overlay target and measurement method
Patent number
7,876,439
Issue date
Jan 25, 2011
International Business Machines Corporation
Christopher P. Ausschnitt
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Overlay target and measurement method using reference and sub-grids
Patent number
7,626,702
Issue date
Dec 1, 2009
International Business Machines Corporation
Christopher P. Ausschnitt
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Multi-layer alignment and overlay target and measurement method
Patent number
7,474,401
Issue date
Jan 6, 2009
International Business Machines Corporation
Christopher P. Ausschnitt
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Overlay target and measurement method using reference and sub-grids
Patent number
7,359,054
Issue date
Apr 15, 2008
International Business Machines Corporation
Christopher P. Ausschnitt
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Overlay target and measurement method using reference and sub-grids
Patent number
6,937,337
Issue date
Aug 30, 2005
International Business Machines Corporation
Christopher P. Ausschnitt
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
FABRICATION OF LITHOGRAPHIC IMAGE FIELDS USING A PROXIMITY STITCH M...
Publication number
20150162249
Publication date
Jun 11, 2015
International Business Machines Corporation
Christopher P. Ausschnitt
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MULTILAYER ALIGNMENT AND OVERLAY TARGET AND MEASUREMENT METHOD
Publication number
20110069314
Publication date
Mar 24, 2011
International Business Machines Corporation
Christopher P. Ausschnitt
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
MULTI LAYER ALIGNMENT AND OVERLAY TARGET AND MEASUREMENT METHOD
Publication number
20110058170
Publication date
Mar 10, 2011
International Business Machines Corporation
Christopher P. Ausschnitt
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
TARGET AND METHOD FOR MASK-TO-WAFER CD, PATTERN PLACEMENT AND OVERL...
Publication number
20100190096
Publication date
Jul 29, 2010
International Business Machines Corporation
Christopher P. Ausschnitt
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
MULTI LAYER ALIGNMENT AND OVERLAY TARGET AND MEASUREMENT METHOD
Publication number
20080259334
Publication date
Oct 23, 2008
International Business Machines Corporation
Christopher P. Ausschnitt
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
OVERLAY TARGET AND MEASUREMENT METHOD USING REFERENCE AND SUB-GRIDS
Publication number
20080144031
Publication date
Jun 19, 2008
International Business Machines Corporation
Christopher P. Ausschnitt
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Multi-layer Alignment and Overlay Target and Measurement Method
Publication number
20070058169
Publication date
Mar 15, 2007
International Business Machines Corporation
Christopher P. Ausschnitt
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Overlay target and measurement method using reference and sub-grids
Publication number
20050231722
Publication date
Oct 20, 2005
Christopher P. Ausschnitt
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
OVERLAY TARGET AND MEASUREMENT METHOD USING REFERENCE AND SUB-GRIDS
Publication number
20050105092
Publication date
May 19, 2005
International Business Machines Corporation
Christopher P. Ausschnitt
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY